Arama Sonuçları Reliability. - Daraltılmış: Circuits and Systems.
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https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509Circuits$002band$002bSystems.$002509Circuits$002band$002bSystems.$0026te$003dILS$0026ps$003d300?dt=list
2024-12-27T11:56:26Z
Analog IC Reliability in Nanometer CMOS
ent://SD_ILS/0/SD_ILS:331961
2024-12-27T11:56:26Z
2024-12-27T11:56:26Z
Yazar Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331961.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-6163-0">http://dx.doi.org/10.1007/978-1-4614-6163-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid State Lighting Reliability Components to Systems
ent://SD_ILS/0/SD_ILS:331314
2024-12-27T11:56:26Z
2024-12-27T11:56:26Z
Yazar van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331314.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design, Analysis and Test of Logic Circuits Under Uncertainty
ent://SD_ILS/0/SD_ILS:335669
2024-12-27T11:56:26Z
2024-12-27T11:56:26Z
Yazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fault-Tolerant Design
ent://SD_ILS/0/SD_ILS:331297
2024-12-27T11:56:26Z
2024-12-27T11:56:26Z
Yazar Dubrova, Elena. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331297.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-2113-9">http://dx.doi.org/10.1007/978-1-4614-2113-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>