Arama Sonuçları Scanning probe microscopy. - Daraltılmış: 2007
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning$002bprobe$002bmicroscopy.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092007$0025092007$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?
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Exploring scanning probe microscopy with mathematica
ent://SD_ILS/0/SD_ILS:303456
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Yazar Sarid, Dror. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590">http://www3.interscience.wiley.com/cgi-bin/bookhome/114123590</a>
Volltext <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527610068">http://onlinelibrary.wiley.com/book/10.1002/9783527610068</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527610068">http://dx.doi.org/10.1002/9783527610068</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Roadmap of Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:184007
2024-11-07T19:02:53Z
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Yazar Morita, Seizo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale
ent://SD_ILS/0/SD_ILS:110620
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2024-11-07T19:02:53Z
Yazar Kalinin, Sergei. Gruverman, Alexei.<br/>Yer Numarası QH212. S33 2007 V.2<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
2024-11-07T19:02:53Z
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Yazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-11-07T19:02:53Z
2024-11-07T19:02:53Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>