Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: 2014 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092014$0025092014$0026ps$003d300$0026isd$003dtrue? 2024-11-14T17:25:16Z Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Yer Numaras&#305;&#160;ONLINE(341870.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:489410 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of large and complex systems ent://SD_ILS/0/SD_ILS:355886 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Ko&#322;owrocki, Krzysztof, author.<br/>Yer Numaras&#305;&#160;ONLINE(355886.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ternary Networks Reliability and Monte Carlo ent://SD_ILS/0/SD_ILS:485508 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;Vaisman, Radislav. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human Reliability, Error, and Human Factors in Power Generation ent://SD_ILS/0/SD_ILS:487643 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:355485 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Ohring, Milton, 1936-&#160;Kasprzak, Lucian.<br/>Yer Numaras&#305;&#160;ONLINE(355485.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of inter-rater reliability : the definitive guide to measuring the extent of agreement among raters ent://SD_ILS/0/SD_ILS:338633 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Gwet, Kilem Li, author<br/>Yer Numaras&#305;&#160;QA278 G8 2014<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1&#160;Sa&#287;l&#305;k Bilimleri K&uuml;t&uuml;phanesi~1<br/> Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications ent://SD_ILS/0/SD_ILS:489246 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Franco, Jacopo. author.&#160;Kaczer, Ben. author.&#160;Groeseneken, Guido. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of safety-critical systems : theory and application ent://SD_ILS/0/SD_ILS:341773 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Rausand, Marvin.<br/>Yer Numaras&#305;&#160;ONLINE(341773.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Gunawan, Indra.<br/>Yer Numaras&#305;&#160;ONLINE(342010.1)<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability prediction from burn-in data fit to reliability models ent://SD_ILS/0/SD_ILS:355921 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Bernstein, Joseph.<br/>Yer Numaras&#305;&#160;ONLINE(355921.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. Proceedings ent://SD_ILS/0/SD_ILS:482801 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Bondavalli, Andrea. editor.&#160;Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings ent://SD_ILS/0/SD_ILS:485676 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Bondavalli, Andrea. editor.&#160;Ceccarelli, Andrea. editor.&#160;Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Flash Memories Economic Principles of Performance, Cost and Reliability Optimization ent://SD_ILS/0/SD_ILS:488848 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Richter, Detlev. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedings ent://SD_ILS/0/SD_ILS:489055 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Teufel, Stephanie. editor.&#160;A Min, Tjoa. editor.&#160;You, Illsun. editor.&#160;Weippl, Edgar. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Random Maintenance Policies ent://SD_ILS/0/SD_ILS:487923 2024-11-14T17:25:16Z 2024-11-14T17:25:16Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4471-6575-0">https://doi.org/10.1007/978-1-4471-6575-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Offshore Risk Assessment vol 2. 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