Arama Sonuçları Semiconductors -- Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSemiconductors$002b--$002bTesting.$0026ps$003d300?dt=list
2024-11-28T11:36:31Z
Testing for small-delay defects in nanoscale CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:342881
2024-11-28T11:36:31Z
2024-11-28T11:36:31Z
Yazar Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Yer Numarası ONLINE(342881.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced calculations for defects in materials : electronic structure methods
ent://SD_ILS/0/SD_ILS:269597
2024-11-28T11:36:31Z
2024-11-28T11:36:31Z
Yazar Alkauskas, Audrius.<br/>Yer Numarası TA410 A379 2011<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
RF and microwave modeling and measurement techniques for field effect transistors
ent://SD_ILS/0/SD_ILS:280925
2024-11-28T11:36:31Z
2024-11-28T11:36:31Z
Yazar Gao, Jianjun, 1968- Knovel (Firm)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor material and device characterization
ent://SD_ILS/0/SD_ILS:249492
2024-11-28T11:36:31Z
2024-11-28T11:36:31Z
Yazar Schroder, Dieter K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
ent://SD_ILS/0/SD_ILS:300738
2024-11-28T11:36:31Z
2024-11-28T11:36:31Z
Yazar Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527615117">http://dx.doi.org/10.1002/9783527615117</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Principles of semiconductor network testing
ent://SD_ILS/0/SD_ILS:254328
2024-11-28T11:36:31Z
2024-11-28T11:36:31Z
Yazar Afshar, Amir.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750694728">http://www.sciencedirect.com/science/book/9780750694728</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
ent://SD_ILS/0/SD_ILS:256193
2024-11-28T11:36:31Z
2024-11-28T11:36:31Z
Yazar Perkowitz, S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125507707">http://www.sciencedirect.com/science/book/9780125507707</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>