Arama Sonuçları Risk management -- Data processing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dRisk$002bmanagement$002b--$002bData$002bprocessing.$0026ps$003d300?2026-01-22T09:21:26ZOpen-source security operations center (SOC) : a complete guide to establishing, managing, and maintaining a modern SOCent://SD_ILS/0/SD_ILS:5994342026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Basta, Alfred, author. Basta, Nadine, author. Anwar, Waqar, author. Essar, Mohammad Ilyas, author. John Wiley & Sons, publisher.<br/>Yer Numarası QA76.9 .A25<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394201631">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394201631</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial intelligence for risk mitigation in the financial industryent://SD_ILS/0/SD_ILS:5991902026-01-22T09:21:26Z2026-01-22T09:21:26ZYer Numarası HG173 .A78 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175574">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175574</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5207522026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23944-1">https://doi.org/10.1007/978-3-031-23944-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the 4th International Conference on Big Data Analytics for Cyber-Physical System in Smart City - Volume 2 BDCPS 2022, December 16-17, 2022, Bangkok, Thailandent://SD_ILS/0/SD_ILS:5288932026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Atiquzzaman, Mohammed. editor. Yen, Neil Yuwen. editor. Xu, Zheng. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-1157-8">https://doi.org/10.1007/978-981-99-1157-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial intelligence and big data for financial risk management : intelligent applicationsent://SD_ILS/0/SD_ILS:5634412026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Metawa, Noura, editor. Hassan, Kabir, editor. Metawa, Saad, editor.<br/>Yer Numarası HG173<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003144410">https://www.taylorfrancis.com/books/9781003144410</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Distributed acoustic sensing in geophysics : methods and applicationsent://SD_ILS/0/SD_ILS:5968672026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Li, Yingping, editor. Karrenbach, Martin, editor. Ajo-Franklin, Jonathan, editor.<br/>Yer Numarası QC808.5 .D57 2022<br/>Elektronik Erişim <a href="https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119521808">https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119521808</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cyber-physical systems : foundations and techniquesent://SD_ILS/0/SD_ILS:5975922026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Sharma, Uzzal, editor.<br/>Yer Numarası TJ213 .C93 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119836636">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119836636</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Energy power risk : derivatives, computation and optimizationent://SD_ILS/0/SD_ILS:4218312026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Levy, George, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://www.emerald.com/insight/publication/doi/10.1108/9781787435278">https://www.emerald.com/insight/publication/doi/10.1108/9781787435278</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The counselor and the law : a guide to legal and ethical practiceent://SD_ILS/0/SD_ILS:5998272026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Wheeler, Anne Marie, 1954- author. Bertram, Burt, author.<br/>Yer Numarası KF2910 .P75 W44 2019 EB<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394347384">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394347384</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Flood damage survey and assessment : new insights from research and practiceent://SD_ILS/0/SD_ILS:5937952026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Molinari, Daniela, editor. Menoni, Scira, editor. Ballio, Francesco, editor.<br/>Yer Numarası HV609<br/>Elektronik Erişim <a href="https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119217930">https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119217930</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applications of Evolutionary Computation 18th European Conference, EvoApplications 2015, Copenhagen, Denmark, April 8-10, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190152026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Mora, Antonio M. editor. Squillero, Giovanni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16549-3">https://doi.org/10.1007/978-3-319-16549-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Manufacturing and engineering technologyent://SD_ILS/0/SD_ILS:5463722026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Sheng, Ai, editor. Wang, Yizhong, editor. International Conference on Manufacturing and Engineering Technology (2014 : Sanya, China)<br/>Yer Numarası TJ241 .M36 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315760728">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the 4th International Conference on Computer Engineering and Networks CENet2014ent://SD_ILS/0/SD_ILS:5302442026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Wong, W. Eric. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-11104-9">https://doi.org/10.1007/978-3-319-11104-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pharmaceutical computer systems validation : quality assurance, risk management and regulatory complianceent://SD_ILS/0/SD_ILS:5449892026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Wingate, Guy.<br/>Yer Numarası HD9665.5 .C664 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420088953">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The Real-Time Enterprise.ent://SD_ILS/0/SD_ILS:5478212026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Chorafas, Dimitris N., author.<br/>Yer Numarası HF5548.3 .C46 2004<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780203337165">Click here to view</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429220272">https://www.taylorfrancis.com/books/9780429220272</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer systems validation : quality assurance, risk management, and regulatory compliance for pharmaceutical and healthcare companiesent://SD_ILS/0/SD_ILS:5402532026-01-22T09:21:26Z2026-01-22T09:21:26ZYazar Wingate, Guy.<br/>Yer Numarası HD9665.5 .C664 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135496326">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>