Arama Sonuçları Reliability. - Daraltılmış: 2001SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092001$0025092001$0026ps$003d300?dt=list2024-11-22T08:11:28ZDesign for reliabilityent://SD_ILS/0/SD_ILS:2858862024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Crow, Dana. Feinberg, Alec.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Neale, M. J. (Michael John)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality and reliability in analytical chemistryent://SD_ILS/0/SD_ILS:2859382024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Aboul-Enein, Hassan Y. Stefan, Raluca-Ioana. Baiulescu, George.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420038576">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fault detectability in DWDM toward higher signal quality & system reliabilityent://SD_ILS/0/SD_ILS:2497132024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Kartalopoulos, Stamatios V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aging power delivery infrastructuresent://SD_ILS/0/SD_ILS:2864712024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Willis, H. Lee, 1949- Welch, Gregory V. Schrieber, Randall R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203910917">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing capable and reliable productsent://SD_ILS/0/SD_ILS:1538672024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Booker, J. D. Raines, M. Swift, K. G.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750650762">http://www.sciencedirect.com/science/book/9780750650762</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated stress testing handbook guide for achieving quality productsent://SD_ILS/0/SD_ILS:2496452024-11-22T08:11:28Z2024-11-22T08:11:28ZYazar Chan, H. Anthony, 1952- Englert, Paul J, 1960-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>