Arama Sonu&ccedil;lar&#305; Scanning probe microscopy. - Daralt&#305;lm&#305;&#351;: Nanoelectronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning$002bprobe$002bmicroscopy.$0026qf$003dSUBJECT$002509Konu$002509Nanoelectronics.$002509Nanoelectronics.$0026pe$003dd$00253A$0026ps$003d300?dt=list 2024-12-26T07:03:42Z Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale ent://SD_ILS/0/SD_ILS:110620 2024-12-26T07:03:42Z 2024-12-26T07:03:42Z Yazar&#160;Kalinin, Sergei.&#160;Gruverman, Alexei.<br/>Yer Numaras&#305;&#160;QH212. S33 2007 V.2<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~2<br/> Single-atom nanoelectronics ent://SD_ILS/0/SD_ILS:289082 2024-12-26T07:03:42Z 2024-12-26T07:03:42Z Yazar&#160;Prati, Enrico.&#160;Shinada, Takahiro.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9789814316699">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>