Arama Sonu&ccedil;lar&#305; Robust statistics. - Daralt&#305;lm&#305;&#351;: Elektronik K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dRobust$002bstatistics.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026pe$003dd$00253A$0026ps$003d300?dt=list 2024-12-28T14:20:42Z Robust statistics ent://SD_ILS/0/SD_ILS:297687 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Huber, Peter J.&#160;Ronchetti, Elvezio.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470434697">http://dx.doi.org/10.1002/9780470434697</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=236819&ref=toc">http://www.myilibrary.com?id=236819&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10307899">http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10307899</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Methodology in robust and nonparametric statistics ent://SD_ILS/0/SD_ILS:291644 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Jure?kov,&#768; Jana, 1940-&#160;Sen, Pranab Kumar, 1937-&#160;Picek, Jan, 1965-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439840696">Distributed by publisher. 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Douglas.&#160;Yohai, V&iacute;ctor J.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470010940">http://dx.doi.org/10.1002/0470010940</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112636810">http://www3.interscience.wiley.com/cgi-bin/bookhome/112636810</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley046/2004266770.html">http://catdir.loc.gov/catdir/bios/wiley046/2004266770.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust statistics the approach based on influence functions ent://SD_ILS/0/SD_ILS:300362 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Hampel, Frank R., 1941-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118186435">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Measures of Complexity Festschrift for Alexey Chervonenkis ent://SD_ILS/0/SD_ILS:518354 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Vovk, Vladimir. editor.&#160;Papadopoulos, Harris. editor.&#160;Gammerman, Alexander. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(518354.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-21852-6">https://doi.org/10.1007/978-3-319-21852-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Patch-Based Techniques in Medical Imaging First International Workshop, Patch-MI 2015, Held in Conjunction with MICCAI 2015, Munich, Germany, October 9, 2015, Revised Selected Papers ent://SD_ILS/0/SD_ILS:518887 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Wu, Guorong. editor.&#160;Coup&eacute;, Pierrick. editor.&#160;Zhan, Yiqiang. editor.&#160;Munsell, Brent. editor.&#160;Rueckert, Daniel. editor.<br/>Yer Numaras&#305;&#160;XX(518887.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-28194-0">https://doi.org/10.1007/978-3-319-28194-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic design for optimization and robustness for engineers ent://SD_ILS/0/SD_ILS:341796 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Dodson, Bryan, 1962- author.&#160;Hammett, Patrick C., author.&#160;Klerx, Rene, author.<br/>Yer Numaras&#305;&#160;ONLINE(341796.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118796306">Available by subscription from Safari Books Online</a> ebrary <a href="http://alltitles.ebrary.com/Doc?id=10896040">http://alltitles.ebrary.com/Doc?id=10896040</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118796245">http://dx.doi.org/10.1002/9781118796245</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118796306">http://proquest.tech.safaribooksonline.de/9781118796306</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical robust design : an industrial perspective ent://SD_ILS/0/SD_ILS:341871 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Arner, Magnus, author.<br/>Yer Numaras&#305;&#160;ONLINE(341871.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://site.ebrary.com/lib/byuprovo/docDetail.action?docID=10833758">CLICK HERE for online access</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1603266">http://public.eblib.com/choice/publicfullrecord.aspx?p=1603266</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118842003">http://dx.doi.org/10.1002/9781118842003</a> MyiLibrary <a href="http://www.myilibrary.com?id=571624">http://www.myilibrary.com?id=571624</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bayesian analysis made simple an Excel GUI for WinBUGS ent://SD_ILS/0/SD_ILS:288900 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Woodward, Phillip.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439839553">Distributed by publisher. 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B.&#160;Boer, Jan H. de, 1963-&#160;Smilde, Age K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444897091">http://www.sciencedirect.com/science/book/9780444897091</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> High performance systems techniques and applications ent://SD_ILS/0/SD_ILS:255211 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Leondes, Cornelius T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120127535">http://www.sciencedirect.com/science/book/9780120127535</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust estimation and testing ent://SD_ILS/0/SD_ILS:300353 2024-12-28T14:20:42Z 2024-12-28T14:20:42Z Yazar&#160;Staudte, Robert G.&#160;Sheather, Simon J.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118165485">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818924">Click here to view book</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>