Arama Sonuçları Reliability.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dReliability.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-22T19:38:22ZReliabilityent://SD_ILS/0/SD_ILS:2334272024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Meyer, J. Patrick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structural reliabilityent://SD_ILS/0/SD_ILS:2979782024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Lemaire, Maurice. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:3418702024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Kapur, Kailash C., 1941- author. Pecht, Michael, author.<br/>Yer Numarası ONLINE(341870.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817">http://public.eblib.com/choice/publicfullrecord.aspx?p=1658817</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html">http://catdir.loc.gov/catdir/enhancements/fy0838/2008459617-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2858862024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Crow, Dana. Feinberg, Alec.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420040845">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical reliability engineeringent://SD_ILS/0/SD_ILS:3055632024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar O'Connor, Patrick P. Kleyner, Andre. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Improving machinery reliabilityent://SD_ILS/0/SD_ILS:1538282024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bloch, Heinz P., 1933-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780884156611">http://www.sciencedirect.com/science/book/9780884156611</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability in pragmaticsent://SD_ILS/0/SD_ILS:3575812024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar McCready, Eric (Eric S.), author.<br/>Yer Numarası P99.4.P72 M445 2015<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Probabilistic reliability modelsent://SD_ILS/0/SD_ILS:2995232024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ushakov, I. A. (Igorʹ Alekseevich)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=894405">Click here to view book</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118370766">http://proquest.tech.safaribooksonline.de/9781118370766</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical reliability engineeringent://SD_ILS/0/SD_ILS:2950992024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic reliability engineeringent://SD_ILS/0/SD_ILS:2951012024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Ushakov, I. A. (Igorʹ Alekseevich) Falk, James. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer systems reliability.ent://SD_ILS/0/SD_ILS:588932024-11-22T19:38:22Z2024-11-22T19:38:22ZYer Numarası TK 7885 C65 1974 V.20<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability and Optimal Maintenanceent://SD_ILS/0/SD_ILS:1753802024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Wang, Hongzhou. author. Pham, Hoang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138077">http://dx.doi.org/10.1007/b138077</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintenance Theory of Reliabilityent://SD_ILS/0/SD_ILS:1753232024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-221-7">http://dx.doi.org/10.1007/1-84628-221-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Safety Engineeringent://SD_ILS/0/SD_ILS:1761932024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Verma, Ajit Kumar. author. Srividya, Ajit. author. Karanki, Durga Rao. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-232-2">http://dx.doi.org/10.1007/978-1-84996-232-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IEEE Transactions on reliability.ent://SD_ILS/0/SD_ILS:2268842024-11-22T19:38:22Z2024-11-22T19:38:22ZYer Numarası ALFABETİK V.12 1963<br/>Format: Devam Eden Süreli Yayınlar Diğer<br/>Durum Beytepe Kütüphanesi~30 ~0<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:2873132024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203483930">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability of large systemsent://SD_ILS/0/SD_ILS:2545132024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Kołowrocki, Krzysztof.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080444291">http://www.sciencedirect.com/science/book/9780080444291</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power-system reliability calculationsent://SD_ILS/0/SD_ILS:2201752024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability theory and practiceent://SD_ILS/0/SD_ILS:475962024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bazovsky, Igor.<br/>Yer Numarası TA 168 B33 1961<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Stochastic Models in Reliabilityent://SD_ILS/0/SD_ILS:3323632024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Aven, Terje. author. Jensen, Uwe. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332363.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-7894-2">http://dx.doi.org/10.1007/978-1-4614-7894-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Network Reliability and Resilienceent://SD_ILS/0/SD_ILS:1950052024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22374-7">http://dx.doi.org/10.1007/978-3-642-22374-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Life cycle reliability engineeringent://SD_ILS/0/SD_ILS:2969262024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Yang, Guangbin, 1964- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and validity assessmentent://SD_ILS/0/SD_ILS:70922024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Carmines, Edward G.<br/>Yer Numarası H 61 C26 1979<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Mathematical theory of reliabilityent://SD_ILS/0/SD_ILS:354042024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Barlow, Richard E. Proschan Frank. , ort. yaz.<br/>Yer Numarası QA 273 B3 1965<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reinforced concrete structural reliabilityent://SD_ILS/0/SD_ILS:2916602024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar El-Reedy, Mohamed Abdallah.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439874172">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantile-Based Reliability Analysisent://SD_ILS/0/SD_ILS:3305562024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Nair, N. Unnikrishnan. author. Sankaran, P.G. author. Balakrishnan, N. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330556.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-8361-0">http://dx.doi.org/10.1007/978-0-8176-8361-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic thin-film reliabilityent://SD_ILS/0/SD_ILS:2781562024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Tu, K. N. (King-Ning), 1937-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=335210</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2856642024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Brown, Richard E., 1969-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780849375682">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability-based Structural Designent://SD_ILS/0/SD_ILS:1754212024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Choi, Seung-Kyum. author. Canfield, Robert A. author. Grandhi, Ramana V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-445-8">http://dx.doi.org/10.1007/978-1-84628-445-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Six Sigmaent://SD_ILS/0/SD_ILS:1657092024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Kumar, U Dinesh. author. Crocker, John. author. Chitra, T. author. Saranga, Haritha. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electric power distribution reliabilityent://SD_ILS/0/SD_ILS:2874452024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Brown, Richard E., 1969-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780824744281">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lubrication and reliability handbookent://SD_ILS/0/SD_ILS:2563332024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Neale, M. J. (Michael John)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750651547">http://www.sciencedirect.com/science/book/9780750651547</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fatigue design and reliabilityent://SD_ILS/0/SD_ILS:2544662024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar International Symposium on Fatigue Design (3rd : 1998 : Espoo, Finland) Marquis, G. (Gary) Solin, J. European Structural Integrity Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080433295">http://www.sciencedirect.com/science/book/9780080433295</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of reliability engineeringent://SD_ILS/0/SD_ILS:2951002024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ushakov, I. A. 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A. (Tom A.), 1966-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420036480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintainability, maintenance, and reliability for engineersent://SD_ILS/0/SD_ILS:2857112024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420006780">Distributed by publisher. 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S.<br/>Yer Numarası TS173 .D45 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:2872852024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203006139">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Case studies in reliability and maintenanceent://SD_ILS/0/SD_ILS:3002262024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Blischke, W. R., 1934- Murthy, D. N. P. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471393002">http://dx.doi.org/10.1002/0471393002</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html">http://catdir.loc.gov/catdir/bios/wiley042/2002191075.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality and reliability in analytical chemistryent://SD_ILS/0/SD_ILS:2859382024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Aboul-Enein, Hassan Y. Stefan, Raluca-Ioana. Baiulescu, George.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420038576">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:2859592024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420042238">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modeling, prediction, and optimizationent://SD_ILS/0/SD_ILS:3003372024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Blischke, W. R., 1934- Murthy, D. N. P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Ceramics processing, reliability, tribology and wear.ent://SD_ILS/0/SD_ILS:3005922024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Müller, G. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527607293">http://dx.doi.org/10.1002/3527607293</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modelling : A statistical approachent://SD_ILS/0/SD_ILS:781392024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Wolstenholme, Linda C.<br/>Yer Numarası TA 169 W65 1999<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Design reliability fundamentals and applicationsent://SD_ILS/0/SD_ILS:2849922024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420050141">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods for reliability dataent://SD_ILS/0/SD_ILS:850802024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Meeker, William Q. Escobar, Luis A., ort. yaz.<br/>Yer Numarası TS 173 M44 1998<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Probability, statistics, reliability for engineersent://SD_ILS/0/SD_ILS:751892024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ayyub, Bilal M. McCuen, Richard H., 1941-<br/>Yer Numarası TA 330 A99 1997<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Semiconductor memories technology, testing, and reliabilityent://SD_ILS/0/SD_ILS:2497392024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Sharma, Ashok K. IEEE Solid-State Circuits Council.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:2543252024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dummer, G. W. A. (Geoffrey William Arnold) Tooley, Michael H. Winton, R. C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750635530">http://www.sciencedirect.com/science/book/9780750635530</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>New trends in system reliability evaluationent://SD_ILS/0/SD_ILS:2552432024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444816603">http://www.sciencedirect.com/science/book/9780444816603</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>An elementary guide to reliabilityent://SD_ILS/0/SD_ILS:482442024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dummer, Geoffrey William Arnold. Winton, R. C., ort. yaz.<br/>Yer Numarası TS 173 D85 1990<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>A Primer of reliability theoryent://SD_ILS/0/SD_ILS:476102024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Grosh, Doris Lloyd.<br/>Yer Numarası TA 169 G76 1989<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability in the acquisitions processent://SD_ILS/0/SD_ILS:476122024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar DePriest, D. J., ed. by Launer, R. L., ed. by<br/>Yer Numarası TA 169 R44 1983<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Software engineering : design, reliability and managementent://SD_ILS/0/SD_ILS:325612024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Shooman, Martin L.<br/>Yer Numarası QA 76.9.S88 S56 1983<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Life testing and reliability estimationent://SD_ILS/0/SD_ILS:354812024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Sinha, S. K. Kale, B. K., ort. yaz.<br/>Yer Numarası QA 273 S64 1980<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Durability and reliability in engineering desingent://SD_ILS/0/SD_ILS:482452024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Kivenson, Gilbert.<br/>Yer Numarası TS 173 K57 1971<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Mathematical methods of reliability theoryent://SD_ILS/0/SD_ILS:476452024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gnedenko, Boris Vladimirovich, 1912- Belyayev, Yu. K., ort. yaz. Solovyev, A. D., ort. yaz.<br/>Yer Numarası TA 340 G5513 1969<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Stochastic Processes with Applications to Reliability Theoryent://SD_ILS/0/SD_ILS:1684752024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-274-2">http://dx.doi.org/10.1007/978-0-85729-274-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Failure Rate Modelling for Reliability and Riskent://SD_ILS/0/SD_ILS:1758682024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-986-8">http://dx.doi.org/10.1007/978-1-84800-986-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Shock and Damage Models in Reliability Theoryent://SD_ILS/0/SD_ILS:1754202024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Reliability and Error in Transportation Systemsent://SD_ILS/0/SD_ILS:1755782024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human reliability and error in transportation systemsent://SD_ILS/0/SD_ILS:2713342024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S.<br/>Yer Numarası TA1145 D45 2007<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>IEEE Transactions on device and materials reliability.ent://SD_ILS/0/SD_ILS:2268372024-11-22T19:38:22Z2024-11-22T19:38:22ZYer Numarası ALFABETİK V.3 2003<br/>Format: Devam Eden Süreli Yayınlar Diğer<br/>Durum Beytepe Kütüphanesi~1 ~0<br/>Advances in safety, reliability and risk managementent://SD_ILS/0/SD_ILS:3427902024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar European Safety and Reliability Conference (2011 : Troyes, France) Berenguer, Christophe. Grall, Antoine. Soares, C. Guedes.<br/>Yer Numarası ONLINE(342790.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203135105">Distributed by publisher. 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D. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119966203">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability of Microtechnology Interconnects, Devices and Systemsent://SD_ILS/0/SD_ILS:1724202024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Hydrosystems engineering reliability assessment and risk analysisent://SD_ILS/0/SD_ILS:2932152024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability centered maintenance (RCM) implementation made simpleent://SD_ILS/0/SD_ILS:2935712024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bloom, Neil.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/reliability-centered-maintenance-rcm">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Symbiotic Multi-Robot Organisms Reliability, Adaptability, Evolutionent://SD_ILS/0/SD_ILS:1917692024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Levi, Paul. author. Kernbach, Serge. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-11692-6">http://dx.doi.org/10.1007/978-3-642-11692-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Solder Joint Reliability Prediction for Multiple Environmentsent://SD_ILS/0/SD_ILS:1676732024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Perkins, Andrew E. author. Sitaraman, Suresh K. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Strong, Alvin Wayne, 1946-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VoIP handbook applications, technologies, reliability, and securityent://SD_ILS/0/SD_ILS:2896752024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ahson, Syed. Ilyas, Mohammad, 1953-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420070217">Distributed by publisher. 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Keith, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750678629">http://www.sciencedirect.com/science/book/9780750678629</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Solder Joint Technology Materials, Properties, and Reliabilityent://SD_ILS/0/SD_ILS:1662522024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Tu, King-Ning. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and risk models : setting reliability requirementsent://SD_ILS/0/SD_ILS:1194812024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Todinov, M. T.<br/>Yer Numarası TA169 .T65 2005<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability and risk models setting reliability requirementsent://SD_ILS/0/SD_ILS:2959002024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Todinov, M. T. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470094907">http://dx.doi.org/10.1002/0470094907</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical reliability of electronic equipment and productsent://SD_ILS/0/SD_ILS:2883622024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Hnatek, Eugene R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203909089">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cognitive reliability and error analysis method CREAMent://SD_ILS/0/SD_ILS:2544332024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Hollnagel, Erik, 1941-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System reliability theory models and statistical methodsent://SD_ILS/0/SD_ILS:2952702024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronics reliability and measurement technology nondestructive evaluationent://SD_ILS/0/SD_ILS:2541512024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Heyman, Joseph S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Factors and Reliability Engineering for Safety and Security in Critical Infrastructures Decision Making, Theory, and Practiceent://SD_ILS/0/SD_ILS:4018452024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar De Felice, Fabio. editor. Petrillo, Antonella. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-62319-1">https://doi.org/10.1007/978-3-319-62319-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Advances in Multi-state Systems Reliability Theory and Applicationsent://SD_ILS/0/SD_ILS:4010982024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. Karagrigoriou, Alex. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-63423-4">https://doi.org/10.1007/978-3-319-63423-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Point Processes for Reliability Analysis Shocks and Repairable Systemsent://SD_ILS/0/SD_ILS:4023922024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Cha, Ji Hwan. author. Finkelstein, Maxim. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Reliability, Error, and Human Factors in Power Generationent://SD_ILS/0/SD_ILS:4876432024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Monte Carlo Simulation Method for System Reliability and Risk Analysisent://SD_ILS/0/SD_ILS:3310172024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Zio, Enrico. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331017.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4588-2">http://dx.doi.org/10.1007/978-1-4471-4588-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Principles of Loads and Failure Mechanisms Applications in Maintenance, Reliability and Designent://SD_ILS/0/SD_ILS:3310972024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Tinga, T. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331097.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4917-0">http://dx.doi.org/10.1007/978-1-4471-4917-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Reliability and Maintenance Modeling Essays in Honor of Professor Shunji Osaki on his 70th Birthdayent://SD_ILS/0/SD_ILS:3311092024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dohi, Tadashi. editor. Nakagawa, Toshio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331109.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4971-2">http://dx.doi.org/10.1007/978-1-4471-4971-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Modeling for Reliability Shocks, Burn-in and Heterogeneous populationsent://SD_ILS/0/SD_ILS:3311212024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Finkelstein, Maxim. author. Cha, Ji Hwan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331121.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-5028-2">http://dx.doi.org/10.1007/978-1-4471-5028-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Advances in System Reliability Signatures, Multi-state Systems and Statistical Inferenceent://SD_ILS/0/SD_ILS:1733902024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Lisnianski, Anatoly. editor. Frenkel, Ilia. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2207-4">http://dx.doi.org/10.1007/978-1-4471-2207-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applications of Finite Element Methods for Reliability Studies on ULSI Interconnectionsent://SD_ILS/0/SD_ILS:1684862024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimizationent://SD_ILS/0/SD_ILS:1685712024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-694-8">http://dx.doi.org/10.1007/978-0-85729-694-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:2988172024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Pascoe, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
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Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Complex System Reliability Multichannel Systems with Imperfect Fault Coverageent://SD_ILS/0/SD_ILS:1762442024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Myers, Albert. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-414-2">http://dx.doi.org/10.1007/978-1-84996-414-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Simulation Methods for Reliability and Availability of Complex Systemsent://SD_ILS/0/SD_ILS:1759232024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Faulin, Javier. editor. Juan, Angel A. editor. Martorell, Sebastián. editor. Ramírez-Márquez, José-Emmanuel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84882-213-9">http://dx.doi.org/10.1007/978-1-84882-213-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Advances in Reliability and Quality in Designent://SD_ILS/0/SD_ILS:1757162024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-113-8">http://dx.doi.org/10.1007/978-1-84800-113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Reliability and Quality Fundamentals, Methods and Proceduresent://SD_ILS/0/SD_ILS:1754432024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-498-4">http://dx.doi.org/10.1007/978-1-84628-498-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Universal Generating Function in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1753372024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Levitin, Gregory. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-245-4">http://dx.doi.org/10.1007/1-84628-245-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fracture mechanics. 1, Analysis of reliability and quality controlent://SD_ILS/0/SD_ILS:3054242024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Grous, Ammar, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systemsent://SD_ILS/0/SD_ILS:1758392024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Seong, Poong Hyun. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-384-2">http://dx.doi.org/10.1007/978-1-84800-384-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Security and Reliability of Damaged Structures and Defective Materialsent://SD_ILS/0/SD_ILS:2048892024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Pluvinage, Guy. editor. Sedmak, Aleksandar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2792-4">http://dx.doi.org/10.1007/978-90-481-2792-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelinesent://SD_ILS/0/SD_ILS:1698422024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Pluvinage, Guy. editor. Elwany, Mohamed Hamdy. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6526-2">http://dx.doi.org/10.1007/978-1-4020-6526-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Guidelines for improving plant reliability through data collection and analysisent://SD_ILS/0/SD_ILS:3000222024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The theory and applications of reliability with emphasis on Bayesian and nonparametric methodsent://SD_ILS/0/SD_ILS:2561152024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127021010">http://www.sciencedirect.com/science/book/9780127021010</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety and reliability : methodology and applications : proceedings of the European Safety and Reliability Conference, Esrel 2014, Wroc¿̐ưaw, Poland, 14-18 September 2014ent://SD_ILS/0/SD_ILS:3569842024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar European Safety and Reliability Conference (2014 : Wroc¿̐ưaw, Poland) Nowakowski, Tomasz, editor.<br/>Yer Numarası ONLINE(356984.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781315736976">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety, reliability, risk and life-cycle performance of structures and infrastructures : proceedings of the 11th International Conference on Structural Safety and Reliability, New York, USA, 16-20 June 2013ent://SD_ILS/0/SD_ILS:3569192024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar International Conference on Structural Safety and Reliability (11th : 2013 : New York). Sponsor. Deodatis, G. (George), editor. Ellingwood, Bruce R., editor. Frangopol, Dan M., editor.<br/>Yer Numarası ONLINE(356919.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781315884882">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in product development and reliability III selected, peer reviewed papers from the 3rd International Conference on Advances in Product Development and Reliability (PDR 2012), July 28-30, 2012, Wuhan, Chinaent://SD_ILS/0/SD_ILS:2796202024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar International Conference on Advances in Product Development and Reliability (3rd : 2012 : Wuhan, China) Gao, L., editor of compilation. Li, W. D., editor of compilation. Zhao, Y. X., editor of compilation. Li, X. Y., editor of compilation.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517245</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, risk, and safety theory and applications : proceedings of the European Safety and Reliability Conference, ESREL 2009 : Prague, Czech Republic, 7-19 September 2009ent://SD_ILS/0/SD_ILS:2883172024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar European Safety and Reliability Conference (2009 : Prague, Czech Republic) Bri?, Radim. Soares, C. Guedes. Martorell, Sebastiǹ.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203859759">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and optimization of structural systems proceedings of Reliability and Optimization of Structural Systems, Tum, M¿nchen, Germany, 7-10 April 2010ent://SD_ILS/0/SD_ILS:2892422024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Reliability and Optimization of Structural Systems (2010 : Tum, M¿nchen, Germany) Straub, D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203841419">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety, reliability and risk of structures, infrastructures and engineering systems proceedings of the Tenth International Conference on Structural Safety and Reliability (ICOSSAR2009), Osaka, Japan, 13-17 September 2009ent://SD_ILS/0/SD_ILS:2888582024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar International Conference on Structural Safety and Reliability (10th : 2009 : Osaka, Japan) Furuta, Hitoshi. Frangopol, Dan M. Shinozuka, Masanobu. Hirokane, Michiyuki.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439847657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211342024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521134.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security. SAFECOMP 2023 Workshops ASSURE, DECSoS, SASSUR, SENSEI, SRToITS, and WAISE, Toulouse, France, September 19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211372024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Roy, Matthieu. editor. Bitsch, Friedemann. editor.<br/>Yer Numarası XX(521137.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40953-0">https://doi.org/10.1007/978-3-031-40953-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification 5th International Conference, RSSRail 2023, Berlin, Germany, October 10-12, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211802024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Milius, Birgit. editor. Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521180.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43366-5">https://doi.org/10.1007/978-3-031-43366-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:4829352024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar McPherson, J. W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 38th International Conference, SAFECOMP 2019, Turku, Finland, September 11–13, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4837362024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-26601-1">https://doi.org/10.1007/978-3-030-26601-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2018 International Conference on Human Error, Reliability, Resilience, and Performance, July 21-25, 2018, Loews Sapphire Falls Resort at Universal Studios, Orlando, Florida, USAent://SD_ILS/0/SD_ILS:4859212024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Boring, Ronald L. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-94391-6">https://doi.org/10.1007/978-3-319-94391-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic Models in Reliability, Network Security and System Safety Essays Dedicated to Professor Jinhua Cao on the Occasion of His 80th Birthdayent://SD_ILS/0/SD_ILS:4860292024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Li, Quan-Lin. editor. Wang, Jinting. editor. Yu, Hai-Bo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-15-0864-6">https://doi.org/10.1007/978-981-15-0864-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2019 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Turku, Finland, September 10, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4848672024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 Troubitsyna, Elena. editor. Gashi, Ilir. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-26250-1">https://doi.org/10.1007/978-3-030-26250-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineeringent://SD_ILS/0/SD_ILS:4852132024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ali, Syed Riffat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01647-0">https://doi.org/10.1007/978-3-030-01647-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Third International Conference, RSSRail 2019, Lille, France, June 4–6, 2019, Proceedingsent://SD_ILS/0/SD_ILS:4862742024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Collart-Dutilleul, Simon. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-18744-6">https://doi.org/10.1007/978-3-030-18744-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Systems 14th EAI International Conference, Qshine 2018, Ho Chi Minh City, Vietnam, December 3–4, 2018, Proceedingsent://SD_ILS/0/SD_ILS:4869002024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Duong, Trung Q. editor. Vo, Nguyen-Son. editor. Phan, Van Ca. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-14413-5">https://doi.org/10.1007/978-3-030-14413-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Statistics in Transportation and Communication Selected Papers from the 18th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’18, 17-20 October 2018, Riga, Latviaent://SD_ILS/0/SD_ILS:4869962024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Kabashkin, Igor. editor. Yatskiv (Jackiva), Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-12450-2">https://doi.org/10.1007/978-3-030-12450-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability of Selective Laser Melted AlSi12 Alloy for Quasistatic and Fatigue Applicationsent://SD_ILS/0/SD_ILS:4870452024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Siddique, Shafaqat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-23425-6">https://doi.org/10.1007/978-3-658-23425-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Crossbar-Based Interconnection Networks Blocking, Scalability, and Reliabilityent://SD_ILS/0/SD_ILS:4002902024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Jahanshahi, Mohsen. author. Bistouni, Fathollah. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-78473-1">https://doi.org/10.1007/978-3-319-78473-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chipent://SD_ILS/0/SD_ILS:4013482024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-1073-6">https://doi.org/10.1007/978-981-10-1073-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USAent://SD_ILS/0/SD_ILS:4018302024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security SAFECOMP 2018 Workshops, ASSURE, DECSoS, SASSUR, STRIVE, and WAISE, Västerås, Sweden, September 18, 2018, Proceedingsent://SD_ILS/0/SD_ILS:3997832024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Schoitsch, Erwin. editor. (orcid)0000-0002-0335-5443 Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-99229-7">https://doi.org/10.1007/978-3-319-99229-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 37th International Conference, SAFECOMP 2018, Västerås, Sweden, September 19-21, 2018, Proceedingsent://SD_ILS/0/SD_ILS:4003442024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gallina, Barbara. editor. (orcid)0000-0002-6952-1053 Skavhaug, Amund. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-99130-6">https://doi.org/10.1007/978-3-319-99130-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Statistics in Transportation and Communication Selected Papers from the 17th International Conference on Reliability and Statistics in Transportation and Communication, RelStat’17, 18-21 October, 2017, Riga, Latviaent://SD_ILS/0/SD_ILS:4023952024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Kabashkin, Igor. editor. Yatskiv, Irina. editor. Prentkovskis, Olegas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-74454-4">https://doi.org/10.1007/978-3-319-74454-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Systems 13th International Conference, QShine 2017, Dalian, China, December 16 -17, 2017, Proceedingsent://SD_ILS/0/SD_ILS:4008732024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Wang, Lei. editor. Qiu, Tie. editor. Zhao, Wenbing. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-78078-8">https://doi.org/10.1007/978-3-319-78078-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Solid State Lighting Reliability Part 2 Components to Systemsent://SD_ILS/0/SD_ILS:4015282024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar van Driel, Willem Dirk. editor. Fan, Xuejun. editor. Zhang, Guo Qi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Wide Bandgap Power Semiconductor Packaging : Materials, Components, and Reliabilityent://SD_ILS/0/SD_ILS:4601172024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Suganuma, Katsuaki, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020944">https://www.sciencedirect.com/science/book/9780081020944</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalarent://SD_ILS/0/SD_ILS:3892572024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Tahralı, Necati Atik, Enver, author Çivi, Cem, author<br/>Yer Numarası TJ230 T34 2017<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Chemical and biochemical technology : materials, processing, and reliabilityent://SD_ILS/0/SD_ILS:3565452024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Varfolomeev, Serge¿̐ưi Dmitrievich, editor.<br/>Yer Numarası ONLINE(356545.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781482257625">Distributed by publisher. 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John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:3554852024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Yer Numarası ONLINE(355485.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability of safety-critical systems : theory and applicationent://SD_ILS/0/SD_ILS:3417732024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Rausand, Marvin.<br/>Yer Numarası ONLINE(341773.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of inter-rater reliability : the definitive guide to measuring the extent of agreement among ratersent://SD_ILS/0/SD_ILS:3386332024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gwet, Kilem Li, author<br/>Yer Numarası QA278 G8 2014<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1 Sağlık Bilimleri Kütüphanesi~1<br/>Reliability prediction from burn-in data fit to reliability modelsent://SD_ILS/0/SD_ILS:3559212024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bernstein, Joseph.<br/>Yer Numarası ONLINE(355921.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128007471">http://www.sciencedirect.com/science/book/9780128007471</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 33rd International Conference, SAFECOM 2014, Florence, Italy, September 10-12, 2014. 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Florence, Italy, September 8-9, 2014, Proceedingsent://SD_ILS/0/SD_ILS:4856762024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bondavalli, Andrea. editor. Ceccarelli, Andrea. editor. Ortmeier, Frank. editor. (orcid)0000-0001-6186-4142 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10557-4">https://doi.org/10.1007/978-3-319-10557-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Availability, Reliability, and Security in Information Systems IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2014 and 4th InternationalWorkshop on Security and Cognitive Informatics for Homeland Defense, SeCIHD 2014, Fribourg, Switzerland, September 8-12, 2014. Proceedingsent://SD_ILS/0/SD_ILS:4890552024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Teufel, Stephanie. editor. A Min, Tjoa. editor. You, Illsun. editor. Weippl, Edgar. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10975-6">https://doi.org/10.1007/978-3-319-10975-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Gas and oil reliability engineering modeling and analysisent://SD_ILS/0/SD_ILS:1459072024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Calixto, Eduardo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123919144">http://www.sciencedirect.com/science/book/9780123919144</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Rail human factors supporting reliability, safety and cost reductionent://SD_ILS/0/SD_ILS:2911072024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dadashi, Nastaran. Scott, Anita. Wilson, John R. Mills, Ann.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203759721">Distributed by publisher. 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John Wiley <a href="http://dx.doi.org/10.1002/9781118481882">http://dx.doi.org/10.1002/9781118481882</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:3065662024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Wu, Bin, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Availability, Reliability, and Security in Information Systems and HCI IFIP WG 8.4, 8.9, TC 5 International Cross-Domain Conference, CD-ARES 2013, Regensburg, Germany, September 2-6, 2013. Proceedingsent://SD_ILS/0/SD_ILS:3349582024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Cuzzocrea, Alfredo. editor. Kittl, Christian. editor. Simos, Dimitris E. editor. Weippl, Edgar. editor. Xu, Lida. editor.<br/>Yer Numarası ONLINE(334958.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-40511-2">http://dx.doi.org/10.1007/978-3-642-40511-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 32nd International Conference, SAFECOMP 2013, Toulouse, France, September 24-27, 2013. Proceedingsent://SD_ILS/0/SD_ILS:3350052024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bitsch, Friedemann. editor. Guiochet, Jérémie. editor. Kaâniche, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335005.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-40793-2">http://dx.doi.org/10.1007/978-3-642-40793-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examplesent://SD_ILS/0/SD_ILS:3650012024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Yer Numarası ONLINE(365001.1)<br/>Elektronik Erişim Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Elektrnik 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International Conference, QShine 2013, Greader Noida, India, January 11-12, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3345052024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Singh, Karan. editor. Awasthi, Amit K. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334505.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37949-9">http://dx.doi.org/10.1007/978-3-642-37949-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Materials and Reliability Handbook for Semiconductor Optical and Electron Devicesent://SD_ILS/0/SD_ILS:3314782024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331478.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-4337-7">http://dx.doi.org/10.1007/978-1-4614-4337-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and Risk Evaluation of Wind Integrated Power 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Yong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1053-9">http://dx.doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality, Reliability, Security and Robustness in Heterogeneous Networks 7th International Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2010, and Dedicated Short Range Communications Workshop, DSRC 2010, Houston, TX, USA, November 17-19, 2010, Revised Selected Papersent://SD_ILS/0/SD_ILS:1966482024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Zhang, Xi. editor. Qiao, Daji. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29222-4">http://dx.doi.org/10.1007/978-3-642-29222-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Beyond redundancy how geographic redundancy can improve service 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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability, statistics, and reliability for engineers and scientistsent://SD_ILS/0/SD_ILS:3129152024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Ayyub, Bilal M., author. McCuen, Richard H., 1941-<br/>Yer Numarası ONLINE(312915.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpPSRESE01">http://app.knovel.com/web/toc.v/cid:kpPSRESE01</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality and Reliability of Large-Eddy Simulations IIent://SD_ILS/0/SD_ILS:2057842024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Salvetti, Maria Vittoria. editor. Geurts, Bernard. editor. Meyers, Johan. editor. Sagaut, Pierre. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-0231-8">http://dx.doi.org/10.1007/978-94-007-0231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:4594222024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Smith, David J. (David John), 1943 June 22-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Data Analysis Theory and Applications to Reliability and Inference, Data Mining, Bioinformatics, Lifetime Data, and Neural Networksent://SD_ILS/0/SD_ILS:1682922024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Skiadas, Christos H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4799-5">http://dx.doi.org/10.1007/978-0-8176-4799-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:1725712024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar McPherson, J.W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Survival analysis : reliability theory, reliability engineering, random variable, actuarial science, expected value, renewal theory, reliability theory of aging and longevity, likelihood functionent://SD_ILS/0/SD_ILS:1335152024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Surhone, Lambert M. Timpledon, Miriam T. Marseken, Susan F.<br/>Yer Numarası H61 .S87 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Advances in Degradation Modeling Applications to Reliability, Survival Analysis, and Financeent://SD_ILS/0/SD_ILS:1683212024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Nikulin, M.S. editor. Limnios, Nikolaos. editor. Balakrishnan, N. editor. Kahle, Waltraud. editor. Huber-Carol, Catherine. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4924-1">http://dx.doi.org/10.1007/978-0-8176-4924-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Controlent://SD_ILS/0/SD_ILS:1683332024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability and Statistical Models Foundations for Problems in Reliability and Financial Mathematicsent://SD_ILS/0/SD_ILS:1683372024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gupta, Arjun K. author. Zeng, Wei-Bin. author. Wu, Yanhong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4987-6">http://dx.doi.org/10.1007/978-0-8176-4987-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliability information and computer-based systemsent://SD_ILS/0/SD_ILS:2498792024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bauer, Eric.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Process risk and reliability management operational integrity managementent://SD_ILS/0/SD_ILS:1472192024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Sutton, Ian S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781437778052">http://www.sciencedirect.com/science/book/9781437778052</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Multi-state System Reliability Analysis and Optimization for Engineers and Industrial Managersent://SD_ILS/0/SD_ILS:1762212024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Lisnianski, Anatoly. author. Frenkel, Ilia. author. Ding, Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84996-320-6">http://dx.doi.org/10.1007/978-1-84996-320-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:2860842024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Wessels, William R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420094404">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mining equipment and systems theory and practice of exploitation and reliabilityent://SD_ILS/0/SD_ILS:2864972024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Czaplicki, Jacek M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203852804">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Safety and reliability of industrial products, systems and structuresent://SD_ILS/0/SD_ILS:2883272024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Guedes Soares, Carlos.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203818657">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:3638772024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Modarres, M. (Mohammad) Kaminskiy, Mark, 1946- Krivtsov, Vasiliy, 1963-<br/>Yer Numarası TA169 M627 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Calculation of Roundabouts Capacity, Waiting Phenomena and Reliabilityent://SD_ILS/0/SD_ILS:1909852024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Mauro, Raffaele. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-04551-6">http://dx.doi.org/10.1007/978-3-642-04551-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 29th International Conference, SAFECOMP 2010, Vienna, Austria, September 14-17, 2010. Proceedingsent://SD_ILS/0/SD_ILS:1930402024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Schoitsch, Erwin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15651-9">http://dx.doi.org/10.1007/978-3-642-15651-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>İki parametreli üstel dağılımda rekor değerler ile ortak değişim katsayısı ve güvenirlik tahmin edicileri = Common coefficient of variation and reliability estimators using record values in two parameter exponential distributionent://SD_ILS/0/SD_ILS:1246412024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bıyıklı, Nurten.<br/>Yer Numarası TEZ/9030 .B59 2009<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Machine Learning in Cyber Trust Security, Privacy, and Reliabilityent://SD_ILS/0/SD_ILS:1679002024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Yu, Philip S. editor. Tsai, Jeffrey J. P. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-88735-7">http://dx.doi.org/10.1007/978-0-387-88735-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Reliability, Availability, Maintainability and Safety in Engineering Designent://SD_ILS/0/SD_ILS:1757452024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Stapelberg, Rudolph Frederick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-175-6">http://dx.doi.org/10.1007/978-1-84800-175-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power distribution system reliability practical methods and applicationsent://SD_ILS/0/SD_ILS:2495632024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Chowdhury, Ali A. Koval, D. O. (Don Orest)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human reliability, error, and human factors in engineering maintenance with reference to aviation and power generationent://SD_ILS/0/SD_ILS:2868932024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439803844">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis and prediction with warranty data issues, strategies, and methodsent://SD_ILS/0/SD_ILS:2860482024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Rai, Bharatendra K. Singh, Nanua.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439803264">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Corrosion, wear, fatigue, and reliability of ceramics a collection of papers presented at the 32nd International Conference on Advanced Ceramics and Composites, January 27-February 1, 2008, Daytona Beach, Floridaent://SD_ILS/0/SD_ILS:2974572024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar International Conference on Advanced Ceramics and Composites (32nd : 2008 : Daytona Beach, Fla.) Salem, J. A. (Jonathan A.), 1960- Fuller, Edwin R. Ohji, T. (Tatsuki) Wereszczak, Andrew.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470456347">http://dx.doi.org/10.1002/9780470456347</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297839">http://site.ebrary.com/lib/alltitles/Doc?id=10297839</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust design methodology for reliability exploring the effects of variation and uncertaintyent://SD_ILS/0/SD_ILS:2983962024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bergman, Bo, 1943- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 28th International Conference, SAFECOMP 2009, Hamburg, Germany, September 15-18, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1909602024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Buth, Bettina. editor. Rabe, Gerd. editor. Seyfarth, Till. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-04468-7">http://dx.doi.org/10.1007/978-3-642-04468-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality of Service in Heterogeneous Networks 6th International ICST Conference on Heterogeneous Networking for Quality, Reliability, Security and Robustness, QShine 2009 and 3rd International Workshop on Advanced Architectures and Algorithms for Internet Delivery and Applications, AAA-IDEA 2009, Las Palmas, Gran Canaria, November 23-25, 2009 Proceedingsent://SD_ILS/0/SD_ILS:1914262024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bartolini, Novella. editor. Nikoletseas, Sotiris. editor. Sinha, Prasun. editor. Cardellini, Valeria. editor. Mahanti, Anirban. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-10625-5">http://dx.doi.org/10.1007/978-3-642-10625-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering design reliability applications for the aerospace, automotive, and ship industriesent://SD_ILS/0/SD_ILS:1530402024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedingsent://SD_ILS/0/SD_ILS:1888942024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-87698-4">http://dx.doi.org/10.1007/978-3-540-87698-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysisent://SD_ILS/0/SD_ILS:1670302024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11nent://SD_ILS/0/SD_ILS:2360242024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Perahia, Eldad. Stacey, Robert.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511541032">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliabilityent://SD_ILS/0/SD_ILS:1839932024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Bertsche, Bernd. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-34282-3">http://dx.doi.org/10.1007/978-3-540-34282-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Developments in Telecommunications With a Focus on SS7 Network Reliabilityent://SD_ILS/0/SD_ILS:1873292024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Rufa, Gerhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74986-8">http://dx.doi.org/10.1007/978-3-540-74986-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability technology, human error, and quality in health careent://SD_ILS/0/SD_ILS:2850362024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420065596">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tutorial on hardware and software reliability, maintainability, and availabilityent://SD_ILS/0/SD_ILS:2498142024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Schneidewind, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a>
IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical methods in survival analysis, reliability and quality of lifeent://SD_ILS/0/SD_ILS:2975432024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Huber, Catherine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lubrication and maintenance of industrial machinery best practices and reliabilityent://SD_ILS/0/SD_ILS:2896492024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Gresham, Robert M. Totten, George E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420089363">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Todinov, M. T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:1659002024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientistsent://SD_ILS/0/SD_ILS:1664112024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Saunders, Sam C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semi-Markov Risk Models for Finance, Insurance and Reliabilityent://SD_ILS/0/SD_ILS:1667612024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Jacques, Janssen. author. Raimondo, Manca. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-70730-1">http://dx.doi.org/10.1007/0-387-70730-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System Signatures and their Applications in Engineering Reliabilityent://SD_ILS/0/SD_ILS:1668812024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Samaniego, Francisco J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-71797-5">http://dx.doi.org/10.1007/978-0-387-71797-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimizationent://SD_ILS/0/SD_ILS:1845342024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Levitin, Gregory. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37368-1">http://dx.doi.org/10.1007/978-3-540-37368-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Intelligence in Reliability Engineering New Metaheuristics, Neural and Fuzzy Techniques in Reliabilityent://SD_ILS/0/SD_ILS:1845352024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Levitin, Gregory. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37372-8">http://dx.doi.org/10.1007/978-3-540-37372-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Guide to Lead-free Solders Physical Metallurgy and Reliabilityent://SD_ILS/0/SD_ILS:1753732024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Evans, John W. author. Engelmaier, Werner. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 26th International Conference, SAFECOMP 2007, Nuremberg, Germany, September 18-21, 2007. Proceedingsent://SD_ILS/0/SD_ILS:1873352024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Saglietti, Francesca. editor. Oster, Norbert. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-75101-4">http://dx.doi.org/10.1007/978-3-540-75101-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro- and opto-electronic materials and structures : physics, mechanics, design, reliability, packagingent://SD_ILS/0/SD_ILS:1104482024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Suhir, Ephraim. Lee, Y. C. Wong, C. P.<br/>Yer Numarası TK7874 .M438 2007 V.1<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Practical plant failure analysis a guide to understanding machinery deterioration and improving equipment reliabilityent://SD_ILS/0/SD_ILS:2866202024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Sachs, Neville W.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420020007">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Margins of error a study of reliability in survey measurementent://SD_ILS/0/SD_ILS:2969962024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Alwin, Duane F. (Duane Francis), 1944- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html">http://catdir.loc.gov/catdir/enhancements/fy0745/2006053191-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470146316">http://dx.doi.org/10.1002/9780470146316</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IUTAM Symposium on Mechanics and Reliability of Actuating Materials Proceedings of the IUTAM Symposium held in Beijing, China, 1–3 September, 2004ent://SD_ILS/0/SD_ILS:1690882024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Yang, W. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-4131-4">http://dx.doi.org/10.1007/1-4020-4131-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 25th International Conference, SAFECOMP 2006, Gdansk, Poland, September 27-29, 2006. Proceedingsent://SD_ILS/0/SD_ILS:1848592024-11-22T19:38:22Z2024-11-22T19:38:22ZYazar Górski, Janusz. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11875567">http://dx.doi.org/10.1007/11875567</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>