Arama Sonuçları Semiconductors -- Analysis.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSemiconductors$002b--$002bAnalysis.$0026ps$003d300?2026-05-16T15:53:36ZHandheld Total Chemical and Biological Analysis Systems Bridging NMR, Digital Microfluidics, and Semiconductorsent://SD_ILS/0/SD_ILS:4019292026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Lei, Ka-Meng. author. Mak, Pui-In. author. Law, Man-Kay. author. Martins, Rui Paulo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67825-2">https://doi.org/10.1007/978-3-319-67825-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>PHOTOCATALYSIS APPROACH FOR ENVIRONMENTAL APPLICATIONSent://SD_ILS/0/SD_ILS:5745192026-05-16T15:53:36Z2026-05-16T15:53:36ZYer Numarası TD170.2<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003424840">https://www.taylorfrancis.com/books/9781003424840</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanometer CMOS ICs From Basics to ASICsent://SD_ILS/0/SD_ILS:6056412026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Veendrick, Harry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-64249-4">https://doi.org/10.1007/978-3-031-64249-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Plasmonic metal nanostructures : preparation, characterization, and applicationsent://SD_ILS/0/SD_ILS:5989882026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Kan, Caixia, author.<br/>Yer Numarası TA418.9 .N35<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527840854">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527840854</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Smart materials for science and engineeringent://SD_ILS/0/SD_ILS:5991522026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Upēndra Kumār, editor. Sonkar, Piyush Kumar, 1989- editor.<br/>Yer Numarası TA418.9 .S62 S53 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186488">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186488</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Metal oxide nanocomposite thin films for optoelectronic device applicationsent://SD_ILS/0/SD_ILS:5985802026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Zargar, Rayees Ahmad, editor.<br/>Yer Numarası TA418.9 .T45 M48 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanotechnology in electronics : materials, properties, devicesent://SD_ILS/0/SD_ILS:5979562026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar P. M., Visakh, editor. Semkin, Artem, editor. B., Raneesh, 1986- editor. Lazović, Saša, editor.<br/>Yer Numarası TK7874.84<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical ESD protection designent://SD_ILS/0/SD_ILS:5972332026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Wang, Albert Z. H., 1962- author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Electrical Engineering Handbook - Six Volume Setent://SD_ILS/0/SD_ILS:5424842026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Molecular spectroscopy : a quantum chemistry approachent://SD_ILS/0/SD_ILS:5952722026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Ozaki, Y. (Yukihiro), editor. Wójcik, Marek Januz, editor. Popp, Jürgen, editor.<br/>Yer Numarası QD96 .M65<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527814596">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527814596</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Solution-processable components for organic electronic devicesent://SD_ILS/0/SD_ILS:5953362026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Łuszczynska, Beata, editor. Matyjaszewski, K. (Krzysztof), editor. Ulański, J., editor.<br/>Yer Numarası TK7871.15 .P6<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527813872">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527813872</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Impedance spectroscopy : theory, experiment, and applications.ent://SD_ILS/0/SD_ILS:5942242026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Barsoukov, Evgenij, editor. Macdonald, J. Ross (James Ross), 1923-2024, editor.<br/>Yer Numarası QD116 .I57<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119381860">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119381860</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanometer CMOS ICs From Basics to ASICsent://SD_ILS/0/SD_ILS:6134812026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar J.M. Veendrick, Harry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-47597-4">https://doi.org/10.1007/978-3-319-47597-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Bridging the Gap between Life and Physicsent://SD_ILS/0/SD_ILS:6131582026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Cottam, Ron. author. Ranson, Willy. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-74533-6">https://doi.org/10.1007/978-3-319-74533-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanosilicon : properties, synthesis, applications, methods of analysis and controlent://SD_ILS/0/SD_ILS:5436442026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Ischenko, A. A., author. Fetisov, G. V., author. Aslanov, L. A. (Leonid Aleksandrovich), author.<br/>Yer Numarası TA418.9 .N35 I83 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466594234">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Advancement in Communication Circuits and Systems Proceedings of ICCACCS 2014ent://SD_ILS/0/SD_ILS:5305612026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Maharatna, Koushik. editor. Dalapati, Goutam Kumar. editor. Banerjee, P K. editor. Mallick, Amiya Kumar. editor. Mukherjee, Moumita. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-81-322-2274-3">https://doi.org/10.1007/978-81-322-2274-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Novel Approaches for Single Molecule Activation and Detectionent://SD_ILS/0/SD_ILS:5308422026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Benfenati, Fabio. editor. Di Fabrizio, Enzo. editor. Torre, Vincent. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-43367-6">https://doi.org/10.1007/978-3-662-43367-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Trap level spectroscopy in amorphous semiconductorsent://SD_ILS/0/SD_ILS:1467162026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Mikla, Victor I.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123847157">http://www.sciencedirect.com/science/book/9780123847157</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Properties of semiconductor alloys group-IV, III-V and II-VI semiconductorsent://SD_ILS/0/SD_ILS:2983372026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Adachi, Sadao, 1950-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470744383">http://dx.doi.org/10.1002/9780470744383</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=212352&ref=toc">http://www.myilibrary.com?id=212352&ref=toc</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470744383">http://onlinelibrary.wiley.com/book/10.1002/9780470744383</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297966">http://site.ebrary.com/lib/alltitles/Doc?id=10297966</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Properties of group-IV, III-V and II-VI semiconductorsent://SD_ILS/0/SD_ILS:2958432026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Adachi, Sadao, 1950- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470090340">http://dx.doi.org/10.1002/0470090340</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/111082133">http://www3.interscience.wiley.com/cgi-bin/bookhome/111082133</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Impurities in semiconductors : solubility, migration, and interactionsent://SD_ILS/0/SD_ILS:5423252026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Fistul, V. I. (Viktor Ilich), 1927, author.<br/>Yer Numarası QC611.6 .D6 F57 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781134395194">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>RF and microwave semiconductor device handbookent://SD_ILS/0/SD_ILS:5394902026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Golio, John Michael, 1954-<br/>Yer Numarası TK7876 .R495 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420039979">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Conjugated polymer and molecular interfaces : science and technology for photonic and optoelectronic applicationsent://SD_ILS/0/SD_ILS:5423432026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Salaneck, W. R.<br/>Yer Numarası TA1750 .C68 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135570668">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Heavy metals in the environmentent://SD_ILS/0/SD_ILS:5413472026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Sarkar, Bibudhendra.<br/>Yer Numarası RA1231 .M52 H436 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135557089">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of semiconductor technologyent://SD_ILS/0/SD_ILS:3008452026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Jackson, Kenneth A. Schröter, W. (Wolfgang)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621828">An electronic book accessible through the World Wide Web; click for information</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621842">An electronic book accessible through the World Wide Web; click for information</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpHSTV0003">http://app.knovel.com/web/toc.v/cid:kpHSTV0003</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527619290">http://dx.doi.org/10.1002/9783527619290</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43030635.html">http://catalog.hathitrust.org/api/volumes/oclc/43030635.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992ent://SD_ILS/0/SD_ILS:2562732026-05-16T15:53:36Z2026-05-16T15:53:36ZYazar Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444899088">http://www.sciencedirect.com/science/book/9780444899088</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>