Arama Sonuçları Reliability. - Daraltılmış: 2002SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092002$0025092002$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-29T05:27:37ZElectric power distribution reliabilityent://SD_ILS/0/SD_ILS:2874452024-11-29T05:27:37Z2024-11-29T05:27:37ZYazar Brown, Richard E., 1969-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High reliability magnetic devices design and fabricationent://SD_ILS/0/SD_ILS:2845752024-11-29T05:27:37Z2024-11-29T05:27:37ZYazar McLyman, Colonel William T., 1932-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203910689">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-29T05:27:37Z2024-11-29T05:27:37ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk, Reliability, Uncertainty, and Robustness of Water Resource Systemsent://SD_ILS/0/SD_ILS:2366372024-11-29T05:27:37Z2024-11-29T05:27:37ZYazar Bogardi, Janos J.. Kundzewicz, Zbigniew W..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511546006">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability of computer systems and networks fault tolerance, analysis and designent://SD_ILS/0/SD_ILS:3014662024-11-29T05:27:37Z2024-11-29T05:27:37ZYazar Shooman, Martin L. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/047122460X">http://dx.doi.org/10.1002/047122460X</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html">http://catdir.loc.gov/catdir/bios/wiley042/2002265406.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic systems maintenance handbookent://SD_ILS/0/SD_ILS:2867292024-11-29T05:27:37Z2024-11-29T05:27:37ZYazar Whitaker, Jerry C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420036855">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instrument engineers' handbook. Process software and digital networksent://SD_ILS/0/SD_ILS:2888612024-11-29T05:27:37Z2024-11-29T05:27:37ZYazar Liptk̀, Bľa G. Liptk̀, Bľa G. Instrument engineers' handbook. Process measurement and analysis. Liptk̀, Bľa G. Instrument engineers' handbook. Process control.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439863442">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>