Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: 2008 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092008$0025092008$0026ps$003d300$0026isd$003dtrue? 2024-11-14T17:27:19Z Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of MEMS ent://SD_ILS/0/SD_ILS:303632 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Tsuchiya, Toshiyuki.&#160;Tabata, Osamu, 1956-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527622139">http://dx.doi.org/10.1002/9783527622139</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=194693&ref=toc">http://www.myilibrary.com?id=194693&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mining Equipment Reliability, Maintainability, and Safety ent://SD_ILS/0/SD_ILS:144346 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Dhillon, Balbir S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product Reliability Specification and Performance ent://SD_ILS/0/SD_ILS:175790 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Murthy, Dodderi Narshima Prabhakar. author.&#160;Rausand, Marvin. author.&#160;&Oslash;ster&aring;s, Trond. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Reliability Models and Maintenance Policies ent://SD_ILS/0/SD_ILS:175800 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Silver Metallization Stability and Reliability ent://SD_ILS/0/SD_ILS:175677 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Adams, Daniel. author.&#160;Alford, Terry L. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mathematical models for systems reliability ent://SD_ILS/0/SD_ILS:287784 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Epstein, Benjamin, 1918-&#160;Weissman, Ishay, 1940-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420080834">Distributed by publisher. 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Keith, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:306517 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> New Computational Methods in Power System Reliability ent://SD_ILS/0/SD_ILS:187983 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Elmakias, David. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Advances in Reliability and Quality in Design ent://SD_ILS/0/SD_ILS:175716 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines ent://SD_ILS/0/SD_ILS:169842 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Pluvinage, Guy. editor.&#160;Elwany, Mohamed Hamdy. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Engineering design reliability applications for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:153040 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.&#160;CRC Press.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedings ent://SD_ILS/0/SD_ILS:188894 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Harrison, Michael D. editor.&#160;Sujan, Mark-Alexander. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability ent://SD_ILS/0/SD_ILS:183993 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Bertsche, Bernd. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11n ent://SD_ILS/0/SD_ILS:236024 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Perahia, Eldad.&#160;Stacey, Robert.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis ent://SD_ILS/0/SD_ILS:167030 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Limnios, Nikolaos. author.&#160;Barbu, Vlad Stefan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability technology, human error, and quality in health care ent://SD_ILS/0/SD_ILS:285036 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lubrication and maintenance of industrial machinery best practices and reliability ent://SD_ILS/0/SD_ILS:289649 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Gresham, Robert M.&#160;Totten, George E.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420089363">Distributed by publisher. 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H. author.&#160;Murthy, D. N. Prabhakar. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-011-7">http://dx.doi.org/10.1007/978-1-84800-011-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Justifying the Dependability of Computer-based Systems With Applications in Nuclear Engineering ent://SD_ILS/0/SD_ILS:175833 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Courtois, Pierre-Jacques. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-372-9">http://dx.doi.org/10.1007/978-1-84800-372-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risks in Modern Society ent://SD_ILS/0/SD_ILS:170104 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Bischoff, Hans-J&uuml;rgen. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8289-4">http://dx.doi.org/10.1007/978-1-4020-8289-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Oil and Security A World Beyond Petroleum ent://SD_ILS/0/SD_ILS:169783 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Frankel, Ernst Gabriel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6382-4">http://dx.doi.org/10.1007/978-1-4020-6382-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Information assurance dependability and security in networked systems ent://SD_ILS/0/SD_ILS:145553 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Qian, Yi, 1962-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123735669">http://www.sciencedirect.com/science/book/9780123735669</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dependability benchmarking for computer systems ent://SD_ILS/0/SD_ILS:249772 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Kanoun, Karama.&#160;Spainhower, Lisa.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electrically conductive adhesives ent://SD_ILS/0/SD_ILS:286342 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Gomatam, R. (Rajesh)&#160;Mittal, K. L., 1945-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9789004187825">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural design optimization considering uncertainties ent://SD_ILS/0/SD_ILS:287444 2024-11-14T17:27:19Z 2024-11-14T17:27:19Z Yazar&#160;Tsompanakis, Yiannis, 1969-&#160;Lagaros, Nikos D., 1970-&#160;Papadrakakis, Manolis.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203938522">Distributed by publisher. 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