Arama Sonuçları Scanning. - Daraltılmış: Microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning.$0026qf$003dSUBJECT$002509Konu$002509Microscopy.$002509Microscopy.$0026ps$003d300$0026isd$003dtrue?2024-11-17T04:42:40ZBiological Low-Voltage Scanning Electron Microscopyent://SD_ILS/0/SD_ILS:1670082024-11-17T04:42:40Z2024-11-17T04:42:40ZYazar Schatten, Heide. editor. Pawley, James B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-72972-5">http://dx.doi.org/10.1007/978-0-387-72972-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Transmission Electron Microscopy Imaging and Analysisent://SD_ILS/0/SD_ILS:1728022024-11-17T04:42:40Z2024-11-17T04:42:40ZYazar Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysisent://SD_ILS/0/SD_ILS:1677902024-11-17T04:42:40Z2024-11-17T04:42:40ZYazar Echlin, Patrick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM)ent://SD_ILS/0/SD_ILS:3027702024-11-17T04:42:40Z2024-11-17T04:42:40ZYazar Stokes, Debbie. Royal Microscopical Society (Great Britain)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470758731">http://dx.doi.org/10.1002/9780470758731</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10270670">http://site.ebrary.com/lib/alltitles/Doc?id=10270670</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:1655342024-11-17T04:42:40Z2024-11-17T04:42:40ZYazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:1661962024-11-17T04:42:40Z2024-11-17T04:42:40ZYazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Life at the nanoscale atomic force microscopy of live cellsent://SD_ILS/0/SD_ILS:2909022024-11-17T04:42:40Z2024-11-17T04:42:40ZYazar Dufrn̊e, Yves.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9789814267977">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>