Arama Sonuçları Semiconductors -- Measurement.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSemiconductors$002b--$002bMeasurement.$0026ps$003d300?dt=list
2026-06-05T22:57:39Z
Defects in organic semiconductors and devices
ent://SD_ILS/0/SD_ILS:598531
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Yazar Nguyen, Thien-Phap, author.<br/>Yer Numarası TK7871.99 .O74 N48 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Compound semiconductor radiation detectors
ent://SD_ILS/0/SD_ILS:540603
2026-06-05T22:57:39Z
2026-06-05T22:57:39Z
Yazar Owens, Alan, author.<br/>Yer Numarası QC481.5<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429062315">https://www.taylorfrancis.com/books/9780429062315</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Visual Display Technology
ent://SD_ILS/0/SD_ILS:614504
2026-06-05T22:57:39Z
2026-06-05T22:57:39Z
Yazar Chen, Janglin. editor. Cranton, Wayne. editor. Fihn, Mark. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-14346-0">https://doi.org/10.1007/978-3-319-14346-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of silicon semiconductor metrology
ent://SD_ILS/0/SD_ILS:547244
2026-06-05T22:57:39Z
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Yazar Diebold, A. C. (Alain C.)<br/>Yer Numarası TK7871.85 .H3337 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>