Arama Sonuçları SKENNING ELEKTRON MİKROSKOP. - Daraltılmış: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSKENNING$002bELEKTRON$002bM$0025C4$0025B0KROSKOP.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026pe$003dd$00253A$0026ps$003d300?dt=list2024-10-19T16:27:02ZThe measurement of grain boundary geometryent://SD_ILS/0/SD_ILS:403462024-10-19T16:27:02Z2024-10-19T16:27:02ZYazar Randle, Valerie.<br/>Yer Numarası TA 460 R25 1993<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Practical scanning electron m icroscopy : alactron and ion microprobe analysisent://SD_ILS/0/SD_ILS:367302024-10-19T16:27:02Z2024-10-19T16:27:02ZYazar Goldstein, Joseph I. , 1939- Yakowitz, Harvey, ed. Dolstein, J. I., ed.<br/>Yer Numarası QH 212.S3 G64 1975<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>