Arama Sonuçları Scanning. - Daraltılmış: Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning.$0026qf$003dSUBJECT$002509Konu$002509Nanotechnology.$002509Nanotechnology.$0026ps$003d300?
2024-11-17T03:44:43Z
Acoustic Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:333153
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333153.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XII Characterization
ent://SD_ILS/0/SD_ILS:188565
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85039-7">http://dx.doi.org/10.1007/978-3-540-85039-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IX Characterization
ent://SD_ILS/0/SD_ILS:187051
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Roadmap of Scanning Probe Microscopy
ent://SD_ILS/0/SD_ILS:184007
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Morita, Seizo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-34315-8">http://dx.doi.org/10.1007/978-3-540-34315-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Transmission Electron Microscopy Imaging and Analysis
ent://SD_ILS/0/SD_ILS:172802
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
New Horizons of Applied Scanning Electron Microscopy
ent://SD_ILS/0/SD_ILS:190537
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology
ent://SD_ILS/0/SD_ILS:190654
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03535-7">http://dx.doi.org/10.1007/978-3-642-03535-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Microscopy for Nanotechnology Techniques and Applications
ent://SD_ILS/0/SD_ILS:166275
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Zhou, Weilie. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-39620-0">http://dx.doi.org/10.1007/978-0-387-39620-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ent://SD_ILS/0/SD_ILS:333137
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333137.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning SQUID Microscope for Studying Vortex Matter in Type-II Superconductors
ent://SD_ILS/0/SD_ILS:196689
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Finkler, Amit. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29393-1">http://dx.doi.org/10.1007/978-3-642-29393-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ent://SD_ILS/0/SD_ILS:191386
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:187052
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Tomitori, Masahiko. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
ent://SD_ILS/0/SD_ILS:181752
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Kaupp, Gerd. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-28472-7">http://dx.doi.org/10.1007/978-3-540-28472-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
ent://SD_ILS/0/SD_ILS:168790
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology
ent://SD_ILS/0/SD_ILS:181232
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Yamashita, Mikio. editor. Shigekawa, Hidemi. editor. Morita, Ryuji. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138671">http://dx.doi.org/10.1007/b138671</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Chromosome nanoscience and technology
ent://SD_ILS/0/SD_ILS:286896
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Fukui, Kiichi. Ushiki, Tatsuo, 1957-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420044928">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Force microscopy applications in biology and medicine
ent://SD_ILS/0/SD_ILS:296627
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Jena, Bhanu P. Hörber, J. K. Heinrich. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www3.interscience.wiley.com/cgi-bin/browsebyproduct?type=2">http://www3.interscience.wiley.com/cgi-bin/browsebyproduct?type=2</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470007702">http://dx.doi.org/10.1002/0470007702</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112139511">http://www3.interscience.wiley.com/cgi-bin/bookhome/112139511</a>
Volltext <a href="http://onlinelibrary.wiley.com/book/10.1002/0470007702">http://onlinelibrary.wiley.com/book/10.1002/0470007702</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electrochemical nanotechnology in-situ local probe techniques at electrochemical interfaces
ent://SD_ILS/0/SD_ILS:300642
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar Lorenz, W. J. Plieth, W. (Waldfried) International Union of Pure and Applied Chemistry. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527612154">http://dx.doi.org/10.1002/9783527612154</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/39117390.html">http://catalog.hathitrust.org/api/volumes/oclc/39117390.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Nanoscale characterization of surfaces and interfaces
ent://SD_ILS/0/SD_ILS:300774
2024-11-17T03:44:43Z
2024-11-17T03:44:43Z
Yazar DiNardo, N. John. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527615957">http://dx.doi.org/10.1002/9783527615957</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>