Arama Sonuçları Reliability. - Daraltılmış: 2001SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092001$0025092001$0026te$003dILS$0026ps$003d300?dt=list2026-06-03T18:37:17ZDesign for reliabilityent://SD_ILS/0/SD_ILS:5434932026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Crow, Dana. Feinberg, Alec.<br/>Yer Numarası TK7836 .D473 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Neale, M. J. (Michael John)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fault detectability in DWDM toward higher signal quality & system reliabilityent://SD_ILS/0/SD_ILS:2497132026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Kartalopoulos, Stamatios V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Adhesion measurement of films and coatings. Volume 2ent://SD_ILS/0/SD_ILS:5475662026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Mittal, Kash L., 1945- editor. Taylor and Francis.<br/>Yer Numarası QC183<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466562233">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Principles and practice of criminalistics : the profession of forensic scienceent://SD_ILS/0/SD_ILS:5393892026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Inman, Keith., author. Rudin, Norah.<br/>Yer Numarası HV8073 .I443 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420036930">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The resource handbook of electronicsent://SD_ILS/0/SD_ILS:5424952026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Whitaker, Jerry C., author.<br/>Yer Numarası TK7825 .W48 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420036862">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Algebraic statistics : computational commutative algebra in statisticsent://SD_ILS/0/SD_ILS:5476612026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Pistone, Giovanni., author. Riccomagno, Eva. Wynn, Henry P.<br/>Yer Numarası QA276 .P53 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420035766">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Aging power delivery infrastructuresent://SD_ILS/0/SD_ILS:5452892026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Willis, H. Lee, 1949, author. Welch, Gregory V. Schrieber, Randall R.<br/>Yer Numarası TK1010 .W55 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135553586">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Transformer design principles : with applications to core-form power transformers.ent://SD_ILS/0/SD_ILS:5456892026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Taylor and Francis.<br/>Yer Numarası TK2551<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420021943">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety culture in nuclear power operationsent://SD_ILS/0/SD_ILS:5463252026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Wilpert, Bernhard, 1936- Itoigawa, Naosuke, 1935-<br/>Yer Numarası TK9152.14 .S34 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781134541287">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing capable and reliable productsent://SD_ILS/0/SD_ILS:1538672026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Booker, J. D. Raines, M. Swift, K. G.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750650762">http://www.sciencedirect.com/science/book/9780750650762</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated stress testing handbook guide for achieving quality productsent://SD_ILS/0/SD_ILS:2496452026-06-03T18:37:17Z2026-06-03T18:37:17ZYazar Chan, H. Anthony, 1952- Englert, Paul J, 1960-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>