Arama Sonuçları Reliability. - Daraltılmış: Microelectronics.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509Microelectronics.$002509Microelectronics.$0026ps$003d300?2025-02-16T18:34:22ZReliability Engineering Theory and Practiceent://SD_ILS/0/SD_ILS:4894102025-02-16T18:34:22Z2025-02-16T18:34:22ZYazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro- and opto-electronic materials and structures : physics, mechanics, design, reliability, packagingent://SD_ILS/0/SD_ILS:1104482025-02-16T18:34:22Z2025-02-16T18:34:22ZYazar Suhir, Ephraim. Lee, Y. C. Wong, C. P.<br/>Yer Numarası TK7874 .M438 2007 V.1<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodesent://SD_ILS/0/SD_ILS:4886422025-02-16T18:34:22Z2025-02-16T18:34:22ZYazar Balasinski, Artur. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronics to nanoelectronics materials, devices & manufacturabilityent://SD_ILS/0/SD_ILS:2890282025-02-16T18:34:22Z2025-02-16T18:34:22ZYazar Kaul, Anupama B.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466509559">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>