Arama Sonuçları Semiconductors -- Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSemiconductors$002b--$002bTesting.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-03-23T07:44:00Z
Nanometer CMOS ICs From Basics to ASICs
ent://SD_ILS/0/SD_ILS:605641
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Veendrick, Harry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-64249-4">https://doi.org/10.1007/978-3-031-64249-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical ESD protection design
ent://SD_ILS/0/SD_ILS:597233
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Wang, Albert Z. H., 1962- author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar
ent://SD_ILS/0/SD_ILS:547507
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Dorf, Richard C., author Dorf, Richard C., editor.<br/>Yer Numarası TK145<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315222158">https://www.taylorfrancis.com/books/9781315222158</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Nanometer CMOS ICs From Basics to ASICs
ent://SD_ILS/0/SD_ILS:613481
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar J.M. Veendrick, Harry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-47597-4">https://doi.org/10.1007/978-3-319-47597-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Advancement in Communication Circuits and Systems Proceedings of ICCACCS 2014
ent://SD_ILS/0/SD_ILS:530561
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Maharatna, Koushik. editor. Dalapati, Goutam Kumar. editor. Banerjee, P K. editor. Mallick, Amiya Kumar. editor. Mukherjee, Moumita. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-81-322-2274-3">https://doi.org/10.1007/978-81-322-2274-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing for small-delay defects in nanoscale CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:547467
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Yer Numarası TK7871.99 .M44 T43 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315217819">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced calculations for defects in materials : electronic structure methods
ent://SD_ILS/0/SD_ILS:269597
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Alkauskas, Audrius.<br/>Yer Numarası TA410 A379 2011<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
RF and microwave modeling and measurement techniques for field effect transistors
ent://SD_ILS/0/SD_ILS:280925
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Gao, Jianjun, 1968- Knovel (Firm)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor material and device characterization
ent://SD_ILS/0/SD_ILS:249492
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Schroder, Dieter K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microelectronics
ent://SD_ILS/0/SD_ILS:547489
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Whitaker, Jerry C.<br/>Yer Numarası TK7874 .M4587 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
ent://SD_ILS/0/SD_ILS:300738
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527615117">http://dx.doi.org/10.1002/9783527615117</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Principles of semiconductor network testing
ent://SD_ILS/0/SD_ILS:254328
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Afshar, Amir.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750694728">http://www.sciencedirect.com/science/book/9780750694728</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
ent://SD_ILS/0/SD_ILS:256193
2026-03-23T07:44:00Z
2026-03-23T07:44:00Z
Yazar Perkowitz, S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125507707">http://www.sciencedirect.com/science/book/9780125507707</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>