Arama Sonuçları Reliability. - Daraltılmış: 2004SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092004$0025092004$0026ps$003d300?dt=list2024-11-25T11:06:42ZReliability of large systemsent://SD_ILS/0/SD_ILS:2545132024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Kołowrocki, Krzysztof.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:2882352024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar LuValle, Michael J. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203492031">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>RCM gateway to world class maintenanceent://SD_ILS/0/SD_ILS:2547022024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Smith, Anthony M. Hinchcliffe, Glenn R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750674614">http://www.sciencedirect.com/science/book/9780750674614</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical engineering failure analysisent://SD_ILS/0/SD_ILS:2882042024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Tawancy, Hani M. Ul-Hamid, Anwar. Abbas, Nureddin Mohamed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203026298">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power distribution planning reference bookent://SD_ILS/0/SD_ILS:2903812024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Willis, H. Lee, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420030310">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mobile and Wireless Communications Key technologies and future applicationsent://SD_ILS/0/SD_ILS:2476872024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Smyth, Peter, ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBBT009E">http://dx.doi.org/10.1049/PBBT009E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pipeline risk management manual ideas, techniques, and resourcesent://SD_ILS/0/SD_ILS:2541912024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Muhlbauer, W. Kent.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750675796">http://www.sciencedirect.com/science/book/9780750675796</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Parts selection and managementent://SD_ILS/0/SD_ILS:3017302024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Pecht, Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1002/0471723886">Authentication may be required</a>
<a href="http://catdir.loc.gov/catdir/bios/wiley046/2004040698.html">Full text available from Wiley InterScience</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/54046845.html">http://catalog.hathitrust.org/api/volumes/oclc/54046845.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/0471723886">http://dx.doi.org/10.1002/0471723886</a>
Book review (E-STREAMS) <a href="http://www.e-streams.com/es0804/es0804_4027.html">http://www.e-streams.com/es0804/es0804_4027.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High availability guide to DB2ent://SD_ILS/0/SD_ILS:3123602024-11-25T11:06:42Z2024-11-25T11:06:42ZYazar Eaton, Chris. Cialini, Enzo.<br/>Yer Numarası QA76.9 E28 2004<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>