Arama Sonuçları Scanning probe microscopy. - Daraltılmış: Elektronik KütüphaneSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning$002bprobe$002bmicroscopy.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026pe$003dd$00253A$0026ps$003d300?dt=list2024-12-26T07:28:59ZAcoustic Scanning Probe Microscopyent://SD_ILS/0/SD_ILS:3331532024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333153.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning probe microscopy for energy researchent://SD_ILS/0/SD_ILS:2810952024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bonnell, Dawn A. Kalinin, Sergei V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564537">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=564537</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Roadmap of Scanning Probe Microscopyent://SD_ILS/0/SD_ILS:1840072024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Morita, Seizo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Exploring scanning probe microscopy with mathematicaent://SD_ILS/0/SD_ILS:3034562024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Sarid, Dror. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590">http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9783527610068">http://dx.doi.org/10.1002/9783527610068</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy in Nanoscience and Nanotechnologyent://SD_ILS/0/SD_ILS:1906542024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03535-7">http://dx.doi.org/10.1007/978-3-642-03535-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.ent://SD_ILS/0/SD_ILS:4599652024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Klapetek, Petr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128133477">https://www.sciencedirect.com/science/book/9780128133477</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy in Nanoscience and Nanotechnology 3ent://SD_ILS/0/SD_ILS:3331372024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333137.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy in Nanoscience and Nanotechnology 2ent://SD_ILS/0/SD_ILS:1913862024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning probe microscopy of soft matter fundamentals and practicesent://SD_ILS/0/SD_ILS:3061452024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar T͡Sukruk, V. V. (Vladimir Vasilʹevich) Singamaneni, Srikanth. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527639953">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://lib.myilibrary.com?id=418231">Connect to MyiLibrary resource.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopyent://SD_ILS/0/SD_ILS:1727912024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniquesent://SD_ILS/0/SD_ILS:1885642024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniquesent://SD_ILS/0/SD_ILS:1870502024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:1655342024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Scanning Probe Methods V Scanning Probe Microscopy Techniquesent://SD_ILS/0/SD_ILS:1845232024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied Scanning Probe Methods II Scanning Probe Microscopy Techniquesent://SD_ILS/0/SD_ILS:1814122024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:1661962024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002ent://SD_ILS/0/SD_ILS:1687902024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Single-atom nanoelectronicsent://SD_ILS/0/SD_ILS:2890822024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Prati, Enrico. Shinada, Takahiro.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9789814316699">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Hybridizing surface probe microscopies towards a full description of the meso- and nanoworldsent://SD_ILS/0/SD_ILS:2862632024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Moreno-Flores, Susan. Toca-Herrera, Jos ̌L. (Jos ̌Luis), 1967-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439871010">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instrumental community probe microscopy and the path to nanotechnologyent://SD_ILS/0/SD_ILS:2475532024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Mody, Cyrus C. M. (Cyrus Cawas Maneck), 1974- Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780262298186/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Physical chemistry chemical kinetics and reaction mechanismsent://SD_ILS/0/SD_ILS:2881372024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Trimm, Harold H. (Harold Henry), 1955-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466559813">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of surface and interface analysis methods for problem-solvingent://SD_ILS/0/SD_ILS:2847332024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Rivir̈e, J. C. Myhra, S. (Sverre), 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420007800">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Force microscopy applications in biology and medicineent://SD_ILS/0/SD_ILS:2966272024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Jena, Bhanu P. Hörber, J. K. Heinrich. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www3.interscience.wiley.com/cgi-bin/browsebyproduct?type=2">http://www3.interscience.wiley.com/cgi-bin/browsebyproduct?type=2</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470007702">http://dx.doi.org/10.1002/0470007702</a>
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Volltext <a href="http://onlinelibrary.wiley.com/book/10.1002/0470007702">http://onlinelibrary.wiley.com/book/10.1002/0470007702</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning probe microscopies beyond imaging manipulation of molecules and nanostructuresent://SD_ILS/0/SD_ILS:3034142024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Samorì, Paolo. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527608516">http://dx.doi.org/10.1002/3527608516</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112683146">http://www3.interscience.wiley.com/cgi-bin/bookhome/112683146</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Carbon nanotubes properties and applicationsent://SD_ILS/0/SD_ILS:2846552024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar O'Connell, Michael (Michael J.)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420004212">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning probe microscopes applications in science and technologyent://SD_ILS/0/SD_ILS:2901152024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Birdi, K. S., 1934-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203011072">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electrochemical nanotechnology in-situ local probe techniques at electrochemical interfacesent://SD_ILS/0/SD_ILS:3006422024-12-26T07:28:59Z2024-12-26T07:28:59ZYazar Lorenz, W. J. Plieth, W. (Waldfried) International Union of Pure and Applied Chemistry. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527612154">http://dx.doi.org/10.1002/9783527612154</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/39117390.html">http://catalog.hathitrust.org/api/volumes/oclc/39117390.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>