Arama Sonu&ccedil;lar&#305; Schieferdecker, Ina. - Daralt&#305;lm&#305;&#351;: Elektronik K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSchieferdecker$00252C$002bIna.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ic$003dtrue$0026ps$003d300? 2024-12-01T20:20:04Z Model Driven Architecture &ndash; Foundations and Applications 4th European Conference, ECMDA-FA 2008, Berlin, Germany, June 9-13, 2008. Proceedings ent://SD_ILS/0/SD_ILS:185714 2024-12-01T20:20:04Z 2024-12-01T20:20:04Z Yazar&#160;Schieferdecker, Ina. editor.&#160;Hartman, Alan. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-69100-6">http://dx.doi.org/10.1007/978-3-540-69100-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Model-based testing for embedded systems ent://SD_ILS/0/SD_ILS:286143 2024-12-01T20:20:04Z 2024-12-01T20:20:04Z Yazar&#160;Zander, Justyna.&#160;Schieferdecker, Ina.&#160;Mosterman, Pieter J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439818473">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> SDL 2015: Model-Driven Engineering for Smart Cities 17th International SDL Forum, Berlin, Germany, October 12-14, 2015, Proceedings ent://SD_ILS/0/SD_ILS:518937 2024-12-01T20:20:04Z 2024-12-01T20:20:04Z Yazar&#160;Fischer, Joachim. editor.&#160;Scheidgen, Markus. editor.&#160;Schieferdecker, Ina. editor.&#160;Reed, Rick. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(518937.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-24912-4">https://doi.org/10.1007/978-3-319-24912-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Model-Driven Testing ent://SD_ILS/0/SD_ILS:186585 2024-12-01T20:20:04Z 2024-12-01T20:20:04Z Yazar&#160;Baker, Paul. author.&#160;Dai, Zhen Ru. author.&#160;Grabowski, Jens. author.&#160;Haugen, &Oslash;ystein. author.&#160;Schieferdecker, Ina. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-72563-3">http://dx.doi.org/10.1007/978-3-540-72563-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>