Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: 2013 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092013$0025092013$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-22T19:08:24Z Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332363.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;El-Reedy, Mohamed Abdallah.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. 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N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013 ent://SD_ILS/0/SD_ILS:356919 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor.&#160;Deodatis, G. 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W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332682.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. ent://SD_ILS/0/SD_ILS:305286 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Epperlein, Peter W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications ent://SD_ILS/0/SD_ILS:306566 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Wu, Bin, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedings ent://SD_ILS/0/SD_ILS:334958 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Yer Numaras&#305;&#160;ONLINE(334958.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings ent://SD_ILS/0/SD_ILS:335005 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Bitsch, Friedemann. editor.&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Ka&acirc;niche, Mohamed. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335005.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Yer Numaras&#305;&#160;ONLINE(365001.1)<br/>Elektronik Eri&#351;im&#160;Abstract with links to resource <a 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K&uuml;t&uuml;phane~1<br/> Quality Control Applications ent://SD_ILS/0/SD_ILS:330894 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Chorafas, Dimitris N. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330894.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2966-0">http://dx.doi.org/10.1007/978-1-4471-2966-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving the Earthquake Resilience of Buildings The worst case approach ent://SD_ILS/0/SD_ILS:330916 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Takewaki, Izuru. author.&#160;Moustafa, Abbas. author.&#160;Fujita, Kohei. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330916.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4144-0">http://dx.doi.org/10.1007/978-1-4471-4144-0</a><br/>Format:&#160;Elektrnik 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href="http://dx.doi.org/10.1007/978-94-007-5515-4">http://dx.doi.org/10.1007/978-94-007-5515-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to Risk and Uncertainty in Hydrosystem Engineering ent://SD_ILS/0/SD_ILS:336085 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Goodarzi, Ehsan. author.&#160;Ziaei, Mina. author.&#160;Teang Shui, Lee. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(336085.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-5851-3">http://dx.doi.org/10.1007/978-94-007-5851-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Infrastructure health in civil engineering ent://SD_ILS/0/SD_ILS:289348 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Ettouney, Mohammed.&#160;Alampalli, Sreenivas.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a 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K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781466503472">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Systems engineering and safety building the bridge ent://SD_ILS/0/SD_ILS:289077 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Glismann, Peter J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781466552135">Distributed by publisher. 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Kim. author.&#160;Sabbagh, Elias H. author.&#160;Aldrin, John C. author.&#160;Knopp, Jeremy S. author.<br/>Yer Numaras&#305;&#160;ONLINE(330843.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8429-6">http://dx.doi.org/10.1007/978-1-4419-8429-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maritime Governance and Policy-Making ent://SD_ILS/0/SD_ILS:330919 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Roe, Michael. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330919.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4153-2">http://dx.doi.org/10.1007/978-1-4471-4153-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Privacy and Security for Cloud Computing ent://SD_ILS/0/SD_ILS:330926 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Pearson, Siani. editor.&#160;Yee, George. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330926.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4189-1">http://dx.doi.org/10.1007/978-1-4471-4189-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nanomaterials: A Danger or a Promise? A Chemical and Biological Perspective ent://SD_ILS/0/SD_ILS:330931 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Brayner, Roberta. editor.&#160;Fi&eacute;vet, Fernand. editor.&#160;Coradin, Thibaud. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330931.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4213-3">http://dx.doi.org/10.1007/978-1-4471-4213-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Energy-Efficient High Performance Computing Measurement and Tuning ent://SD_ILS/0/SD_ILS:330991 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Laros III, James H. author.&#160;Pedretti, Kevin. author.&#160;Kelly, Suzanne M. author.&#160;Shu, Wei. author.&#160;Ferreira, Kurt. author.<br/>Yer Numaras&#305;&#160;ONLINE(330991.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4492-2">http://dx.doi.org/10.1007/978-1-4471-4492-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> CIRP Design 2012 Sustainable Product Development ent://SD_ILS/0/SD_ILS:330996 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Chakrabarti, Amaresh. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(330996.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4507-3">http://dx.doi.org/10.1007/978-1-4471-4507-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality Management in Reverse Logistics A Broad Look on Quality Issues and Their Interaction with Closed-Loop Supply Chains ent://SD_ILS/0/SD_ILS:331003 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Nikolaidis, Yiannis. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331003.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4537-0">http://dx.doi.org/10.1007/978-1-4471-4537-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Control Performance Management in Industrial Automation Assessment, Diagnosis and Improvement of Control Loop Performance ent://SD_ILS/0/SD_ILS:331006 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Jelali, Mohieddine. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331006.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4546-2">http://dx.doi.org/10.1007/978-1-4471-4546-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Model-Based Fault Diagnosis Techniques Design Schemes, Algorithms and Tools ent://SD_ILS/0/SD_ILS:331061 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Ding, Steven X. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331061.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4799-2">http://dx.doi.org/10.1007/978-1-4471-4799-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fuzzy Hierarchical Model for Risk Assessment Principles, Concepts, and Practical Applications ent://SD_ILS/0/SD_ILS:331126 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Chan, Hing Kai. author.&#160;Wang, Xiaojun. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331126.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-5043-5">http://dx.doi.org/10.1007/978-1-4471-5043-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> From Fault Classification to Fault Tolerance for Multi-Agent Systems ent://SD_ILS/0/SD_ILS:331127 2024-11-22T19:08:24Z 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Proceedings ent://SD_ILS/0/SD_ILS:334871 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Malyshkin, Victor. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334871.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-39958-9">http://dx.doi.org/10.1007/978-3-642-39958-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Energy Minimization Methods in Computer Vision and Pattern Recognition 9th International Conference, EMMCVPR 2013, Lund, Sweden, August 19-21, 2013. 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2024-11-22T19:08:24Z Yazar&#160;Roeser, Sabine. editor.&#160;Hillerbrand, Rafaela. editor.&#160;Sandin, Per. editor.&#160;Peterson, Martin. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335980.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-5455-3">http://dx.doi.org/10.1007/978-94-007-5455-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Proceedings of the Institute of Industrial Engineers Asian Conference 2013 ent://SD_ILS/0/SD_ILS:336519 2024-11-22T19:08:24Z 2024-11-22T19:08:24Z Yazar&#160;Lin, Yi-Kuei. editor.&#160;Tsao, Yu-Chung. editor.&#160;Lin, Shi-Woei. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(336519.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-981-4451-98-7">http://dx.doi.org/10.1007/978-981-4451-98-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i 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