Arama Sonu&ccedil;lar&#305; Software measurement. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSoftware$002bmeasurement.$0026ic$003dtrue$0026ps$003d300?dt=list 2025-12-08T13:31:03Z Software engineering measurement ent://SD_ILS/0/SD_ILS:545300 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Munson, John C., author.<br/>Yer Numaras&#305;&#160;QA76.76 .S65 M86 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135505776">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Measurement Establish &mdash; Extract &mdash; Evaluate &mdash; Execute ent://SD_ILS/0/SD_ILS:186335 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Ebert, Christof. author.&#160;Dumke, Reiner. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-71649-5">http://dx.doi.org/10.1007/978-3-540-71649-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software measurement and estimation a practical approach ent://SD_ILS/0/SD_ILS:249472 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Laird, Linda M., 1952-&#160;Brennan, M. Carol, 1954-&#160;IEEE Computer Society.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Development Measurement Programs Development, Management and Evolution ent://SD_ILS/0/SD_ILS:402744 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Staron, Miroslaw. author.&#160;Meding, Wilhelm. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-91836-5">https://doi.org/10.1007/978-3-319-91836-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Measurement 25th International Workshop on Software Measurement and 10th International Conference on Software Process and Product Measurement, IWSM-Mensura 2015, Krak&oacute;w, Poland, October 5-7, 2015, Proceedings ent://SD_ILS/0/SD_ILS:518631 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Kobyli&#324;ski, Andrzej. editor.&#160;Czarnacka-Chrobot, Beata. editor.&#160;&#346;wierczek, Jaroslaw. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-24285-9">https://doi.org/10.1007/978-3-319-24285-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The IFPUG guide to IT and software measurement ent://SD_ILS/0/SD_ILS:544611 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;International Function Point Users Group.<br/>Yer Numaras&#305;&#160;QA76.76 .S65 I36 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439869345">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied software measurement global analysis of productivity and quality ent://SD_ILS/0/SD_ILS:293330 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Jones, Capers.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/applied-software-measurement">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings ent://SD_ILS/0/SD_ILS:191262 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Abran, Alain. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;Dumke, Reiner R. editor.&#160;Cuadrado-Gallego, Juan J. editor.&#160;Brunekreef, Jacob. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-05415-0">http://dx.doi.org/10.1007/978-3-642-05415-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers ent://SD_ILS/0/SD_ILS:188722 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Cuadrado-Gallego, Juan J. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;Dumke, Reiner R. editor.&#160;Abran, Alain. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85553-8">http://dx.doi.org/10.1007/978-3-540-85553-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings ent://SD_ILS/0/SD_ILS:189262 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Dumke, Reiner R. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;B&uuml;ren, G&uuml;nter. editor.&#160;Abran, Alain. editor.&#160;Cuadrado-Gallego, Juan J. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-89403-2">http://dx.doi.org/10.1007/978-3-540-89403-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Best Practices in Software Measurement How to use metrics to improve project and process performance ent://SD_ILS/0/SD_ILS:180938 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Ebert, Christof. author.&#160;Bundschuh, Manfred. author.&#160;Dumke, Reiner. author.&#160;Schmietendorf, Andreas. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138013">http://dx.doi.org/10.1007/b138013</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer Aided Engineering of Batteries ent://SD_ILS/0/SD_ILS:520358 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Santhanagopalan, Shriram. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-17607-4">https://doi.org/10.1007/978-3-031-17607-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Hybrid Information Processing 6th EAI International Conference, ADHIP 2022, Changsha, China, September 29-30, 2022, Proceedings, Part I ent://SD_ILS/0/SD_ILS:520370 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Fu, Weina. editor.&#160;Yun, Lin. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-28787-9">https://doi.org/10.1007/978-3-031-28787-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Cyber Security Intelligence and Analytics The 5th International Conference on Cyber Security Intelligence and Analytics (CSIA 2023), Volume 2 ent://SD_ILS/0/SD_ILS:526849 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Xu, Zheng. editor.&#160;Alrabaee, Saed. editor.&#160;Loyola-Gonz&aacute;lez, Octavio. editor.&#160;Cahyani, Niken Dwi Wahyu. editor.&#160;Ab Rahman, Nurul Hidayah. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-31775-0">https://doi.org/10.1007/978-3-031-31775-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Rotating Machinery, Optical Methods &amp; Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022 ent://SD_ILS/0/SD_ILS:527380 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Di Maio, Dario. editor.&#160;Baqersad, Javad. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-04098-6">https://doi.org/10.1007/978-3-031-04098-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design and Implementation of Sensory Solutions for Industrial Environment Utilizing 1-wire&reg; Technology in Industrial Solutions ent://SD_ILS/0/SD_ILS:527974 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;&#270;u&#271;&aacute;k, Juraj. author.&#160;Ga&scaron;par, Gabriel. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-30152-0">https://doi.org/10.1007/978-3-031-30152-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Smart Technologies, Systems and Applications 3rd International Conference, SmartTech-IC 2022, Cuenca, Ecuador, November 16-18, 2022, Revised Selected Papers ent://SD_ILS/0/SD_ILS:520321 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Narv&aacute;ez, Fabi&aacute;n R. editor.&#160;Urgil&eacute;s, Fernando. editor.&#160;Bastos-Filho, Teodiano Freire. editor.&#160;Salgado-Guerrero, Juan Pablo. editor. (orcid)&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-32213-6">https://doi.org/10.1007/978-3-031-32213-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product Lifecycle Management. PLM in Transition Times: The Place of Humans and Transformative Technologies 19th IFIP WG 5.1 International Conference, PLM 2022, Grenoble, France, July 10-13, 2022, Revised Selected Papers ent://SD_ILS/0/SD_ILS:520558 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;No&euml;l, Fr&eacute;d&eacute;ric. editor.&#160;Nyffenegger, Felix. editor. (orcid)&#160;Rivest, Louis. editor.&#160;Bouras, Abdelaziz. editor. (orcid)&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-25182-5">https://doi.org/10.1007/978-3-031-25182-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Information Technology for Education, Science, and Technics Proceedings of ITEST 2022 ent://SD_ILS/0/SD_ILS:527905 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Faure, Emil. editor.&#160;Danchenko, Olena. editor.&#160;Bondarenko, Maksym. editor.&#160;Tryus, Yurii. editor.&#160;Bazilo, Constantine. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-35467-0">https://doi.org/10.1007/978-3-031-35467-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Towards new e-Infrastructure and e-Services for Developing Countries 14th EAI International Conference, AFRICOMM 2022, Zanzibar, Tanzania, December 5-7, 2022, Proceedings ent://SD_ILS/0/SD_ILS:520477 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Saeed, Rashid A. editor.&#160;Bakari, Abubakar D. editor.&#160;Sheikh, Yahya Hamad. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-34896-9">https://doi.org/10.1007/978-3-031-34896-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality of Information and Communications Technology 16th International Conference, QUATIC 2023, Aveiro, Portugal, September 11-13, 2023, Proceedings ent://SD_ILS/0/SD_ILS:520606 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Fernandes, Jos&eacute; Maria. editor.&#160;Travassos, Guilherme H. editor.&#160;Lenarduzzi, Valentina. editor.&#160;Li, Xiaozhou. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-43703-8">https://doi.org/10.1007/978-3-031-43703-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Parallel Processing and Applied Mathematics 14th International Conference, PPAM 2022, Gdansk, Poland, September 11-14, 2022, Revised Selected Papers, Part I ent://SD_ILS/0/SD_ILS:520851 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Wyrzykowski, Roman. editor.&#160;Dongarra, Jack. editor.&#160;Deelman, Ewa. editor.&#160;Karczewski, Konrad. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-30442-2">https://doi.org/10.1007/978-3-031-30442-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Passive and Active Measurement 24th International Conference, PAM 2023, Virtual Event, March 21-23, 2023, Proceedings ent://SD_ILS/0/SD_ILS:520896 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Brunstrom, Anna. editor.&#160;Flores, Marcel. editor.&#160;Fiore, Marco. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-28486-1">https://doi.org/10.1007/978-3-031-28486-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Interactive Collaborative Robotics 8th International Conference, ICR 2023, Baku, Azerbaijan, October 25-29, 2023, Proceedings ent://SD_ILS/0/SD_ILS:520980 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Ronzhin, Andrey. editor.&#160;Sadigov, Aminagha. editor.&#160;Meshcheryakov, Roman. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-43111-1">https://doi.org/10.1007/978-3-031-43111-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechatronic system control, logic, and data acquisition ent://SD_ILS/0/SD_ILS:544500 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Bishop, Robert H., 1957- editor.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;TJ223 .P76 M43 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315221595">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Green in Software Engineering ent://SD_ILS/0/SD_ILS:518426 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Calero, Coral. editor.&#160;Piattini, Mario. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-08581-4">https://doi.org/10.1007/978-3-319-08581-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software metrics : a rigorous and practical approach ent://SD_ILS/0/SD_ILS:538770 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Fenton, Norman E., 1956, author.&#160;Bieman, James, author.<br/>Yer Numaras&#305;&#160;QA76.758 .F46 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439838235">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Engineering in Intelligent Systems Proceedings of the 4th Computer Science On-line Conference 2015 (CSOC2015), Vol 3: Software Engineering in Intelligent Systems ent://SD_ILS/0/SD_ILS:530565 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Silhavy, Radek. editor.&#160;Senkerik, Roman. editor.&#160;Oplatkova, Zuzana Kominkova. editor.&#160;Prokopova, Zdenka. editor.&#160;Silhavy, Petr. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-18473-9">https://doi.org/10.1007/978-3-319-18473-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Proceedings of the 4th International Conference on Computer Engineering and Networks CENet2014 ent://SD_ILS/0/SD_ILS:530244 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Wong, W. Eric. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-11104-9">https://doi.org/10.1007/978-3-319-11104-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering ent://SD_ILS/0/SD_ILS:530615 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Sobh, Tarek. editor.&#160;Elleithy, Khaled. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-06773-5">https://doi.org/10.1007/978-3-319-06773-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Business Information Systems 18th International Conference, BIS 2015, Pozna&#324;, Poland, June 24-26, 2015, Proceedings ent://SD_ILS/0/SD_ILS:518580 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Abramowicz, Witold. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-19027-3">https://doi.org/10.1007/978-3-319-19027-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Industrial Engineering, Management Science and Applications 2015 ent://SD_ILS/0/SD_ILS:518706 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Gen, Mitsuo. editor.&#160;Kim, Kuinam J. editor.&#160;Huang, Xiaoxia. editor.&#160;Hiroshi, Yabe. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-662-47200-2">https://doi.org/10.1007/978-3-662-47200-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Spon's External Works and Landscape Price Book 2015 ent://SD_ILS/0/SD_ILS:544530 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;AECOM.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;SB472.5<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482264432">Click here to view.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Vibration analysis, instruments, and signal processing ent://SD_ILS/0/SD_ILS:547117 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Sinha, Jyoti Kumar, author.<br/>Yer Numaras&#305;&#160;TA355 .S525 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781482231458">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Trustworthy Computing and Services International Conference, ISCTCS 2014, Beijing, China, November 28-29, 2014, Revised Selected papers ent://SD_ILS/0/SD_ILS:518531 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Yueming, Lu. editor.&#160;Xu, Wu. editor.&#160;Xi, Zhang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-662-47401-3">https://doi.org/10.1007/978-3-662-47401-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Manufacturing and engineering technology ent://SD_ILS/0/SD_ILS:546372 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Sheng, Ai, editor.&#160;Wang, Yizhong, editor.&#160;International Conference on Manufacturing and Engineering Technology (2014 : Sanya, China)<br/>Yer Numaras&#305;&#160;TJ241 .M36 2015<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315760728">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computing handbook : computer science and software engineering ent://SD_ILS/0/SD_ILS:543164 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Tucker, Allen B., editor.&#160;Gonzalez, Teofilo F., editor.&#160;Diaz-Herrera, Jorge L., 1950- editor.<br/>Yer Numaras&#305;&#160;QA76 .C57315 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439898536">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in usability evaluation ent://SD_ILS/0/SD_ILS:544721 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Rebelo, Francesco.&#160;Soares, Marcelo Marcio.<br/>Yer Numaras&#305;&#160;TA167 .A375 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466560550">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational modelling of objects represented in images : fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012 ent://SD_ILS/0/SD_ILS:547304 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;CompIMAGE 2012 (2012 : Rome, Italy)&#160;Di Giamberardino, Paolo.<br/>Yer Numaras&#305;&#160;TA1637 .C66 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135119942">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software maintenance success recipes ent://SD_ILS/0/SD_ILS:545774 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Reifer, Donald J., author.<br/>Yer Numaras&#305;&#160;QA76.6 .R435 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439851678">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Performance tuning of scientific applications ent://SD_ILS/0/SD_ILS:540054 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Bailey, David H.&#160;Lucas, Robert F.&#160;Williams, Samuel Watkins.<br/>Yer Numaras&#305;&#160;Q183.9 .P47 2011<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439815700">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> COSMIC function points : theory and advanced practices ent://SD_ILS/0/SD_ILS:540768 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Dumke, Reiner.&#160;Abran, Alain, 1949-<br/>Yer Numaras&#305;&#160;QA76.76 .S65 C67 2011<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439844878">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software metrics and software metrology ent://SD_ILS/0/SD_ILS:249319 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Abran, Alain, 1949-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Certified function point specialist examination guide ent://SD_ILS/0/SD_ILS:541968 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Garmus, David., author.&#160;Russac, Janet.&#160;Edwards, Royce.<br/>Yer Numaras&#305;&#160;QA76.3 .G394 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420076387">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Antenna theory and microstrip antennas ent://SD_ILS/0/SD_ILS:545464 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Fang, D. G., author.<br/>Yer Numaras&#305;&#160;TK7871.67 .M5 F36 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315218311">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality assurance of agent-based and self-managed systems ent://SD_ILS/0/SD_ILS:542982 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Dumke, Reiner., author.&#160;Mencke, Steffen.&#160;Wille, Cornelius.<br/>Yer Numaras&#305;&#160;QA76.76 .I58 D96 2010<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439812679">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Flat-rolled steel processes : advanced technologies ent://SD_ILS/0/SD_ILS:542057 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Ginzburg, Vladimir B., 1935-<br/>Yer Numaras&#305;&#160;TS340 .F576 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420072938">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Automated taxon identification in systematics : theory, approaches and applications ent://SD_ILS/0/SD_ILS:539862 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;MacLeod, Norman, 1953-&#160;Systematics Association.<br/>Yer Numaras&#305;&#160;QH83 .A93 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420008074">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Encyclopedia of water Science ent://SD_ILS/0/SD_ILS:544528 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Trimble, Stanley W., author.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;S494.5 .W3<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781351249829">Click here to view</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The engineering handbook ent://SD_ILS/0/SD_ILS:541498 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Dorf, Richard C.<br/>Yer Numaras&#305;&#160;TA151 .E424 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420039870">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software metrics : a guide to planning, analysis, and application ent://SD_ILS/0/SD_ILS:545261 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Pandian, C. Ravindranath., author.<br/>Yer Numaras&#305;&#160;QA76.76 .S65 P36 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135507176">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software engineering for image processing systems ent://SD_ILS/0/SD_ILS:545262 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Laplante, Phillip A., author.<br/>Yer Numaras&#305;&#160;TA1637 .L34 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135510749">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maximizing business performance through software packages : best practices for justification, selection, and implementation ent://SD_ILS/0/SD_ILS:542689 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Starinsky, Robert W., author.<br/>Yer Numaras&#305;&#160;HD30.2 .S7825 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420025408">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software engineering handbook ent://SD_ILS/0/SD_ILS:547681 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Keyes, Jessica, 1950, author.<br/>Yer Numaras&#305;&#160;QA76.758 .K48 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420031416">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software development and quality assurance for the healthcare manufacturing industries ent://SD_ILS/0/SD_ILS:538699 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Mallory, Steven R., author.<br/>Yer Numaras&#305;&#160;R856 .M285 2002<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420025897">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied statistics for software managers ent://SD_ILS/0/SD_ILS:79814 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Maxwell, Katrina.<br/>Yer Numaras&#305;&#160;QA 76.76.S65 M39 2002<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Handbook of image quality : characterization and prediction ent://SD_ILS/0/SD_ILS:540337 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Keelan, Brian W., 1958, author.<br/>Yer Numaras&#305;&#160;TA1637 .K44 2002<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135559328">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> New directions in project management ent://SD_ILS/0/SD_ILS:540993 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Tinnirello, Paul C.<br/>Yer Numaras&#305;&#160;T56.8 .N49 2002<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420000160">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The mechatronics handbook ent://SD_ILS/0/SD_ILS:541820 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Bishop, Robert H., 1957-&#160;ISA--The Instrumentation, Systems, and Automation Society.<br/>Yer Numaras&#305;&#160;TJ163.12 .M434 2002<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420042450">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Introduction to PCM telemetering systems ent://SD_ILS/0/SD_ILS:542489 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Horan, Stephen John, 1954- author.<br/>Yer Numaras&#305;&#160;TK5105 .H67 2002<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420040883">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Usability evaluation in industry ent://SD_ILS/0/SD_ILS:549365 2025-12-08T13:31:03Z 2025-12-08T13:31:03Z Yazar&#160;Jordan, Patrick W., editor.&#160;McClelland, Ian Lyall, editor.&#160;Thomas, B., 1950- editor.&#160;Weerdmeester, Bernard A., 1955- editor.&#160;Taylor and Francis.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781498710411">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>