Arama Sonuçları Spectroscopy and Microscopy. - Daraltılmış: Materials Science.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSpectroscopy$002band$002bMicroscopy.$0026qf$003dSUBJECT$002509Konu$002509Materials$002bScience.$002509Materials$002bScience.$0026ic$003dtrue$0026ps$003d300?dt=list2025-12-08T02:50:09ZHelium Ion Microscopy Principles and Applicationsent://SD_ILS/0/SD_ILS:3324382025-12-08T02:50:09Z2025-12-08T02:50:09ZYazar Joy, David C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332438.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-8660-2">http://dx.doi.org/10.1007/978-1-4614-8660-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Local Electrode Atom Probe Tomography A User's Guideent://SD_ILS/0/SD_ILS:3324442025-12-08T02:50:09Z2025-12-08T02:50:09ZYazar Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.<br/>Yer Numarası ONLINE(332444.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-8721-0">http://dx.doi.org/10.1007/978-1-4614-8721-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>