Arama Sonuçları Scanning electron microscopy - Daraltılmış: Surfaces (Physics).SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning$002belectron$002bmicroscopy$0026qf$003dSUBJECT$002509Konu$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ps$003d300?2026-01-24T07:12:30ZScanning Transmission Electron Microscopy Imaging and Analysisent://SD_ILS/0/SD_ILS:1728022026-01-24T07:12:30Z2026-01-24T07:12:30ZYazar Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>New Horizons of Applied Scanning Electron Microscopyent://SD_ILS/0/SD_ILS:1905372026-01-24T07:12:30Z2026-01-24T07:12:30ZYazar Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysisent://SD_ILS/0/SD_ILS:1677902026-01-24T07:12:30Z2026-01-24T07:12:30ZYazar Echlin, Patrick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>