Arama Sonuçları Reliability. - Daraltılmış: Electronic books.
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Structural reliability
ent://SD_ILS/0/SD_ILS:297978
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Yazar Lemaire, Maurice. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for reliability
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Yazar Raheja, Dev. Gullo, Louis J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical system reliability
ent://SD_ILS/0/SD_ILS:153146
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Yazar Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic reliability models
ent://SD_ILS/0/SD_ILS:299523
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Yazar Ushakov, I. A. (Igorʹ Alekseevich)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability and availability of cloud computing
ent://SD_ILS/0/SD_ILS:249383
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Yazar Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
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Yazar Klyatis, Lev M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Multistate systems reliability theory with applications
ent://SD_ILS/0/SD_ILS:298781
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Yazar Natvig, Bent, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability modeling, prediction, and optimization
ent://SD_ILS/0/SD_ILS:300337
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Yazar Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a>
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Semiconductor memories technology, testing, and reliability
ent://SD_ILS/0/SD_ILS:249739
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Yazar Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Telecommunications system reliability engineering, theory, and practice
ent://SD_ILS/0/SD_ILS:249397
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Yazar Ayers, Mark L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
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Yazar Strong, Alvin Wayne, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Rules of thumb for maintenance and reliability engineers
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Yazar Smith, Ricky. Mobley, R. Keith, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability technology principles and practice of failure prevention in electronic systems
ent://SD_ILS/0/SD_ILS:298817
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Yazar Pascoe, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems
ent://SD_ILS/0/SD_ILS:249351
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Yazar Bauer, Eric. Adams, Randee. Eustace, Dan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Importance measures in reliability, risk, and optimization principles and applications
ent://SD_ILS/0/SD_ILS:299386
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Yazar Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Using the Weibull distribution reliability, modeling, and inference
ent://SD_ILS/0/SD_ILS:299479
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Yazar McCool, John, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=388380">Connect to MyiLibrary resource.</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118351994">http://dx.doi.org/10.1002/9781118351994</a>
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ebrary <a href="http://site.ebrary.com/id/10593122">http://site.ebrary.com/id/10593122</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=894399">http://swb.eblib.com/patron/FullRecord.aspx?p=894399</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Spacecraft reliability and multi-state failures a statistical approach
ent://SD_ILS/0/SD_ILS:305721
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Yazar Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for reliability information and computer-based systems
ent://SD_ILS/0/SD_ILS:249879
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Yazar Bauer, Eric.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Robust design methodology for reliability exploring the effects of variation and uncertainty
ent://SD_ILS/0/SD_ILS:298396
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Yazar Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power distribution system reliability practical methods and applications
ent://SD_ILS/0/SD_ILS:249563
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Yazar Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Florida
ent://SD_ILS/0/SD_ILS:297457
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Yazar International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Tutorial on hardware and software reliability, maintainability, and availability
ent://SD_ILS/0/SD_ILS:249814
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Yazar Schneidewind, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability, maintainability and risk practical methods for engineers
ent://SD_ILS/0/SD_ILS:254854
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Yazar Smith, David John, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fault detectability in DWDM toward higher signal quality & system reliability
ent://SD_ILS/0/SD_ILS:249713
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Yazar Kartalopoulos, Stamatios V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263624</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
ent://SD_ILS/0/SD_ILS:249594
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Yazar Pukite, Jan, 1928- Pukite, Paul.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Implosion : lessons from national security, high reliability spacecraft, electronics, and the forces which changed them
ent://SD_ILS/0/SD_ILS:249341
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Yazar Temple, L. Parker.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6480472</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Effective FMEAs achieving safe, reliable, and economical products and processes using failure mode and effects analysis
ent://SD_ILS/0/SD_ILS:299377
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Yazar Carlson, Carl (Carl Seymour)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=827069</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118312575">http://dx.doi.org/10.1002/9781118312575</a>
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Introduction to imprecise probabilities
ent://SD_ILS/0/SD_ILS:341745
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Yazar Augustin, Thomas, editor.<br/>Yer Numarası ONLINE(341745.1)<br/>Elektronik Erişim Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470973813.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470973813.jpg</a>
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ebrary <a href="http://site.ebrary.com/id/10856859">http://site.ebrary.com/id/10856859</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118763117">http://dx.doi.org/10.1002/9781118763117</a>
MyiLibrary <a href="http://www.myilibrary.com?id=595066">http://www.myilibrary.com?id=595066</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic design for optimization and robustness for engineers
ent://SD_ILS/0/SD_ILS:341796
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Yazar Dodson, Bryan, 1962- author. Hammett, Patrick C., author. Klerx, Rene, author.<br/>Yer Numarası ONLINE(341796.1)<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781118796306">Available by subscription from Safari Books Online</a>
ebrary <a href="http://alltitles.ebrary.com/Doc?id=10896040">http://alltitles.ebrary.com/Doc?id=10896040</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118796245">http://dx.doi.org/10.1002/9781118796245</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118796306">http://proquest.tech.safaribooksonline.de/9781118796306</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk assessment of power systems : models, methods, and applications
ent://SD_ILS/0/SD_ILS:341888
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Li, Wenyuan, 1946- author.<br/>Yer Numarası ONLINE(341888.1)<br/>Elektronik Erişim <a href="http://site.ebrary.com/lib/byuprovo/docDetail.action?docID=10842316">CLICK HERE for online access</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1638154">http://public.eblib.com/choice/publicfullrecord.aspx?p=1638154</a>
ebrary <a href="http://site.ebrary.com/id/10842316">http://site.ebrary.com/id/10842316</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118849972">http://dx.doi.org/10.1002/9781118849972</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintaining Mission Critical Systems in a 24/7 Environment
ent://SD_ILS/0/SD_ILS:249925
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Curtis, Peter M., author. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Structural dynamics of electronic and photonic systems
ent://SD_ILS/0/SD_ILS:298719
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Suhir, Ephraim. Yu, T. X. (Tongxi), 1941- Connally, Eric. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470950012">An electronic book accessible through the World Wide Web; click for information</a>
<a href="$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012">$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Architecting resilient systems accident avoidance and survival and recovery from disruptions
ent://SD_ILS/0/SD_ILS:297830
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Jackson, Scott.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470544013">http://dx.doi.org/10.1002/9780470544013</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10355233">http://site.ebrary.com/lib/alltitles/Doc?id=10355233</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Voldman, Steven H. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transient-induced latchup in CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:249785
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Systems and software engineering with applications
ent://SD_ILS/0/SD_ILS:249813
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Schneidewind, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software error detection through testing and analysis
ent://SD_ILS/0/SD_ILS:297725
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Huang, J. C., 1935-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332960">http://site.ebrary.com/lib/alltitles/Doc?id=10332960</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Dependability benchmarking for computer systems
ent://SD_ILS/0/SD_ILS:249772
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Kanoun, Karama. Spainhower, Lisa.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Maintaining mission critical systems in a 24/7 environment
ent://SD_ILS/0/SD_ILS:249485
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Curtis, Peter M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital communication over fading channels
ent://SD_ILS/0/SD_ILS:249408
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Simon, Marvin Kenneth, 1939- Alouini, Mohamed-Slim.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238261</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Risk assessment of power systems models, methods, and applications
ent://SD_ILS/0/SD_ILS:249436
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Li, Wenyuan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5238312</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Trustworthy systems through quantitative software engineering
ent://SD_ILS/0/SD_ILS:249437
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Bernstein, Lawrence, 1940- Yuhas, C. M. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerated stress testing handbook guide for achieving quality products
ent://SD_ILS/0/SD_ILS:249645
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Chan, H. Anthony, 1952- Englert, Paul J, 1960-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The design analysis handbook a practical guide to design validation
ent://SD_ILS/0/SD_ILS:254797
2024-11-22T15:04:49Z
2024-11-22T15:04:49Z
Yazar Walker, N. Edward.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>