Arama Sonuçları Spectrum Analysis. - Daraltılmış: Optical materials.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSpectrum$002bAnalysis.$0026qf$003dSUBJECT$002509Konu$002509Optical$002bmaterials.$002509Optical$002bmaterials.$0026te$003dILS$0026ps$003d300?dt=list
2024-12-26T02:25:46Z
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:184678
2024-12-26T02:25:46Z
2024-12-26T02:25:46Z
Yazar Klingshirn, Claus. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-38347-5">http://dx.doi.org/10.1007/978-3-540-38347-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:181030
2024-12-26T02:25:46Z
2024-12-26T02:25:46Z
Yazar Klingshirn, Claus. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138175">http://dx.doi.org/10.1007/b138175</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
ent://SD_ILS/0/SD_ILS:181391
2024-12-26T02:25:46Z
2024-12-26T02:25:46Z
Yazar Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Physics of Thin Film Optical Spectra An Introduction
ent://SD_ILS/0/SD_ILS:181597
2024-12-26T02:25:46Z
2024-12-26T02:25:46Z
Yazar Stenzel, Olaf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-27905-9">http://dx.doi.org/10.1007/3-540-27905-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>