Arama Sonuçları Reliability. - Daraltılmış: 1998SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091998$0025091998$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-25T15:21:28ZImproving machinery reliabilityent://SD_ILS/0/SD_ILS:1538282024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar Bloch, Heinz P., 1933-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods for reliability dataent://SD_ILS/0/SD_ILS:850802024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar Meeker, William Q. Escobar, Luis A., ort. yaz.<br/>Yer Numarası TS 173 M44 1998<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Cognitive reliability and error analysis method CREAMent://SD_ILS/0/SD_ILS:2544332024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar Hollnagel, Erik, 1941-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Guidelines for improving plant reliability through data collection and analysisent://SD_ILS/0/SD_ILS:3000222024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:2563092024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar Ohring, Milton, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systemsent://SD_ILS/0/SD_ILS:2495942024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar Pukite, Jan, 1928- Pukite, Paul.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The design analysis handbook a practical guide to design validationent://SD_ILS/0/SD_ILS:2547972024-11-25T15:21:28Z2024-11-25T15:21:28ZYazar Walker, N. Edward.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>