Arama Sonuçları Reliability. - Daraltılmış: Statistics.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509Statistics.$002509Statistics.$0026ps$003d300?dt=list2024-11-28T21:05:00ZBayesian Reliabilityent://SD_ILS/0/SD_ILS:1675422024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Hamada, Michael S. author. Wilson, Alyson G. author. Reese, C. Shane. author. Martz, Harry F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System Software Reliabilityent://SD_ILS/0/SD_ILS:1753672024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Pham, Hoang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Optimal Maintenanceent://SD_ILS/0/SD_ILS:1753802024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantile-Based Reliability Analysisent://SD_ILS/0/SD_ILS:3305562024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330556.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Ageing and Dependence for Reliabilityent://SD_ILS/0/SD_ILS:1660172024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Failure Rate Modelling for Reliability and Riskent://SD_ILS/0/SD_ILS:1758682024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Shock and Damage Models in Reliability Theoryent://SD_ILS/0/SD_ILS:1754202024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Point Processes for Reliability Analysis Shocks and Repairable Systemsent://SD_ILS/0/SD_ILS:4023922024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latviaent://SD_ILS/0/SD_ILS:4023952024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shakedent://SD_ILS/0/SD_ILS:3321492024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Li, Haijun. editor. Li, Xiaohu. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332149.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optimal Stochastic Control Schemes within a Structural Reliability Frameworkent://SD_ILS/0/SD_ILS:3328642024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Leira, Bernt J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332864.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-01405-0">http://dx.doi.org/10.1007/978-3-319-01405-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Softwareent://SD_ILS/0/SD_ILS:2373542024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Walker, I. R..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networksent://SD_ILS/0/SD_ILS:1682922024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Skiadas, Christos H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Financeent://SD_ILS/0/SD_ILS:1683212024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Controlent://SD_ILS/0/SD_ILS:1683332024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysisent://SD_ILS/0/SD_ILS:1670302024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientistsent://SD_ILS/0/SD_ILS:1664112024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Saunders, Sam C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Ranking and Selection, Multiple Comparisons, and Reliability Methodology and Applicationsent://SD_ILS/0/SD_ILS:1681182024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Balakrishnan, N. editor. Nagaraja, H. N. editor. Kannan, N. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138793">http://dx.doi.org/10.1007/b138793</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical problem solvingent://SD_ILS/0/SD_ILS:558052024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Carr, Wendell E., 1940-<br/>Yer Numarası TS156 .C364 1992<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~1<br/>Manuale di microbiologia predittiva Concetti e strumenti per l’ecologia microbica quantitativaent://SD_ILS/0/SD_ILS:3356302024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Gardini, Fausto. editor. Parente, Eugenio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335630.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-88-470-5355-7">http://dx.doi.org/10.1007/978-88-470-5355-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Ship and Offshore Structure Design in Climate Change Perspectiveent://SD_ILS/0/SD_ILS:3338052024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Bitner-Gregersen, Elzbieta Maria. author. Eide, Lars Ingolf. author. Hørte, Torfinn. author. Skjong, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333805.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-34138-0">http://dx.doi.org/10.1007/978-3-642-34138-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical Techniques for High-Voltage Engineeringent://SD_ILS/0/SD_ILS:2478812024-11-28T21:05:00Z2024-11-28T21:05:00ZYazar Hauschild, W. Mosch, W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBPO013E">http://dx.doi.org/10.1049/PBPO013E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>