Arama Sonuçları Reliability. - Daraltılmış: Surfaces (Physics).SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ps$003d300?2026-02-18T06:54:38ZSilver Metallization Stability and Reliabilityent://SD_ILS/0/SD_ILS:1756772026-02-18T06:54:38Z2026-02-18T06:54:38ZYazar Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Materials and Reliability Handbook for Semiconductor Optical and Electron Devicesent://SD_ILS/0/SD_ILS:3314782026-02-18T06:54:38Z2026-02-18T06:54:38ZYazar Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331478.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:1659002026-02-18T06:54:38Z2026-02-18T06:54:38ZYazar Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluationent://SD_ILS/0/SD_ILS:3308432026-02-18T06:54:38Z2026-02-18T06:54:38ZYazar Sabbagh, Harold A. author. Murphy, R. Kim. author. Sabbagh, Elias H. author. Aldrin, John C. author. Knopp, Jeremy S. author.<br/>Yer Numarası ONLINE(330843.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8429-6">http://dx.doi.org/10.1007/978-1-4419-8429-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Technical Diagnostics Fundamentals and Application to Structures and Systemsent://SD_ILS/0/SD_ILS:3331412026-02-18T06:54:38Z2026-02-18T06:54:38ZYazar Czichos, Horst. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333141.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-25850-3">http://dx.doi.org/10.1007/978-3-642-25850-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evaluating Measurement Accuracy A Practical Approachent://SD_ILS/0/SD_ILS:3320972026-02-18T06:54:38Z2026-02-18T06:54:38ZYazar Rabinovich, Semyon G. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332097.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-6717-5">http://dx.doi.org/10.1007/978-1-4614-6717-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>