Arama Sonu&ccedil;lar&#305; Reliability. - Daralt&#305;lm&#305;&#351;: System safety. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026qf$003dSUBJECT$002509Konu$002509System$002bsafety.$002509System$002bsafety.$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-25T14:34:14Z Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> System Software Reliability ent://SD_ILS/0/SD_ILS:175367 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-295-0">http://dx.doi.org/10.1007/1-84628-295-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Yer 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Luz. author.&#160;Kulasekera, K. 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S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solder Joint Technology Materials, Properties, and Reliability ent://SD_ILS/0/SD_ILS:166252 2024-11-25T14:34:14Z 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Yazar&#160;Ko&#322;owrocki, Krzysztof. author.&#160;Soszy&#324;ska-Budny, Joanna. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Simulation Methods for Reliability and Availability of Complex Systems ent://SD_ILS/0/SD_ILS:175923 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Faulin, Javier. editor.&#160;Juan, Angel A. editor.&#160;Martorell, Sebasti&aacute;n. editor.&#160;Ram&iacute;rez-M&aacute;rquez, Jos&eacute;-Emmanuel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i 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C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software safety and reliability : techniques, approaches, and standards of key industrial sectors ent://SD_ILS/0/SD_ILS:113008 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Herrmann, Debra S.<br/>Yer Numaras&#305;&#160;QA76.76.R44 H39 1999<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Risk-Based Engineering An Integrated Approach to Complex Systems&mdash;Special Reference to Nuclear Plants ent://SD_ILS/0/SD_ILS:400726 2024-11-25T14:34:14Z 2024-11-25T14:34:14Z Yazar&#160;Varde, Prabhakar V. author.&#160;Pecht, Michael G. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a 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