Arama Sonuçları Software Testing. - Daraltılmış: Computer engineering.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSoftware$002bTesting.$0026qf$003dSUBJECT$002509Konu$002509Computer$002bengineering.$002509Computer$002bengineering.$0026ps$003d300?dt=list2026-03-22T01:59:56ZInformation Security, Privacy and Digital Forensics Select Proceedings of the International Conference, ICISPD 2022ent://SD_ILS/0/SD_ILS:6019182026-03-22T01:59:56Z2026-03-22T01:59:56ZYazar Patel, Sankita J. editor. Chaudhary, Naveen Kumar. editor. Gohil, Bhavesh N. editor. Iyengar, S. S. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5091-1">https://doi.org/10.1007/978-981-99-5091-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Attacks, Defenses and Testing for Deep Learningent://SD_ILS/0/SD_ILS:6038312026-03-22T01:59:56Z2026-03-22T01:59:56ZYazar Chen, Jinyin. author. (orcid)0000-0002-7153-2755 Zhang, Ximin. author. Zheng, Haibin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-0425-5">https://doi.org/10.1007/978-981-97-0425-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tests and Proofs 11th International Conference, TAP 2017, Held as Part of STAF 2017, Marburg, Germany, July 19-20, 2017, Proceedingsent://SD_ILS/0/SD_ILS:6159812026-03-22T01:59:56Z2026-03-22T01:59:56ZYazar Gabmeyer, Sebastian. editor. Johnsen, Einar Broch. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-61467-0">https://doi.org/10.1007/978-3-319-61467-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Concise Guide to Software Engineering From Fundamentals to Application Methodsent://SD_ILS/0/SD_ILS:6178362026-03-22T01:59:56Z2026-03-22T01:59:56ZYazar O'Regan, Gerard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-57750-0">https://doi.org/10.1007/978-3-319-57750-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932026-03-22T01:59:56Z2026-03-22T01:59:56ZYazar Dorf, Richard C., author. Taylor and Francis.<br/>Yer Numarası TK7885<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Computer Engineering Handbook.ent://SD_ILS/0/SD_ILS:5438382026-03-22T01:59:56Z2026-03-22T01:59:56ZYazar Oklobdzija, Vojin G., author. CRC Press LLC.<br/>Yer Numarası TK7885 .C645 2002<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>