Arama Sonuçları Scanning. - Daraltılmış: Particles (Nuclear physics).
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dScanning.$0026qf$003dSUBJECT$002509Konu$002509Particles$002b$002528Nuclear$002bphysics$002529.$002509Particles$002b$002528Nuclear$002bphysics$002529.$0026ps$003d300?
2024-11-17T03:01:56Z
Applied Scanning Probe Methods IX Characterization
ent://SD_ILS/0/SD_ILS:187051
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:187052
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Tomitori, Masahiko. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-11-17T03:01:56Z
2024-11-17T03:01:56Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>