Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: 2010 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092010$0025092010$0026ps$003d300$0026isd$003dtrue? 2024-11-14T17:37:25Z Reliability ent://SD_ILS/0/SD_ILS:233427 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Meyer, J. Patrick.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electronic thin-film reliability ent://SD_ILS/0/SD_ILS:278156 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Tu, K. N. (King-Ning), 1937-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:192824 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability assessment theory and practice ent://SD_ILS/0/SD_ILS:287818 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Spurgin, Anthony J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420068528">Distributed by publisher. 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N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, risk, and safety theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009 : Prague, Czech Republic, 7-19 September 2009 ent://SD_ILS/0/SD_ILS:288317 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;European Safety and Reliability Conference (2009 : Prague, Czech Republic)&#160;Bri?, Radim.&#160;Soares, C. Guedes.&#160;Martorell, Sebasti&#505;.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203859759">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:193040 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Schoitsch, Erwin. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managers ent://SD_ILS/0/SD_ILS:176221 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Lisnianski, Anatoly. author.&#160;Frenkel, Ilia. author.&#160;Ding, Yi. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-320-6">http://dx.doi.org/10.1007/978-1-84996-320-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Calculation of Roundabouts Capacity, Waiting Phenomena and Reliability ent://SD_ILS/0/SD_ILS:190985 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Mauro, Raffaele. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood function ent://SD_ILS/0/SD_ILS:133515 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Surhone, Lambert M.&#160;Timpledon, Miriam T.&#160;Marseken, Susan F.<br/>Yer Numaras&#305;&#160;H61 .S87 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Process risk and reliability management operational integrity management ent://SD_ILS/0/SD_ILS:147219 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Sutton, Ian S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:286084 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Wessels, William R.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420094404">Distributed by publisher. 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(Mohammad)&#160;Kaminskiy, Mark, 1946-&#160;Krivtsov, Vasiliy, 1963-<br/>Yer Numaras&#305;&#160;TA169 M627 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Mine safety a modern approach ent://SD_ILS/0/SD_ILS:144518 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=326034</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintenance for Industrial Systems ent://SD_ILS/0/SD_ILS:176011 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Manzini, Riccardo. author.&#160;Regattieri, Alberto. author.&#160;Pham, Hoang. author.&#160;Ferrari, Emilio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-575-8">http://dx.doi.org/10.1007/978-1-84882-575-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risks in Technological Systems ent://SD_ILS/0/SD_ILS:176029 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Grimvall, G&ouml;ran. editor.&#160;Holmgren, &Aring;ke J. editor.&#160;Jacobsson, Per. editor.&#160;Thed&eacute;en, Torbj&ouml;rn. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-641-0">http://dx.doi.org/10.1007/978-1-84882-641-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure ent://SD_ILS/0/SD_ILS:205126 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Lukszo, Zofia. editor.&#160;Deconinck, Geert. editor.&#160;Weijnen, Margot P. C. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-3594-3">http://dx.doi.org/10.1007/978-90-481-3594-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis (More Physics for Presidents) ent://SD_ILS/0/SD_ILS:205282 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-8667-9">http://dx.doi.org/10.1007/978-90-481-8667-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Causing human actions new perspectives on the causal theory of action ent://SD_ILS/0/SD_ILS:239415 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Buckareff, Andrei A., 1971-&#160;Aguilar, Jes&uacute;s H. (Jes&uacute;s Humberto), 1962-&#160;Project Muse.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://muse.jhu.edu/books/9780262289139/">Full text available: </a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mission-critical and safety-critical systems handbook design and development for embedded applications ent://SD_ILS/0/SD_ILS:146227 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Fowler, Kim.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750685672">http://www.sciencedirect.com/science/book/9780750685672</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Sustainable resilience of energy systems ent://SD_ILS/0/SD_ILS:280812 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Afgan, Naim.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=548892">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=548892</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Active pharmaceutical ingredients development, manufacturing, and regulation ent://SD_ILS/0/SD_ILS:285167 2024-11-14T17:37:25Z 2024-11-14T17:37:25Z Yazar&#160;Nusim, Stanley.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439803394">Distributed by publisher. 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