Arama Sonuçları Speckle-Metrology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSpeckle-Metrology.$0026ic$003dtrue$0026ps$003d300?dt=list2026-03-27T21:50:53ZSpeckle metrologyent://SD_ILS/0/SD_ILS:2560672026-03-27T21:50:53Z2026-03-27T21:50:53ZYazar Erf, Robert K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122413605">http://www.sciencedirect.com/science/book/9780122413605</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in speckle metrology and related techniquesent://SD_ILS/0/SD_ILS:3060592026-03-27T21:50:53Z2026-03-27T21:50:53ZYazar Kaufmann, Guillermo H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527633852">An electronic book accessible through the World Wide Web; click for information</a>
Wiley InterScience - Full Text Online <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527633852">http://onlinelibrary.wiley.com/book/10.1002/9783527633852</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10446636">http://site.ebrary.com/lib/alltitles/Doc?id=10446636</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital Holography and Wavefront Sensing Principles, Techniques and Applicationsent://SD_ILS/0/SD_ILS:5303682026-03-27T21:50:53Z2026-03-27T21:50:53ZYazar Schnars, Ulf. author. Falldorf, Claas. author. Watson, John. author. Jüptner, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-44693-5">https://doi.org/10.1007/978-3-662-44693-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of 3D machine vision : optical metrology and imagingent://SD_ILS/0/SD_ILS:5386242026-03-27T21:50:53Z2026-03-27T21:50:53ZYazar Song, Zhang.<br/>Yer Numarası TK8315 .H36 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439872208">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of optical metrology : principles and applicationsent://SD_ILS/0/SD_ILS:5409702026-03-27T21:50:53Z2026-03-27T21:50:53ZYazar Yoshizawa, Toru, 1939-<br/>Yer Numarası QC367 .H36 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019513">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical inspection of microsystemsent://SD_ILS/0/SD_ILS:5425002026-03-27T21:50:53Z2026-03-27T21:50:53ZYazar Osten, Wolfgang.<br/>Yer Numarası TS156.2 .O652 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Laser Technology and Applications (Three- Volume Set).ent://SD_ILS/0/SD_ILS:5410502026-03-27T21:50:53Z2026-03-27T21:50:53ZYazar Taylor and Francis.<br/>Yer Numarası TA1675 .H363 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/e/9781420050530">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>