Arama Sonuçları Siebes, Arno. - Daraltılmış: Optical pattern recognition.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSiebes$00252C$002bArno.$0026qf$003dSUBJECT$002509Subject$002509Optical$002bpattern$002brecognition.$002509Optical$002bpattern$002brecognition.$0026ps$003d300?dt=list2026-04-10T23:40:15ZAdvances in Intelligent Data Analysis VIII 8th International Symposium on Intelligent Data Analysis, IDA 2009, Lyon, France, August 31 - September 2, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1907822026-04-10T23:40:15Z2026-04-10T23:40:15ZYazar Adams, Niall M. editor. Robardet, Céline. editor. Siebes, Arno. editor. Boulicaut, Jean-François. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03915-7">http://dx.doi.org/10.1007/978-3-642-03915-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Intelligent Data Analysis VI 6th International Symposium on Intelligent Data Analysis, IDA 2005, Madrid, Spain, September 8-10, 2005. Proceedingsent://SD_ILS/0/SD_ILS:1829992026-04-10T23:40:15Z2026-04-10T23:40:15ZYazar Famili, A. Fazel. editor. Kok, Joost N. editor. Peña, José M. editor. Siebes, Arno. editor. Feelders, Ad. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11552253">http://dx.doi.org/10.1007/11552253</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>