Arama Sonuçları SCIENCE -- Reference. - Daraltılmış: Metrology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSCIENCE$002b--$002bReference.$0026qf$003dSUBJECT$002509Konu$002509Metrology.$002509Metrology.$0026ic$003dtrue$0026ps$003d300?
2026-02-16T15:08:26Z
Handbook of Metrology and Applications
ent://SD_ILS/0/SD_ILS:528422
2026-02-16T15:08:26Z
2026-02-16T15:08:26Z
Yazar Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:593319
2026-02-16T15:08:26Z
2026-02-16T15:08:26Z
Yazar Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Yer Numarası T174.7<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>