Arama Sonuçları Spectroscopy. - Daraltılmış: Thin films.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSpectroscopy.$0026qf$003dSUBJECT$002509Konu$002509Thin$002bfilms.$002509Thin$002bfilms.$0026te$003dILS$0026ps$003d300?
2024-10-26T02:35:12Z
Correlation spectroscopy of surfaces, thin films, and nanostructures
ent://SD_ILS/0/SD_ILS:302072
2024-10-26T02:35:12Z
2024-10-26T02:35:12Z
Yazar Berakdar, J., 1964- Kirschner, J. (Jürgen), 1945- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527603425">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527603425</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527603425">http://dx.doi.org/10.1002/3527603425</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Nanoscale Materials for Warfare Agent Detection: Nanoscience for Security
ent://SD_ILS/0/SD_ILS:482894
2024-10-26T02:35:12Z
2024-10-26T02:35:12Z
Yazar Bittencourt, Carla. editor. Ewels, Chris. editor. Llobet, Eduard. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-024-1620-6">https://doi.org/10.1007/978-94-024-1620-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Thin film analysis by X-ray scattering
ent://SD_ILS/0/SD_ILS:302207
2024-10-26T02:35:12Z
2024-10-26T02:35:12Z
Yazar Birkholz, Mario. Fewster, Paul F. Genzel, Christoph. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527607595">http://dx.doi.org/10.1002/3527607595</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282">http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>