Arama Sonuçları Risk Assessment - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dRisk$002bAssessment$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300?2025-12-28T12:31:39ZHydrosystems engineering reliability assessment and risk analysisent://SD_ILS/0/SD_ILS:2932152025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Tung, Yeou-Koung. Yen, Ben Chie, 1935- Melching, Charles S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering and economicsent://SD_ILS/0/SD_ILS:5457262025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Ayyub, Bilal M., author.<br/>Yer Numarası T174.5 .A99 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466518261">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Resilience engineering in practice. Volume 2, Becoming resilientent://SD_ILS/0/SD_ILS:5465152025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Nemeth, Christopher P., editor. Hollnagel, Erik, 1941- editor.<br/>Yer Numarası TA169 .R4663 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315605708">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced risk analysis in engineering enterprise systemsent://SD_ILS/0/SD_ILS:5387592025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Pinto, Cesar Ariel., author. Garvey, Paul R., 1956-<br/>Yer Numarası TA169 .P56 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826157">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Importance measures in reliability, risk, and optimization principles and applicationsent://SD_ILS/0/SD_ILS:2993862025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Kuo, Way, 1951- Zhu, Xiaoyan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, maintainability, and risk : practical methods for engineersent://SD_ILS/0/SD_ILS:4594222025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Smith, David J. (David John), 1943 June 22-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080969022">http://www.sciencedirect.com/science/book/9780080969022</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:3638772025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Modarres, M. (Mohammad) Kaminskiy, Mark, 1946- Krivtsov, Vasiliy, 1963-<br/>Yer Numarası TA169 M627 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Human reliability assessment : theory and practiceent://SD_ILS/0/SD_ILS:5400462025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Spurgin, Anthony J., author.<br/>Yer Numarası TA166 .S685 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability technology, human error, and quality in health careent://SD_ILS/0/SD_ILS:5429962025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası RA399 .A1 D487 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420065596">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Todinov, M. T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering : techniques, tools, and trendsent://SD_ILS/0/SD_ILS:1195342025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Modarres, Mohammad.<br/>Yer Numarası T174.5 M65 2006<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>What every engineer should know about decision making under uncertaintyent://SD_ILS/0/SD_ILS:5443452025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Wang, John X., 1962- CRC Press.<br/>Yer Numarası TA190 .W36 2005<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429222733">https://www.taylorfrancis.com/books/9780429222733</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering and economicsent://SD_ILS/0/SD_ILS:5392592025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Ayyub, Bilal M., author.<br/>Yer Numarası T174.5 .A98 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:5409122025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası R855.3 .D47 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design reliability : fundamentals and applicationsent://SD_ILS/0/SD_ILS:5405722025-12-28T12:31:39Z2025-12-28T12:31:39ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası TA174 .D4929 1999<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>