Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: 2018 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092018$0025092018$0026te$003dILS$0026ps$003d300?dt=list 2026-06-03T20:38:27Z Structural reliability analysis and prediction ent://SD_ILS/0/SD_ILS:593807 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Melchers, R. E. (Robert E.), 1945- author.&#160;Beck, Andr&eacute; T., author.<br/>Yer Numaras&#305;&#160;TA656.5 .M45 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability prediction and testing textbook ent://SD_ILS/0/SD_ILS:594209 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Klyatis, Lev M., author.&#160;Anderson, Edward, 1945- author.<br/>Yer Numaras&#305;&#160;TA169.3 .K5964 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:401906 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> In-Service Fatigue Reliability of Structures ent://SD_ILS/0/SD_ILS:401041 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Petinov, Sergei V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Aspect of Cloud Computing Environment ent://SD_ILS/0/SD_ILS:399144 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Kumar, Vikas. author.&#160;Vidhyalakshmi, R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety-Critical Electrical Drives Topologies, Reliability, Performance ent://SD_ILS/0/SD_ILS:401112 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Bolvashenkov, Igor. author.&#160;Herzog, Hans-Georg. author.&#160;Frenkel, Ilia. author.&#160;Khvatskin, Lev. author.&#160;Lisnianski, Anatoly. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Point Processes for Reliability Analysis Shocks and Repairable Systems ent://SD_ILS/0/SD_ILS:402392 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Cha, Ji Hwan. author.&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Advances in Multi-state Systems Reliability Theory and Applications ent://SD_ILS/0/SD_ILS:401098 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Lisnianski, Anatoly. editor.&#160;Frenkel, Ilia. editor.&#160;Karagrigoriou, Alex. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practice ent://SD_ILS/0/SD_ILS:401845 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;De Felice, Fabio. editor.&#160;Petrillo, Antonella. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. 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Office of Scientific Research.&#160;University of South Florida.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Production availability and reliability : use in the oil and gas industry ent://SD_ILS/0/SD_ILS:594494 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Leroy, Alain, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat&rsquo;17, 18-21 October, 2017, Riga, Latvia ent://SD_ILS/0/SD_ILS:402395 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Kabashkin, Igor. editor.&#160;Yatskiv, Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedings ent://SD_ILS/0/SD_ILS:400873 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Wang, Lei. editor.&#160;Qiu, Tie. editor.&#160;Zhao, Wenbing. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip ent://SD_ILS/0/SD_ILS:401348 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Wang, Zheng. author.&#160;Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solid State Lighting Reliability Part 2 Components to Systems ent://SD_ILS/0/SD_ILS:401528 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;van Driel, Willem Dirk. editor.&#160;Fan, Xuejun. editor.&#160;Zhang, Guo Qi. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability ent://SD_ILS/0/SD_ILS:400290 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Jahanshahi, Mohsen. author.&#160;Bistouni, Fathollah. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17&ndash;21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA ent://SD_ILS/0/SD_ILS:401830 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Boring, Ronald Laurids. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, V&auml;ster&aring;s, Sweden, September 18, 2018, Proceedings ent://SD_ILS/0/SD_ILS:399783 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Gallina, Barbara. editor. (orcid)0000-0002-6952-1053&#160;Skavhaug, Amund. editor.&#160;Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443&#160;Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, V&auml;ster&aring;s, Sweden, September 19-21, 2018, Proceedings ent://SD_ILS/0/SD_ILS:400344 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Gallina, Barbara. editor. (orcid)0000-0002-6952-1053&#160;Skavhaug, Amund. editor.&#160;Bitsch, Friedemann. editor. 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author.&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-70456-2">https://doi.org/10.1007/978-3-319-70456-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Critical Infrastructures, Key Resources, Key Assets Risk, Vulnerability, Resilience, Fragility, and Perception Governance ent://SD_ILS/0/SD_ILS:402462 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Gheorghe, Adrian V. author.&#160;Vamanu, Dan V. author.&#160;Katina, Polinpapilinho F. author.&#160;Pulfer, Roland. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-69224-1">https://doi.org/10.1007/978-3-319-69224-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Forensic systems engineering : 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Transdisciplinary engineering design process ent://SD_ILS/0/SD_ILS:594394 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Ertas, Atila, 1944- author.<br/>Yer Numaras&#305;&#160;TA174 .E7824 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119474654">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119474654</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Smart grid communication infrastructures : big data, cloud computing, and security ent://SD_ILS/0/SD_ILS:594395 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Ye, Feng, 1989- author.&#160;Qian, Yi, 1962- author.&#160;Hu, Rose Qingyang, author.<br/>Yer Numaras&#305;&#160;TK3105<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119240136">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119240136</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i 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href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hybrid electric vehicles : principles and applications with practical perspectives ent://SD_ILS/0/SD_ILS:593667 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Mi, Chris, author.&#160;Masrur, Abul, author.<br/>Yer Numaras&#305;&#160;TL221.15 .M545 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118970553">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118970553</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of safety principles ent://SD_ILS/0/SD_ILS:594034 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;M&ouml;ller, Niklas, editor.&#160;Hansson, Sven Ove, 1951- editor.&#160;Holmberg, Jan-Erik, editor.<br/>Yer Numaras&#305;&#160;HD7261 .H36 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119443070</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wave and tidal energy ent://SD_ILS/0/SD_ILS:594055 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Greaves, Deborah, editor.&#160;Iglesias, Gregorio, 1969- editor.<br/>Yer Numaras&#305;&#160;TC147 .W38 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119014492">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119014492</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dynamic vulnerability assessment and intelligent control for sustainable power systems ent://SD_ILS/0/SD_ILS:594059 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Rueda Torres, Jos&eacute; L., 1980- author.&#160;Gonzalez-Longatt, Francisco, 1972- author.<br/>Yer Numaras&#305;&#160;TK3081<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214984">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214984</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanics of microsystems ent://SD_ILS/0/SD_ILS:594077 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Corigliano, Alberto, author.<br/>Yer Numaras&#305;&#160;TK7875<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053828">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119053828</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural health monitoring of large civil engineering structures ent://SD_ILS/0/SD_ILS:594137 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Chen, Hua-Peng, author.&#160;Ni, Yi-Qing, contributor.<br/>Yer Numaras&#305;&#160;TA656.6 .C44 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166641">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119166641</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test development ent://SD_ILS/0/SD_ILS:594229 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Irwing, Paul, editor.<br/>Yer Numaras&#305;&#160;BF39 .W55 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical data cleaning with applications in R ent://SD_ILS/0/SD_ILS:594236 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Loo, Mark van der, 1976- author.&#160;Jonge, Edwin de, 1972- author.<br/>Yer Numaras&#305;&#160;QA276.45 .R3 J66 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118897126">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118897126</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Data uncertainty and important measures ent://SD_ILS/0/SD_ILS:594255 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Simon, Christophe, author.&#160;Weber, Philippe (Co-author of Data uncertainty and important measures), author.&#160;Sallak, Mohamed, author.<br/>Yer Numaras&#305;&#160;Q375 .S56 2018 EB<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119489375">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119489375</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Aerospace actuators. 3, European commercial aircraft and tiltrotor aircraft ent://SD_ILS/0/SD_ILS:594256 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Mar&eacute;, Jean-Charles, author.<br/>Yer Numaras&#305;&#160;TJ223 .A25 M37 2018 EB<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119505433">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119505433</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Integration of large scale wind energy with electrical power system in China ent://SD_ILS/0/SD_ILS:594279 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Lu, Zongxiang, 1974- author.&#160;Zhou, Shuangxi, 1941- author.<br/>Yer Numaras&#305;&#160;TK1541<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118910054">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118910054</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i 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Center for Chemical Process Safety, author.&#160;Energy Institute (Great Britain)<br/>Yer Numaras&#305;&#160;TP150 .S24 B69 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119490357">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119490357</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Prognostics and health management of electronics : fundamentals, machine learning, and internet of things ent://SD_ILS/0/SD_ILS:594639 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Pecht, Michael, editor.&#160;Kang, Myeongsu, 1980- editor.<br/>Yer Numaras&#305;&#160;TK7870<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515326">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119515326</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for failure modes and effects analysis for medical devices ent://SD_ILS/0/SD_ILS:543242 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;PRESS, DYADEM.<br/>Yer Numaras&#305;&#160;R856.6<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205804">https://www.taylorfrancis.com/books/9780429205804</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ecological models for regulatory risk assessments of pesticides : developing a strategy for the future ent://SD_ILS/0/SD_ILS:543680 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Thorbek, Pernille.<br/>Yer Numaras&#305;&#160;QH545 .P4<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429092329">https://www.taylorfrancis.com/books/9780429092329</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Self-Regulation in Activity Theory : Applied Work Design for Human-Computer and Human-Machine Systems ent://SD_ILS/0/SD_ILS:542182 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Bedny, Gregory Z., author.&#160;Karwowski, Waldemar, author.&#160;Bedny, Inna, author.<br/>Yer Numaras&#305;&#160;TA166 .B436 2018<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781466569355">https://www.taylorfrancis.com/books/e/9781466569355</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429188145">https://www.taylorfrancis.com/books/9780429188145</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Complex and Embedded Systems ent://SD_ILS/0/SD_ILS:546439 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Pries, Kim H., author.&#160;Quigley, Jon M., author.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;TK7895 .E42<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315169453">Click here to view</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Understanding least squares estimation and geomatics data analysis ent://SD_ILS/0/SD_ILS:594776 2026-06-03T20:38:27Z 2026-06-03T20:38:27Z Yazar&#160;Ogundare, John Olusegun, author.<br/>Yer Numaras&#305;&#160;QA276.8<br/>Elektronik Eri&#351;im&#160;<a 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Yazar&#160;Campbell, Roy Harold, editor.&#160;Kamhoua, Charles A., editor.&#160;Kwiat, Kevin A., editor.<br/>Yer Numaras&#305;&#160;QA76.585 .A87 2018 EB<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119428497">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119428497</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>