Arama Sonuçları Reliability. - Daraltılmış: 2011SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092011$0025092011$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-29T05:40:18ZMEMS Reliabilityent://SD_ILS/0/SD_ILS:1724862024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical reliability engineeringent://SD_ILS/0/SD_ILS:3055632024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Network Reliability and Resilienceent://SD_ILS/0/SD_ILS:1950052024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovations in Power Systems Reliabilityent://SD_ILS/0/SD_ILS:1684172024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Nonparametric Statistics in Reliabilityent://SD_ILS/0/SD_ILS:1684262024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Reliability Assessment with OR Applicationsent://SD_ILS/0/SD_ILS:1684542024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fatigue and Fracture Reliability Engineeringent://SD_ILS/0/SD_ILS:1684582024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor Power Devices Physics, Characteristics, Reliabilityent://SD_ILS/0/SD_ILS:1915862024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-11125-9">http://dx.doi.org/10.1007/978-3-642-11125-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Multistate systems reliability theory with applicationsent://SD_ILS/0/SD_ILS:2987812024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Natvig, Bent, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:3129152024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Yer Numarası ONLINE(312915.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Engineering Basic Concepts and Applications in ICTent://SD_ILS/0/SD_ILS:1945502024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Lazzaroni, Massimo. author. Cristaldi, Loredana. author. Peretto, Lorenzo. author. Rinaldi, Paola. author. Catelani, Marcantonio. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-20983-3">http://dx.doi.org/10.1007/978-3-642-20983-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architecturesent://SD_ILS/0/SD_ILS:1725302024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Adhesives technology for electronic applications materials, processing, reliabilityent://SD_ILS/0/SD_ILS:1460142024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Licari, James J., 1930- Swanson, Dale W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems.ent://SD_ILS/0/SD_ILS:1491762024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Smith, David J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Assessment of Power System Reliability Methods and Applicationsent://SD_ILS/0/SD_ILS:1685692024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Čepin, Marko. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:4594222024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Smith, David J. (David John), 1943 June 22-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:3056902024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Bâzu, M. I. (Marius I.), 1948- Băjenescu, Titu I., 1938-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781119990093">http://dx.doi.org/10.1002/9781119990093</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41699">http://www.books24x7.com/marc.asp?bookid=41699</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Techniques for Structural Health Monitoringent://SD_ILS/0/SD_ILS:1684782024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Gopalakrishnan, Srinivasan. author. Ruzzene, Massimo. author. Hanagud, Sathyanaraya. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-284-1">http://dx.doi.org/10.1007/978-0-85729-284-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dependability of Networked Computer-based Systemsent://SD_ILS/0/SD_ILS:1684882024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Verma, Ajit Kumar. author. Ajit, Srividya. author. Kumar, Manoj. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-318-3">http://dx.doi.org/10.1007/978-0-85729-318-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety and Risk Modeling and Its Applicationsent://SD_ILS/0/SD_ILS:1685112024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-470-8">http://dx.doi.org/10.1007/978-0-85729-470-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Warranty Data Collection and Analysisent://SD_ILS/0/SD_ILS:1685572024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Blischke, Wallace R. author. Karim, M. Rezaul. author. Murthy, D. N. Prabhakar. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-647-4">http://dx.doi.org/10.1007/978-0-85729-647-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Bayesian Inference for Probabilistic Risk Assessment A Practitioner's Guidebookent://SD_ILS/0/SD_ILS:1761812024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Kelly, Dana. author. Smith, Curtis. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-187-5">http://dx.doi.org/10.1007/978-1-84996-187-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Replacement Models with Minimal Repairent://SD_ILS/0/SD_ILS:1684572024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Tadj, Lotfi. editor. Ouali, M.-Salah. editor. Yacout, Soumaya. editor. Ait-Kadi, Daoud. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-215-5">http://dx.doi.org/10.1007/978-0-85729-215-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk Navigation Strategies for Major Capital Projects Beyond the Myth of Predictabilityent://SD_ILS/0/SD_ILS:1685412024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Rolstadås, Asbjørn. author. Hetland, Per Willy. author. Jergeas, George Farage. author. Westney, Richard E. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-594-1">http://dx.doi.org/10.1007/978-0-85729-594-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Model-Based Requirements Engineeringent://SD_ILS/0/SD_ILS:2478742024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Holt, Jon Perry, Simon A Brownsword, Mike<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBPC009E">http://dx.doi.org/10.1049/PBPC009E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliable Communications for Short-Range Wireless Systemsent://SD_ILS/0/SD_ILS:2352652024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Guvenc, Ismail. Gezici, Sinan. Sahinoglu, Zafer. Kozat, Ulas C..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511974366">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliable control and filtering of linear systems with adaptive mechanismsent://SD_ILS/0/SD_ILS:2888552024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Yang, Guang-Hong. Ye, Dan, 1979-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439835234">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintaining Mission Critical Systems in a 24/7 Environmentent://SD_ILS/0/SD_ILS:2499252024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Curtis, Peter M., author. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instructional technology research, design and development lessons from the fieldent://SD_ILS/0/SD_ILS:2789172024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Alias, Nor Aziah, 1961- Hashim, Sulaiman, 1963- IGI Global.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=410268">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=410268</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and safety assessment of critical systemsent://SD_ILS/0/SD_ILS:2851072024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Bozzano, Marco. Villafiorita, Adolfo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439803325">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design decisions under uncertainty with limited informationent://SD_ILS/0/SD_ILS:2864962024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Nikolaidis, Efstratios. Mourelatos, Zissimos P. Pandey, Vijitashwa.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203834985">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital protective relays problems and solutionsent://SD_ILS/0/SD_ILS:2870432024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Gurevich, Vladimir, 1956-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439837863">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in marine structures proceedings of the 3rd International Conference on Marine Structures : MARSTRUCT 2011, Hamburg, Germany, 28-30 March 2011ent://SD_ILS/0/SD_ILS:2874142024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar International Conference on Marine Structures (3rd : 2011 : Hamburg, Germany) Soares, C. Guedes. Fricke, W. (Wolfgang), 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203808115">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Systems engineering tools and methodsent://SD_ILS/0/SD_ILS:2879742024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Kamrani, Ali K. Azimi, Maryam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439809273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data center storage cost-effective strategies, implementation, and managementent://SD_ILS/0/SD_ILS:2879982024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Smith, Hubbert.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439834886">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Industrial chemistry new applications, processes and systemsent://SD_ILS/0/SD_ILS:2881402024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Trimm, Harold H. (Harold Henry), 1955- Hunter, William.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466562653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Rapid load testing on piles interpretation guidelinesent://SD_ILS/0/SD_ILS:2900652024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Hl̲scher, Paul, 1960-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203145883">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applications of statistics and probability in civil engineeringent://SD_ILS/0/SD_ILS:2900662024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar International Conference on Applications of Statistics and Probability in Civil Engineering (2011 : Z¿rich, Switzerland) Faber, M. H. (Michael Havbro) Kh̲ler, Jochen, 1972- Nishijima, Kazuyoshi.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203144794">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantitative measurements for logisticsent://SD_ILS/0/SD_ILS:2936042024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Frohne, Philip T. SOLE--The International Society of Logistics.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/quantitative-measurements-for-logistics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied software measurement global analysis of productivity and qualityent://SD_ILS/0/SD_ILS:2933302024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Jones, Capers.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/applied-software-measurement">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Supportability engineering handbook implementation, measurement, and managementent://SD_ILS/0/SD_ILS:2935552024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Jones, James V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/supportability-engineering-handbook">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Introduction to microsystem packaging technologyent://SD_ILS/0/SD_ILS:2915512024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Jin, Yufeng. Wang, Zhiping, 1962- Oct. 6- Chen, Jing, 1974-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439865972">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Polymer electrolyte fuel cell degradationent://SD_ILS/0/SD_ILS:1472252024-11-29T05:40:18Z2024-11-29T05:40:18ZYazar Mench, Matthew M. Kumbur, Emin Caglan. Veziroğlu, T. Nejat.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123869364">http://www.sciencedirect.com/science/book/9780123869364</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>