Arama Sonuçları SKENNING ELEKTRON MİKROSKOP.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSKENNING$002bELEKTRON$002bM$0025C4$0025B0KROSKOP.$0026pe$003dd$00253A$0026ps$003d300?dt=list2024-10-19T14:19:32ZThe measurement of grain boundary geometryent://SD_ILS/0/SD_ILS:403462024-10-19T14:19:32Z2024-10-19T14:19:32ZYazar Randle, Valerie.<br/>Yer Numarası TA 460 R25 1993<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Advanced scanning electron microscopy and X-ray microanalysisent://SD_ILS/0/SD_ILS:931282024-10-19T14:19:32Z2024-10-19T14:19:32ZYazar Newbury, Dale E.<br/>Yer Numarası QH 212.S3 A38 1986<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Practical scanning electron m icroscopy : alactron and ion microprobe analysisent://SD_ILS/0/SD_ILS:367302024-10-19T14:19:32Z2024-10-19T14:19:32ZYazar Goldstein, Joseph I. , 1939- Yakowitz, Harvey, ed. Dolstein, J. I., ed.<br/>Yer Numarası QH 212.S3 G64 1975<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>