Arama Sonu&ccedil;lar&#305; Reliability. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue? 2024-12-12T02:43:38Z Reliability ent://SD_ILS/0/SD_ILS:233427 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Meyer, J. Patrick.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability engineering ent://SD_ILS/0/SD_ILS:341870 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Kapur, Kailash C., 1941- author.&#160;Pecht, Michael, author.<br/>Yer Numaras&#305;&#160;ONLINE(341870.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118841716">http://dx.doi.org/10.1002/9781118841716</a> MyiLibrary <a href="http://www.myilibrary.com?id=595055">http://www.myilibrary.com?id=595055</a> Image <a href="http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg">http://images.contentreserve.com/ImageType-100/0128-1/{879AE24E-0D4B-4A31-AF41-37FA562C2FA3}Img100.jpg</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability ent://SD_ILS/0/SD_ILS:364907 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tobias, Paul A.&#160;Trindade, David C.<br/>Yer Numaras&#305;&#160;TA169 T63 2012<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> MEMS Reliability ent://SD_ILS/0/SD_ILS:172486 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Hartzell, Allyson L. author.&#160;da Silva, Mark G. author.&#160;Shea, Herbert R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6018-4">http://dx.doi.org/10.1007/978-1-4419-6018-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. Shane. author.&#160;Martz, Harry F. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77950-8">http://dx.doi.org/10.1007/978-0-387-77950-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability fundamentals ent://SD_ILS/0/SD_ILS:255215 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;C&#259;tuneanu, Vasile M.&#160;Mihalache, Adrian.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444988799">http://www.sciencedirect.com/science/book/9780444988799</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:289793 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Neufelder, Ann Marie, 1960-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. 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A. (Igor&#697; Alekseevich)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118370766">Available by subscription from Safari Books Online</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118370742">http://dx.doi.org/10.1002/9781118370742</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49723">http://www.books24x7.com/marc.asp?bookid=49723</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical reliability engineering ent://SD_ILS/0/SD_ILS:295099 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Pavlov, I. V.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Chakravarty, Sumantra.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer systems reliability. ent://SD_ILS/0/SD_ILS:58893 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yer Numaras&#305;&#160;TK 7885 C65 1974 V.20<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintenance Theory of Reliability ent://SD_ILS/0/SD_ILS:175323 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety Engineering ent://SD_ILS/0/SD_ILS:176193 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Verma, Ajit Kumar. author.&#160;Srividya, Ajit. author.&#160;Karanki, Durga Rao. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> IEEE Transactions on reliability. ent://SD_ILS/0/SD_ILS:226884 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yer Numaras&#305;&#160;ALFABET&#304;K V.12 1963<br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~30&#160;~0<br/> Engineering design reliability handbook ent://SD_ILS/0/SD_ILS:287313 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of large systems ent://SD_ILS/0/SD_ILS:254513 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ko&#322;owrocki, Krzysztof.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power-system reliability calculations ent://SD_ILS/0/SD_ILS:220175 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Billinton, Roy.&#160;Ringlee, Robert J., joint author.&#160;Wood, Allen J., joint author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability theory and practice ent://SD_ILS/0/SD_ILS:47596 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bazovsky, Igor.<br/>Yer Numaras&#305;&#160;TA 168 B33 1961<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Stochastic Models in Reliability ent://SD_ILS/0/SD_ILS:332363 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Aven, Terje. author.&#160;Jensen, Uwe. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332363.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Network Reliability and Resilience ent://SD_ILS/0/SD_ILS:195005 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and validity assessment ent://SD_ILS/0/SD_ILS:7092 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Carmines, Edward G.<br/>Yer Numaras&#305;&#160;H 61 C26 1979<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Mathematical theory of reliability ent://SD_ILS/0/SD_ILS:35404 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Barlow, Richard E.&#160;Proschan Frank. , ort. yaz.<br/>Yer Numaras&#305;&#160;QA 273 B3 1965<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:291660 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;El-Reedy, Mohamed Abdallah.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. 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(King-Ning), 1937-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electric power distribution reliability ent://SD_ILS/0/SD_ILS:285664 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Brown, Richard E., 1969-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. 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(Gary)&#160;Solin, J.&#160;European Structural Integrity Society.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to reliability engineering ent://SD_ILS/0/SD_ILS:47611 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Lewis, Elmer Eugene, 1938-<br/>Yer Numaras&#305;&#160;TA 169 L47 1987<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Innovations in Power Systems Reliability ent://SD_ILS/0/SD_ILS:168417 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Anders, George. editor.&#160;Vaccaro, Alfredo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-088-5">http://dx.doi.org/10.1007/978-0-85729-088-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Nonparametric Statistics in Reliability ent://SD_ILS/0/SD_ILS:168426 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;G&aacute;miz, M. Luz. author.&#160;Kulasekera, K. B. author.&#160;Limnios, Nikolaos. author.&#160;Lindqvist, Bo Henry. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-118-9">http://dx.doi.org/10.1007/978-0-85729-118-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Reliability Assessment with OR Applications ent://SD_ILS/0/SD_ILS:168454 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Kapur, P.K. author.&#160;Pham, Hoang. author.&#160;Gupta, A. author.&#160;Jha, P.C. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-204-9">http://dx.doi.org/10.1007/978-0-85729-204-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fatigue and Fracture Reliability Engineering ent://SD_ILS/0/SD_ILS:168458 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Xiong, J.J. author.&#160;Shenoi, R.A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-218-6">http://dx.doi.org/10.1007/978-0-85729-218-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product Reliability Specification and Performance ent://SD_ILS/0/SD_ILS:175790 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Murthy, Dodderi Narshima Prabhakar. author.&#160;Rausand, Marvin. author.&#160;&Oslash;ster&aring;s, Trond. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-271-5">http://dx.doi.org/10.1007/978-1-84800-271-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Reliability Models and Maintenance Policies ent://SD_ILS/0/SD_ILS:175800 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-294-4">http://dx.doi.org/10.1007/978-1-84800-294-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mining Equipment Reliability, Maintainability, and Safety ent://SD_ILS/0/SD_ILS:144346 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, Balbir S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=247859</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability strategies and implementation ent://SD_ILS/0/SD_ILS:295695 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Levin, Mark, 1959-&#160;Kalal, Ted T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a> <a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a> John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Aspect of Cloud Computing Environment ent://SD_ILS/0/SD_ILS:399144 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Kumar, Vikas. author.&#160;Vidhyalakshmi, R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-13-3023-0">https://doi.org/10.1007/978-981-13-3023-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> In-Service Fatigue Reliability of Structures ent://SD_ILS/0/SD_ILS:401041 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Petinov, Sergei V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-89318-1">https://doi.org/10.1007/978-3-319-89318-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Power Devices Physics, Characteristics, Reliability ent://SD_ILS/0/SD_ILS:401906 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Lutz, Josef. author.&#160;Schlangenotto, Heinrich. author.&#160;Scheuermann, Uwe. author.&#160;De Doncker, Rik. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-70917-8">https://doi.org/10.1007/978-3-319-70917-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of large and complex systems ent://SD_ILS/0/SD_ILS:355886 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ko&#322;owrocki, Krzysztof, author.<br/>Yer Numaras&#305;&#160;ONLINE(355886.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080999494">http://www.sciencedirect.com/science/book/9780080999494</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ternary Networks Reliability and Monte Carlo ent://SD_ILS/0/SD_ILS:485508 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Gertsbakh, Ilya. author.&#160;Shpungin, Yoseph. author.&#160;Vaisman, Radislav. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-06440-6">https://doi.org/10.1007/978-3-319-06440-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:489410 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electricity infrastructure reliability and vulnerabilities ent://SD_ILS/0/SD_ILS:281073 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Guerritore, Walter B.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564180</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer system reliability safety and usability ent://SD_ILS/0/SD_ILS:285390 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781466573130">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability models for engineers and scientists ent://SD_ILS/0/SD_ILS:290030 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Kaminskiy, Mark, 1946-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781466565937">Distributed by publisher. 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S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439846414">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Measures of interobserver agreement and reliability ent://SD_ILS/0/SD_ILS:291539 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Shoukri, M. M. (Mohamed M.)&#160;Shoukri, M. M. (Mohamed M.). Measures of interobserver agreement.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439810811">Distributed by publisher. 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A. (Tom A.), 1966-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420036480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintainability, maintenance, and reliability for engineers ent://SD_ILS/0/SD_ILS:285711 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420006780">Distributed by publisher. 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L. van.<br/>Yer Numaras&#305;&#160;QA76.5 K53 2006<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:287285 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:119553 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S.<br/>Yer Numaras&#305;&#160;TS173 .D45 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Case studies in reliability and maintenance ent://SD_ILS/0/SD_ILS:300226 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality and reliability in analytical chemistry ent://SD_ILS/0/SD_ILS:285938 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Aboul-Enein, Hassan Y.&#160;Stefan, Raluca-Ioana.&#160;Baiulescu, George.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420038576">Distributed by publisher. 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P.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:285959 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ceramics processing, reliability, tribology and wear. ent://SD_ILS/0/SD_ILS:300592 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;M&uuml;ller, G.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability fundamentals and applications ent://SD_ILS/0/SD_ILS:284992 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modelling : A statistical approach ent://SD_ILS/0/SD_ILS:78139 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Wolstenholme, Linda C.<br/>Yer Numaras&#305;&#160;TA 169 W65 1999<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Statistical methods for reliability data ent://SD_ILS/0/SD_ILS:85080 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Meeker, William Q.&#160;Escobar, Luis A., ort. yaz.<br/>Yer Numaras&#305;&#160;TS 173 M44 1998<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Semiconductor memories technology, testing, and reliability ent://SD_ILS/0/SD_ILS:249739 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Sharma, Ashok K.&#160;IEEE Solid-State Circuits Council.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:254325 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dummer, G. W. A. (Geoffrey William Arnold)&#160;Tooley, Michael H.&#160;Winton, R. C.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probability, statistics, reliability for engineers ent://SD_ILS/0/SD_ILS:75189 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ayyub, Bilal M.&#160;McCuen, Richard H., 1941-<br/>Yer Numaras&#305;&#160;TA 330 A99 1997<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> New trends in system reliability evaluation ent://SD_ILS/0/SD_ILS:255243 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Misra, Krishna B., 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> An elementary guide to reliability ent://SD_ILS/0/SD_ILS:48244 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dummer, Geoffrey William Arnold.&#160;Winton, R. C., ort. yaz.<br/>Yer Numaras&#305;&#160;TS 173 D85 1990<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> A Primer of reliability theory ent://SD_ILS/0/SD_ILS:47610 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Grosh, Doris Lloyd.<br/>Yer Numaras&#305;&#160;TA 169 G76 1989<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Software engineering : design, reliability and management ent://SD_ILS/0/SD_ILS:32561 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Shooman, Martin L.<br/>Yer Numaras&#305;&#160;QA 76.9.S88 S56 1983<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability in the acquisitions process ent://SD_ILS/0/SD_ILS:47612 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;DePriest, D. J., ed. by&#160;Launer, R. L., ed. by<br/>Yer Numaras&#305;&#160;TA 169 R44 1983<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Life testing and reliability estimation ent://SD_ILS/0/SD_ILS:35481 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Sinha, S. K.&#160;Kale, B. K., ort. yaz.<br/>Yer Numaras&#305;&#160;QA 273 S64 1980<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Durability and reliability in engineering desing ent://SD_ILS/0/SD_ILS:48245 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Kivenson, Gilbert.<br/>Yer Numaras&#305;&#160;TS 173 K57 1971<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Mathematical methods of reliability theory ent://SD_ILS/0/SD_ILS:47645 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Gnedenko, Boris Vladimirovich, 1912-&#160;Belyayev, Yu. K., ort. yaz.&#160;Solovyev, A. D., ort. yaz.<br/>Yer Numaras&#305;&#160;TA 340 G5513 1969<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> Stochastic Processes with Applications to Reliability Theory ent://SD_ILS/0/SD_ILS:168475 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human Reliability and Error in Transportation Systems ent://SD_ILS/0/SD_ILS:175578 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability and error in transportation systems ent://SD_ILS/0/SD_ILS:271334 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S.<br/>Yer Numaras&#305;&#160;TA1145 D45 2007<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Shock and Damage Models in Reliability Theory ent://SD_ILS/0/SD_ILS:175420 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Nakagawa, Toshio. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> IEEE Transactions on device and materials reliability. ent://SD_ILS/0/SD_ILS:226837 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yer Numaras&#305;&#160;ALFABET&#304;K V.3 2003<br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1&#160;~0<br/> Advances in safety, reliability and risk management ent://SD_ILS/0/SD_ILS:342790 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;European Safety and Reliability Conference (2011 : Troyes, France)&#160;Berenguer, Christophe.&#160;Grall, Antoine.&#160;Soares, C. Guedes.<br/>Yer Numaras&#305;&#160;ONLINE(342790.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, reliability and risks associated with water, oil and gas pipelines : [proceedings of the NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines, Alexandria, Egypt, 4-8 February 2007] ent://SD_ILS/0/SD_ILS:113617 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;NATO Advanced Research Workshop on Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines (2007 : Alexandria, Egypt)&#160;Elwany, Mohamed Hamdy.&#160;Pluvinage, Guy.<br/>Yer Numaras&#305;&#160;TJ930 .N386 2008<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Safety-Critical Electrical Drives Topologies, Reliability, Performance ent://SD_ILS/0/SD_ILS:401112 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bolvashenkov, Igor. author.&#160;Herzog, Hans-Georg. author.&#160;Frenkel, Ilia. author.&#160;Khvatskin, Lev. author.&#160;Lisnianski, Anatoly. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-89969-5">https://doi.org/10.1007/978-3-319-89969-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solid State Lighting Reliability Components to Systems ent://SD_ILS/0/SD_ILS:331314 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;van Driel, W.D. editor.&#160;Fan, X.J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331314.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3067-4">http://dx.doi.org/10.1007/978-1-4614-3067-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Telecommunications system reliability engineering, theory, and practice ent://SD_ILS/0/SD_ILS:249397 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ayers, Mark L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331044</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Compressors how to achieve high reliability &amp; availability ent://SD_ILS/0/SD_ILS:293579 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bloch, Heinz P., 1933-&#160;Geitner, Fred K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/compressors-how-to-achieve-high-reliability-availability">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Process plant equipment operation, control, and reliability ent://SD_ILS/0/SD_ILS:299085 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Holloway, Michael D., 1963-&#160;Nwaoha, Chikezie, 1984-&#160;Onyewuenyi, Oliver A., 1952-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118162569">http://onlinelibrary.wiley.com/book/10.1002/9781118162569</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=822072</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118162569">http://dx.doi.org/10.1002/9781118162569</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Offshore Wind Turbines Reliability, availability and maintenance ent://SD_ILS/0/SD_ILS:247956 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tavner, Peter<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBRN013E">http://dx.doi.org/10.1049/PBRN013E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Lead-free solders materials reliability for electronics ent://SD_ILS/0/SD_ILS:305591 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Subramaniam, K. N., Ph. D.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability centered maintenance (RCM) implementation made simple ent://SD_ILS/0/SD_ILS:293571 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bloom, Neil.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolution ent://SD_ILS/0/SD_ILS:191769 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Levi, Paul. author.&#160;Kernbach, Serge. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability wearout mechanisms in advanced CMOS technologies ent://SD_ILS/0/SD_ILS:249574 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Strong, Alvin Wayne, 1946-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> VoIP handbook applications, technologies, reliability, and security ent://SD_ILS/0/SD_ILS:289675 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ahson, Syed.&#160;Ilyas, Mohammad, 1953-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> New Computational Methods in Power System Reliability ent://SD_ILS/0/SD_ILS:187983 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Elmakias, David. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77812-7">http://dx.doi.org/10.1007/978-3-540-77812-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:306517 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Rules of thumb for maintenance and reliability engineers ent://SD_ILS/0/SD_ILS:149151 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Smith, Ricky.&#160;Mobley, R. Keith, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality and Reliability of Large-Eddy Simulations ent://SD_ILS/0/SD_ILS:170230 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Meyers, Johan. editor.&#160;Geurts, Bernard J. editor.&#160;Sagaut, Pierre. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8578-9">http://dx.doi.org/10.1007/978-1-4020-8578-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solder Joint Technology Materials, Properties, and Reliability ent://SD_ILS/0/SD_ILS:166252 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tu, King-Ning. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and risk models setting reliability requirements ent://SD_ILS/0/SD_ILS:295900 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Todinov, M. T.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and risk models : setting reliability requirements ent://SD_ILS/0/SD_ILS:119481 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Todinov, M. T.<br/>Yer Numaras&#305;&#160;TA169 .T65 2005<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Managing risk and reliability of process plants ent://SD_ILS/0/SD_ILS:254721 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tweeddale, Mark.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750677349">http://www.sciencedirect.com/science/book/9780750677349</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability of electronic equipment and products ent://SD_ILS/0/SD_ILS:288362 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Hnatek, Eugene R.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203909089">Distributed by publisher. 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S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Monte Carlo Simulation Method for System Reliability and Risk Analysis ent://SD_ILS/0/SD_ILS:331017 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Zio, Enrico. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331017.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Design ent://SD_ILS/0/SD_ILS:331097 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tinga, T. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331097.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthday ent://SD_ILS/0/SD_ILS:331109 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dohi, Tadashi. editor.&#160;Nakagawa, Toshio. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331109.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populations ent://SD_ILS/0/SD_ILS:331121 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Finkelstein, Maxim. author.&#160;Cha, Ji Hwan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331121.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inference ent://SD_ILS/0/SD_ILS:173390 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Lisnianski, Anatoly. editor.&#160;Frenkel, Ilia. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability technology principles and practice of failure prevention in electronic systems ent://SD_ILS/0/SD_ILS:298817 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Pascoe, Norman.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections ent://SD_ILS/0/SD_ILS:168486 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tan, Cher Ming. author.&#160;Li, Wei. author.&#160;Gan, Zhenghao. author.&#160;Hou, Yuejin. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Safety of Complex Technical Systems and Processes Modeling &ndash; Identification &ndash; Prediction - Optimization ent://SD_ILS/0/SD_ILS:168571 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ko&#322;owrocki, Krzysztof. author.&#160;Soszy&#324;ska-Budny, Joanna. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Complex System Reliability Multichannel Systems with Imperfect Fault Coverage ent://SD_ILS/0/SD_ILS:176244 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Myers, Albert. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Simulation Methods for Reliability and Availability of Complex Systems ent://SD_ILS/0/SD_ILS:175923 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Faulin, Javier. editor.&#160;Juan, Angel A. editor.&#160;Martorell, Sebasti&aacute;n. editor.&#160;Ram&iacute;rez-M&aacute;rquez, Jos&eacute;-Emmanuel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Recent Advances in Reliability and Quality in Design ent://SD_ILS/0/SD_ILS:175716 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Reliability and Quality Fundamentals, Methods and Procedures ent://SD_ILS/0/SD_ILS:175443 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Universal Generating Function in Reliability Analysis and Optimization ent://SD_ILS/0/SD_ILS:175337 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Levitin, Gregory. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fracture mechanics. 1, Analysis of reliability and quality control ent://SD_ILS/0/SD_ILS:305424 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Grous, Ammar, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Security and Reliability of Damaged Structures and Defective Materials ent://SD_ILS/0/SD_ILS:204889 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Pluvinage, Guy. editor.&#160;Sedmak, Aleksandar. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems ent://SD_ILS/0/SD_ILS:175839 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Seong, Poong Hyun. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines ent://SD_ILS/0/SD_ILS:169842 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Pluvinage, Guy. editor.&#160;Elwany, Mohamed Hamdy. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for improving plant reliability through data collection and analysis ent://SD_ILS/0/SD_ILS:300022 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;American Institute of Chemical Engineers. Center for Chemical Process Safety.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The theory and applications of reliability with emphasis on Bayesian and nonparametric methods ent://SD_ILS/0/SD_ILS:256115 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)&#160;Tsokos, Chris P.&#160;Shimi, I. N.&#160;United States. Air Force. 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Y., editor of compilation.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and optimization of structural systems proceedings of Reliability and Optimization of Structural Systems, Tum, M&iquest;nchen, Germany, 7-10 April 2010 ent://SD_ILS/0/SD_ILS:289242 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Reliability and Optimization of Structural Systems (2010 : Tum, M&iquest;nchen, Germany)&#160;Straub, D.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203841419">Distributed by publisher. 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SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521137 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Schoitsch, Erwin. editor.&#160;Roy, Matthieu. editor.&#160;Bitsch, Friedemann. editor.<br/>Yer Numaras&#305;&#160;XX(521137.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521134 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Tonetta, Stefano. editor.&#160;Bitsch, Friedemann. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(521134.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedings ent://SD_ILS/0/SD_ILS:521180 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Milius, Birgit. editor.&#160;Collart-Dutilleul, Simon. editor.&#160;Lecomte, Thierry. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(521180.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11&ndash;13, 2019, Proceedings ent://SD_ILS/0/SD_ILS:483736 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;Troubitsyna, Elena. editor.&#160;Bitsch, Friedemann. editor. 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W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthday ent://SD_ILS/0/SD_ILS:486029 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Li, Quan-Lin. editor.&#160;Wang, Jinting. editor.&#160;Yu, Hai-Bo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat&rsquo;18, 17-20 October 2018, Riga, Latvia ent://SD_ILS/0/SD_ILS:486996 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Kabashkin, Igor. editor.&#160;Yatskiv (Jackiva), Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedings ent://SD_ILS/0/SD_ILS:484867 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Romanovsky, Alexander. editor. 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(orcid)0000-0001-6152-4121<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering ent://SD_ILS/0/SD_ILS:485213 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ali, Syed Riffat. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USA ent://SD_ILS/0/SD_ILS:485921 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Boring, Ronald L. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4&ndash;6, 2019, Proceedings ent://SD_ILS/0/SD_ILS:486274 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Collart-Dutilleul, Simon. editor.&#160;Lecomte, Thierry. editor.&#160;Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3&ndash;4, 2018, Proceedings ent://SD_ILS/0/SD_ILS:486900 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Duong, Trung Q. editor.&#160;Vo, Nguyen-Son. editor.&#160;Phan, Van Ca. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliability ent://SD_ILS/0/SD_ILS:400290 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Jahanshahi, Mohsen. author.&#160;Bistouni, Fathollah. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, V&auml;ster&aring;s, Sweden, September 19-21, 2018, Proceedings ent://SD_ILS/0/SD_ILS:400344 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Gallina, Barbara. editor. (orcid)0000-0002-6952-1053&#160;Skavhaug, Amund. editor.&#160;Bitsch, Friedemann. editor. 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(orcid)0000-0002-8818-6983&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Solid State Lighting Reliability Part 2 Components to Systems ent://SD_ILS/0/SD_ILS:401528 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;van Driel, Willem Dirk. editor.&#160;Fan, Xuejun. editor.&#160;Zhang, Guo Qi. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17&ndash;21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USA ent://SD_ILS/0/SD_ILS:401830 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Boring, Ronald Laurids. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat&rsquo;17, 18-21 October, 2017, Riga, Latvia ent://SD_ILS/0/SD_ILS:402395 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Kabashkin, Igor. editor.&#160;Yatskiv, Irina. editor.&#160;Prentkovskis, Olegas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliability ent://SD_ILS/0/SD_ILS:460117 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Suganuma, Katsuaki, editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, V&auml;ster&aring;s, Sweden, September 18, 2018, Proceedings ent://SD_ILS/0/SD_ILS:399783 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Gallina, Barbara. editor. 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(orcid)0000-0001-6152-4121&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Konstr&uuml;ksiyon elemanlar&#305;nda g&uuml;venirlik (reliability) ve &ouml;m&uuml;r hesaplar&#305; ; teorik a&ccedil;&#305;klamalar ve uygulamalar ent://SD_ILS/0/SD_ILS:389257 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tahral&#305;, Necati&#160;Atik, Enver, author&#160;&Ccedil;ivi, Cem, author<br/>Yer Numaras&#305;&#160;TJ230 T34 2017<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Semi-Markov processes : applications in system reliability and maintenance ent://SD_ILS/0/SD_ILS:355517 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Grabski, Franciszek, author.<br/>Yer Numaras&#305;&#160;ONLINE(355517.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Chemical and biochemical technology : materials, processing, and reliability ent://SD_ILS/0/SD_ILS:356545 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Varfolomeev, Serge&iquest;&#784;&#432;i Dmitrievich, editor.<br/>Yer Numaras&#305;&#160;ONLINE(356545.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781482257625">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:482801 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bondavalli, Andrea. editor.&#160;Di Giandomenico, Felicita. editor. (orcid)0000-0002-8760-7299&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-10506-2">https://doi.org/10.1007/978-3-319-10506-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2014 Workshops: ASCoMS, DECSoS, DEVVARTS, ISSE, ReSA4CI, SASSUR. Florence, Italy, September 8-9, 2014, Proceedings ent://SD_ILS/0/SD_ILS:485676 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bondavalli, Andrea. editor.&#160;Ceccarelli, Andrea. editor.&#160;Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Flash Memories Economic Principles of Performance, Cost and Reliability Optimization ent://SD_ILS/0/SD_ILS:488848 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Richter, Detlev. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedings ent://SD_ILS/0/SD_ILS:489055 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Teufel, Stephanie. editor.&#160;A Min, Tjoa. editor.&#160;You, Illsun. editor.&#160;Weippl, Edgar. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications ent://SD_ILS/0/SD_ILS:489246 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Franco, Jacopo. author.&#160;Kaczer, Ben. author.&#160;Groeseneken, Guido. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Orders in Reliability and Risk In Honor of Professor Moshe Shaked ent://SD_ILS/0/SD_ILS:332149 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Li, Haijun. editor.&#160;Li, Xiaohu. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332149.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6892-9">http://dx.doi.org/10.1007/978-1-4614-6892-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 9th International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papers ent://SD_ILS/0/SD_ILS:334505 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Singh, Karan. editor.&#160;Awasthi, Amit K. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334505.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Yer Numaras&#305;&#160;ONLINE(365001.1)<br/>Elektronik Eri&#351;im&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Rail human factors supporting reliability, safety and cost reduction ent://SD_ILS/0/SD_ILS:291107 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dadashi, Nastaran.&#160;Scott, Anita.&#160;Wilson, John R.&#160;Mills, Ann.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203759721">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:334958 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Cuzzocrea, Alfredo. editor.&#160;Kittl, Christian. editor.&#160;Simos, Dimitris E. editor.&#160;Weippl, Edgar. editor.&#160;Xu, Lida. editor.<br/>Yer Numaras&#305;&#160;ONLINE(334958.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedings ent://SD_ILS/0/SD_ILS:335005 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bitsch, Friedemann. editor.&#160;Guiochet, J&eacute;r&eacute;mie. editor.&#160;Ka&acirc;niche, Mohamed. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335005.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Risk Evaluation of Wind Integrated Power Systems ent://SD_ILS/0/SD_ILS:335484 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Billinton, Roy. editor.&#160;Karki, Rajesh. editor.&#160;Verma, Ajit Kumar. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335484.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-81-322-0987-4">http://dx.doi.org/10.1007/978-81-322-0987-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Early Software Reliability Prediction A Fuzzy Logic Approach ent://SD_ILS/0/SD_ILS:335512 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Pandey, Ajeet Kumar. author.&#160;Goyal, Neeraj Kumar. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335512.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-81-322-1176-1">http://dx.doi.org/10.1007/978-81-322-1176-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices. ent://SD_ILS/0/SD_ILS:305286 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Epperlein, Peter W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applications ent://SD_ILS/0/SD_ILS:306566 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Wu, Bin, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ent://SD_ILS/0/SD_ILS:331478 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ueda, Osamu. editor.&#160;Pearton, Stephen J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331478.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332682.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Gas and oil reliability engineering modeling and analysis ent://SD_ILS/0/SD_ILS:145907 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Calixto, Eduardo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papers ent://SD_ILS/0/SD_ILS:196648 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Zhang, Xi. editor.&#160;Qiao, Daji. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security SAFECOMP 2012 Workshops: Sassur, ASCoMS, DESEC4LCCI, ERCIM/EWICS, IWDE, Magdeburg, Germany, September 25-28, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197419 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33675-1">http://dx.doi.org/10.1007/978-3-642-33675-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 31st International Conference, SAFECOMP 2012, Magdeburg, Germany, September 25-28, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197420 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ortmeier, Frank. editor.&#160;Daniel, Peter. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33678-2">http://dx.doi.org/10.1007/978-3-642-33678-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Non-Destructive Assessment of Concrete Structures: Reliability and Limits of Single and Combined Techniques State-of-the-Art Report of the RILEM Technical Committee 207-INR ent://SD_ILS/0/SD_ILS:206444 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Breysse, Denys. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-2736-6">http://dx.doi.org/10.1007/978-94-007-2736-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Network Reliability in Practice Selected Papers from the Fourth International Symposium on Transportation Network Reliability ent://SD_ILS/0/SD_ILS:173816 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Levinson, David M. editor.&#160;Liu, Henry X. editor.&#160;Bell, Michael. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0947-2">http://dx.doi.org/10.1007/978-1-4614-0947-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Pattern recognition for reliability assessment of water distribution networks ent://SD_ILS/0/SD_ILS:285385 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Trifunovi?, Nemanja.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781466558021">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:197227 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Quirchmayr, Gerald. editor.&#160;Basl, Josef. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;Weippl, Edgar. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32498-7">http://dx.doi.org/10.1007/978-3-642-32498-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electric utility resource planning economics, reliability, and decision-making ent://SD_ILS/0/SD_ILS:290780 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Sim, Steven.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439884096">Distributed by publisher. 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(Sheng), 1963-&#160;Liu, Yong, 1962-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470827826">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability in Scientific Research Improving the Dependability of Measurements, Calculations, Equipment, and Software ent://SD_ILS/0/SD_ILS:237354 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Walker, I. R..<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1017/CBO9780511780608">Access by subscription</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Availability, Reliability and Security for Business, Enterprise and Health Information Systems IFIP WG 8.4/8.9 International Cross Domain Conference and Workshop, ARES 2011, Vienna, Austria, August 22-26, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195302 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Tjoa, A Min. editor.&#160;Quirchmayr, Gerald. editor.&#160;You, Ilsun. editor.&#160;Xu, Lida. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-23300-5">http://dx.doi.org/10.1007/978-3-642-23300-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 30th International Conference,SAFECOMP 2011, Naples, Italy, September 19-22, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195586 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Flammini, Francesco. editor.&#160;Bologna, Sandro. editor.&#160;Vittorini, Valeria. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-24270-0">http://dx.doi.org/10.1007/978-3-642-24270-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Assessment of Power System Reliability Methods and Applications ent://SD_ILS/0/SD_ILS:168569 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;&#268;epin, Marko. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-688-7">http://dx.doi.org/10.1007/978-0-85729-688-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, maintainability, and risk : practical methods for engineers ent://SD_ILS/0/SD_ILS:459422 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Smith, David J. (David John), 1943 June 22-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Spacecraft reliability and multi-state failures a statistical approach ent://SD_ILS/0/SD_ILS:305721 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Saleh, Joseph H., 1971-&#160;Castet, Jean-Fran&ccedil;ois.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probability, statistics, and reliability for engineers and scientists ent://SD_ILS/0/SD_ILS:312915 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Ayyub, Bilal M., author.&#160;McCuen, Richard H., 1941-<br/>Yer Numaras&#305;&#160;ONLINE(312915.1)<br/>Elektronik Eri&#351;im&#160;Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Adhesives technology for electronic applications materials, processing, reliability ent://SD_ILS/0/SD_ILS:146014 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Licari, James J., 1930-&#160;Swanson, Dale W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778892">http://www.sciencedirect.com/science/book/9781437778892</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Maintainability and Risk Practical Methods for Engineers including Reliability Centred Maintenance and Safety-Related Systems. ent://SD_ILS/0/SD_ILS:149176 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Smith, David J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures ent://SD_ILS/0/SD_ILS:172530 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Stanisavljevi&#263;, Milo&scaron;. author.&#160;Schmid, Alexandre. author.&#160;Leblebici, Yusuf. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedings ent://SD_ILS/0/SD_ILS:193040 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Schoitsch, Erwin. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Calculation of Roundabouts Capacity, Waiting Phenomena and Reliability ent://SD_ILS/0/SD_ILS:190985 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Mauro, Raffaele. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mining equipment and systems theory and practice of exploitation and reliability ent://SD_ILS/0/SD_ILS:286497 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Czaplicki, Jacek M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203852804">Distributed by publisher. 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(Mohammad)&#160;Kaminskiy, Mark, 1946-&#160;Krivtsov, Vasiliy, 1963-<br/>Yer Numaras&#305;&#160;TA169 M627 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood function ent://SD_ILS/0/SD_ILS:133515 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Surhone, Lambert M.&#160;Timpledon, Miriam T.&#160;Marseken, Susan F.<br/>Yer Numaras&#305;&#160;H61 .S87 2010<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedings ent://SD_ILS/0/SD_ILS:191426 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Bartolini, Novella. editor.&#160;Nikoletseas, Sotiris. editor.&#160;Sinha, Prasun. editor.&#160;Cardellini, Valeria. editor.&#160;Mahanti, Anirban. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power distribution system reliability practical methods and applications ent://SD_ILS/0/SD_ILS:249563 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Chowdhury, Ali A.&#160;Koval, D. O. (Don Orest)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design ent://SD_ILS/0/SD_ILS:175745 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Stapelberg, Rudolph Frederick. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis and prediction with warranty data issues, strategies, and methods ent://SD_ILS/0/SD_ILS:286048 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Rai, Bharatendra K.&#160;Singh, Nanua.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:190960 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Buth, Bettina. editor.&#160;Rabe, Gerd. editor.&#160;Seyfarth, Till. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generation ent://SD_ILS/0/SD_ILS:286893 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. 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(Tatsuki)&#160;Wereszczak, Andrew.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> &#304;ki parametreli &uuml;stel da&#287;&#305;l&#305;mda rekor de&#287;erler ile ortak de&#287;i&#351;im katsay&#305;s&#305; ve g&uuml;venirlik tahmin edicileri = Common coefficient of variation and reliability estimators using record values in two parameter exponential distribution ent://SD_ILS/0/SD_ILS:124641 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;B&#305;y&#305;kl&#305;, Nurten.<br/>Yer Numaras&#305;&#160;TEZ/9030 .B59 2009<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Machine Learning in Cyber Trust Security, Privacy, and Reliability ent://SD_ILS/0/SD_ILS:167900 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Yu, Philip S. editor.&#160;Tsai, Jeffrey J. 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S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. 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Proceedings ent://SD_ILS/0/SD_ILS:187335 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Saglietti, Francesca. editor.&#160;Oster, Norbert. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A Guide to Lead-free Solders Physical Metallurgy and Reliability ent://SD_ILS/0/SD_ILS:175373 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Evans, John W. author.&#160;Engelmaier, Werner. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Margins of error a study of reliability in survey measurement ent://SD_ILS/0/SD_ILS:296996 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Alwin, Duane F. 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Proceedings ent://SD_ILS/0/SD_ILS:184859 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;G&oacute;rski, Janusz. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1&ndash;3 September, 2004 ent://SD_ILS/0/SD_ILS:169088 2024-12-12T02:43:38Z 2024-12-12T02:43:38Z Yazar&#160;Yang, W. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>