Arama Sonu&ccedil;lar&#305; Safety. - Daralt&#305;lm&#305;&#351;: Reliability. 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Yazar&#160;Goonetilleke, Ravindra S. editor.&#160;Karwowski, Waldemar. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-94484-5">https://doi.org/10.1007/978-3-319-94484-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bias Temperature Instability for Devices and Circuits ent://SD_ILS/0/SD_ILS:484755 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Grasser, Tibor. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ternary Networks Reliability and Monte Carlo ent://SD_ILS/0/SD_ILS:485508 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Gertsbakh, Ilya. 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S. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-04019-6">https://doi.org/10.1007/978-3-319-04019-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> After&ndash;sales Service of Engineering Industrial Assets A Reference Framework for Warranty Management ent://SD_ILS/0/SD_ILS:488000 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Gonz&aacute;lez-Prida D&iacute;az, Vicente. author.&#160;Crespo M&aacute;rquez, Adolfo. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-03710-3">https://doi.org/10.1007/978-3-319-03710-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Enabling Manufacturing Competitiveness and Economic Sustainability Proceedings of the 5th International Conference on Changeable, Agile, Reconfigurable and Virtual Production (CARV 2013), Munich, Germany, October 6th-9th, 2013 ent://SD_ILS/0/SD_ILS:483511 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Zaeh, Michael F. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-02054-9">https://doi.org/10.1007/978-3-319-02054-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The International Handbook of Space Technology ent://SD_ILS/0/SD_ILS:486301 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Macdonald, Malcolm. editor.&#160;Badescu, Viorel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-41101-4">https://doi.org/10.1007/978-3-642-41101-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology ent://SD_ILS/0/SD_ILS:487840 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Osten, Wolfgang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for Manufacturability From 1D to 4D for 90&ndash;22 nm Technology Nodes ent://SD_ILS/0/SD_ILS:488642 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Balasinski, Artur. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Project Quality Management Critical Success Factors for Buildings ent://SD_ILS/0/SD_ILS:489546 2024-12-01T18:23:01Z 2024-12-01T18:23:01Z Yazar&#160;Low, Sui Pheng. author.&#160;Ong, Joy. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-287-074-2">https://doi.org/10.1007/978-981-287-074-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Offshore Risk Assessment vol 2. 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