Arama Sonuçları Reliability. - Daraltılmış: 2005SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092005$0025092005$0026te$003dILS$0026ps$003d300?2024-11-07T22:26:53ZMaintenance Theory of Reliabilityent://SD_ILS/0/SD_ILS:1753232024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:1195532024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Dhillon, B. S.<br/>Yer Numarası TS173 .D45 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:2872852024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:1194812024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Todinov, M. T.<br/>Yer Numarası TA169 .T65 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Todinov, M. T. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Universal Generating Function in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1753372024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Levitin, Gregory. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust communications software : extreme availability, reliability and scalability for carrier-grade systemsent://SD_ILS/0/SD_ILS:1194832024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Utas, Greg.<br/>Yer Numarası TK5105.9 U83 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Axiomatic quality integrating axiomatic design with six-sigma, reliability, and quality engineeringent://SD_ILS/0/SD_ILS:3016722024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar El-Haik, Basem.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim OverDrive (PDF) <a href="http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50">http://www.contentreserve.com/TitleInfo.asp?ID={100255F9-F437-4031-9A77-B96BBB9785C4}&Format=50</a>
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John Wiley <a href="http://dx.doi.org/10.1002/0471714682">http://dx.doi.org/10.1002/0471714682</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpAQIADSS2">http://app.knovel.com/web/toc.v/cid:kpAQIADSS2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, maintainability and risk practical methods for engineersent://SD_ILS/0/SD_ILS:2548542024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Smith, David John, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Adhesives technology for electronic applications materials, processes, reliabilityent://SD_ILS/0/SD_ILS:2564612024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Licari, James J., 1930- Swanson, Dale W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815515135">http://www.sciencedirect.com/science/book/9780815515135</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applicationsent://SD_ILS/0/SD_ILS:1681182024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Balakrishnan, N. editor. Nagaraja, H. N. editor. Kannan, N. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138793">http://dx.doi.org/10.1007/b138793</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 24th International Conference, SAFECOMP 2005, Fredrikstad, Norway, September 28-30, 2005. Proceedingsent://SD_ILS/0/SD_ILS:1830682024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Winther, Rune. editor. Gran, Bjørn Axel. editor. Dahll, Gustav. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11563228">http://dx.doi.org/10.1007/11563228</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust communications software extreme availability, reliability and scalability for carrier-grade systemsent://SD_ILS/0/SD_ILS:2956482024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Utas, Greg. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470011793">http://dx.doi.org/10.1002/0470011793</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Risk and Vulnerability Management Assisted by Decision Support Systems Relevance and Impact on Governanceent://SD_ILS/0/SD_ILS:1689852024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Gheorghe, Adrian V. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3721-X">http://dx.doi.org/10.1007/1-4020-3721-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sosyal ve davranışsal ölçümlerde güvenilirlik ve geçerlilikent://SD_ILS/0/SD_ILS:1082012024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Şencan, Hüner.<br/>Yer Numarası BF176 .S463 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Plant and machinery failure preventionent://SD_ILS/0/SD_ILS:2935722024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Hattangadi, A. A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/plant-machinery-failure-prevention">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Flowgraph models for multistate time-to-event dataent://SD_ILS/0/SD_ILS:3016332024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Huzurbazar, Aparna V., 1966- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471686565">http://dx.doi.org/10.1002/0471686565</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital communication over fading channelsent://SD_ILS/0/SD_ILS:2494082024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Simon, Marvin Kenneth, 1939- Alouini, Mohamed-Slim.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk assessment of power systems models, methods, and applicationsent://SD_ILS/0/SD_ILS:2494362024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Li, Wenyuan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Trustworthy systems through quantitative software engineeringent://SD_ILS/0/SD_ILS:2494372024-11-07T22:26:53Z2024-11-07T22:26:53ZYazar Bernstein, Lawrence, 1940- Yuhas, C. M. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>