Arama Sonu&ccedil;lar&#305; Scanning. - Daralt&#305;lm&#305;&#351;: Optical materials. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning.$0026qf$003dSUBJECT$002509Konu$002509Optical$002bmaterials.$002509Optical$002bmaterials.$0026ic$003dtrue$0026ps$003d300? 2024-11-17T04:47:18Z Scanning Transmission Electron Microscopy Imaging and Analysis ent://SD_ILS/0/SD_ILS:172802 2024-11-17T04:47:18Z 2024-11-17T04:47:18Z Yazar&#160;Pennycook, Stephen J. editor.&#160;Nellist, Peter D. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Microscopy for Nanotechnology Techniques and Applications ent://SD_ILS/0/SD_ILS:166275 2024-11-17T04:47:18Z 2024-11-17T04:47:18Z Yazar&#160;Zhou, Weilie. editor.&#160;Wang, Zhong Lin. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-39620-0">http://dx.doi.org/10.1007/978-0-387-39620-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Rotating Machinery, Optical Methods &amp; Scanning LDV Methods, Volume 6 Proceedings of the 37th IMAC, A Conference and Exposition on Structural Dynamics 2019 ent://SD_ILS/0/SD_ILS:486254 2024-11-17T04:47:18Z 2024-11-17T04:47:18Z Yazar&#160;Niezrecki, Christopher. editor.&#160;Baqersad, Javad. editor.&#160;Di Maio, Dario. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-12935-4">https://doi.org/10.1007/978-3-030-12935-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1&ndash;13 October 2002 ent://SD_ILS/0/SD_ILS:168790 2024-11-17T04:47:18Z 2024-11-17T04:47:18Z Yazar&#160;Vilarinho, Paula Maria. editor.&#160;Rosenwaks, Yossi. editor.&#160;Kingon, Angus. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>