Arama Sonuçları Solutions. - Daraltılmış: Systems engineering.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSolutions.$0026qf$003dSUBJECT$002509Konu$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ps$003d300?dt=list2026-01-18T09:29:12ZSAT-Based Scalable Formal Verification Solutionsent://SD_ILS/0/SD_ILS:1667022026-01-18T09:29:12Z2026-01-18T09:29:12ZYazar Ganai, Malay K. author. Gupta, Aarti. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-69167-1">http://dx.doi.org/10.1007/978-0-387-69167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Frequency Synthesis for Convergent Wireless Solutionsent://SD_ILS/0/SD_ILS:1739472026-01-18T09:29:12Z2026-01-18T09:29:12ZYazar Atallah, Jad G. author. Ismail, Mohammed. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1466-7">http://dx.doi.org/10.1007/978-1-4614-1466-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The triumvirate approach to systems engineering, technology management and engineering management : the art and science of combining systems engineering, technology management and engineering management, using project management as a tracking tool, to create, manage and disseminate the next generation of technology solutionsent://SD_ILS/0/SD_ILS:5626012026-01-18T09:29:12Z2026-01-18T09:29:12ZYazar Day, Thomas J., author.<br/>Yer Numarası HD69 .P75 D3938 2022 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003215462">https://www.taylorfrancis.com/books/9781003215462</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologiesent://SD_ILS/0/SD_ILS:1721032026-01-18T09:29:12Z2026-01-18T09:29:12ZYazar Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-0938-1">http://dx.doi.org/10.1007/978-1-4419-0938-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>