Arama Sonuçları Software measurement.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSoftware$002bmeasurement.$0026ps$003d300$0026isd$003dtrue?2024-11-15T04:46:11ZSoftware engineering measurementent://SD_ILS/0/SD_ILS:2891242024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Munson, John C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203011188">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Measurement Establish — Extract — Evaluate — Executeent://SD_ILS/0/SD_ILS:1863352024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Ebert, Christof. author. Dumke, Reiner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71649-5">http://dx.doi.org/10.1007/978-3-540-71649-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software measurement and estimation a practical approachent://SD_ILS/0/SD_ILS:2494722024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Laird, Linda M., 1952- Brennan, M. Carol, 1954- IEEE Computer Society. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Development Measurement Programs Development, Management and Evolutionent://SD_ILS/0/SD_ILS:4027442024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Staron, Miroslaw. author. Meding, Wilhelm. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-91836-5">https://doi.org/10.1007/978-3-319-91836-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Measurement 25th International Workshop on Software Measurement and 10th International Conference on Software Process and Product Measurement, IWSM-Mensura 2015, Kraków, Poland, October 5-7, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5186312024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Kobyliński, Andrzej. editor. Czarnacka-Chrobot, Beata. editor. Świerczek, Jaroslaw. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518631.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-24285-9">https://doi.org/10.1007/978-3-319-24285-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The IFPUG guide to IT and software measurementent://SD_ILS/0/SD_ILS:2880522024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar International Function Point Users Group.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439869345">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied software measurement global analysis of productivity and qualityent://SD_ILS/0/SD_ILS:2933302024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Jones, Capers.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/applied-software-measurement">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1912622024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Abran, Alain. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Cuadrado-Gallego, Juan J. editor. Brunekreef, Jacob. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-05415-0">http://dx.doi.org/10.1007/978-3-642-05415-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papersent://SD_ILS/0/SD_ILS:1887222024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Cuadrado-Gallego, Juan J. editor. Braungarten, René. editor. Dumke, Reiner R. editor. Abran, Alain. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85553-8">http://dx.doi.org/10.1007/978-3-540-85553-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedingsent://SD_ILS/0/SD_ILS:1892622024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Dumke, Reiner R. editor. Braungarten, René. editor. Büren, Günter. editor. Abran, Alain. editor. Cuadrado-Gallego, Juan J. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-89403-2">http://dx.doi.org/10.1007/978-3-540-89403-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Best Practices in Software Measurement How to use metrics to improve project and process performanceent://SD_ILS/0/SD_ILS:1809382024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Ebert, Christof. author. Bundschuh, Manfred. author. Dumke, Reiner. author. Schmietendorf, Andreas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138013">http://dx.doi.org/10.1007/b138013</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Passive and Active Measurement 24th International Conference, PAM 2023, Virtual Event, March 21-23, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208962024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Brunstrom, Anna. editor. Flores, Marcel. editor. Fiore, Marco. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520896.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28486-1">https://doi.org/10.1007/978-3-031-28486-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Product Lifecycle Management. PLM in Transition Times: The Place of Humans and Transformative Technologies 19th IFIP WG 5.1 International Conference, PLM 2022, Grenoble, France, July 10-13, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5205582024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Noël, Frédéric. editor. Nyffenegger, Felix. editor. (orcid) Rivest, Louis. editor. Bouras, Abdelaziz. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520558.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25182-5">https://doi.org/10.1007/978-3-031-25182-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Towards new e-Infrastructure and e-Services for Developing Countries 14th EAI International Conference, AFRICOMM 2022, Zanzibar, Tanzania, December 5-7, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5204772024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Saeed, Rashid A. editor. Bakari, Abubakar D. editor. Sheikh, Yahya Hamad. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520477.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34896-9">https://doi.org/10.1007/978-3-031-34896-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality of Information and Communications Technology 16th International Conference, QUATIC 2023, Aveiro, Portugal, September 11-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206062024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Fernandes, José Maria. editor. Travassos, Guilherme H. editor. Lenarduzzi, Valentina. editor. Li, Xiaozhou. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520606.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43703-8">https://doi.org/10.1007/978-3-031-43703-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Smart Technologies, Systems and Applications 3rd International Conference, SmartTech-IC 2022, Cuenca, Ecuador, November 16-18, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5203212024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Narváez, Fabián R. editor. Urgilés, Fernando. editor. Bastos-Filho, Teodiano Freire. editor. Salgado-Guerrero, Juan Pablo. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520321.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32213-6">https://doi.org/10.1007/978-3-031-32213-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Aided Engineering of Batteriesent://SD_ILS/0/SD_ILS:5203582024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Santhanagopalan, Shriram. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520358.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-17607-4">https://doi.org/10.1007/978-3-031-17607-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Hybrid Information Processing 6th EAI International Conference, ADHIP 2022, Changsha, China, September 29-30, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5203702024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Fu, Weina. editor. Yun, Lin. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520370.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28787-9">https://doi.org/10.1007/978-3-031-28787-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Parallel Processing and Applied Mathematics 14th International Conference, PPAM 2022, Gdansk, Poland, September 11-14, 2022, Revised Selected Papers, Part Ient://SD_ILS/0/SD_ILS:5208512024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Wyrzykowski, Roman. editor. Dongarra, Jack. editor. Deelman, Ewa. editor. Karczewski, Konrad. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520851.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30442-2">https://doi.org/10.1007/978-3-031-30442-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interactive Collaborative Robotics 8th International Conference, ICR 2023, Baku, Azerbaijan, October 25-29, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209802024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Ronzhin, Andrey. editor. Sadigov, Aminagha. editor. Meshcheryakov, Roman. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520980.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43111-1">https://doi.org/10.1007/978-3-031-43111-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software metrics : a rigorous and practical approachent://SD_ILS/0/SD_ILS:3567962024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Fenton, Norman E., 1956- author. Bieman, James, author.<br/>Yer Numarası ONLINE(356796.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439838235">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Industrial Engineering, Management Science and Applications 2015ent://SD_ILS/0/SD_ILS:5187062024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Gen, Mitsuo. editor. Kim, Kuinam J. editor. Huang, Xiaoxia. editor. Hiroshi, Yabe. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518706.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-47200-2">https://doi.org/10.1007/978-3-662-47200-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Business Information Systems 18th International Conference, BIS 2015, Poznań, Poland, June 24-26, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5185802024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Abramowicz, Witold. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518580.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19027-3">https://doi.org/10.1007/978-3-319-19027-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Trustworthy Computing and Services International Conference, ISCTCS 2014, Beijing, China, November 28-29, 2014, Revised Selected papersent://SD_ILS/0/SD_ILS:5185312024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Yueming, Lu. editor. Xu, Wu. editor. Xi, Zhang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518531.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-47401-3">https://doi.org/10.1007/978-3-662-47401-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Green in Software Engineeringent://SD_ILS/0/SD_ILS:5184262024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Calero, Coral. editor. Piattini, Mario. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518426.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-08581-4">https://doi.org/10.1007/978-3-319-08581-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational modelling of objects represented in images fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012ent://SD_ILS/0/SD_ILS:2854472024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar CompIMAGE 2012 (2012 : Rome, Italy) Di Giamberardino, Paolo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203075371">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software maintenance success recipesent://SD_ILS/0/SD_ILS:2898972024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Reifer, Donald J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439851678">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>COSMIC function points theory and advanced practicesent://SD_ILS/0/SD_ILS:2888762024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Dumke, Reiner. Abran, Alain, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439844878">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Performance tuning of scientific applicationsent://SD_ILS/0/SD_ILS:2861122024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Bailey, David H. Lucas, Robert F. Williams, Samuel Watkins.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439815700">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Antenna theory and microstrip antennasent://SD_ILS/0/SD_ILS:2860952024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Fang, D. G.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439807392">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality assurance of agent-based and self-managed systemsent://SD_ILS/0/SD_ILS:2850722024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Dumke, Reiner. Mencke, Steffen. Wille, Cornelius.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439812679">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Certified function point specialist examination guideent://SD_ILS/0/SD_ILS:2850812024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Garmus, David. Russac, Janet. Edwards, Royce.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420076387">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software metrics and software metrologyent://SD_ILS/0/SD_ILS:2493192024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Abran, Alain, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software metrics a guide to planning, analysis, and applicationent://SD_ILS/0/SD_ILS:2864492024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Pandian, C. Ravindranath.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203496077">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software engineering for image processing systemsent://SD_ILS/0/SD_ILS:2864732024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Laplante, Phillip A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203496107">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The mechatronics handbookent://SD_ILS/0/SD_ILS:2849492024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Bishop, Robert H., 1957- ISA--The Instrumentation, Systems, and Automation Society.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420042450">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied statistics for software managersent://SD_ILS/0/SD_ILS:798142024-11-15T04:46:11Z2024-11-15T04:46:11ZYazar Maxwell, Katrina.<br/>Yer Numarası QA 76.76.S65 M39 2002<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>