Arama Sonuçları Statistics -- Probability - Daraltılmış: 1990SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dStatistics$002b--$002bProbability$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091990$0025091990$0026ps$003d300?dt=list2025-12-07T21:09:12ZA history of probability and statistics and their applications before 1750ent://SD_ILS/0/SD_ILS:3002452025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Hald, Anders, 1913- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471725161">http://dx.doi.org/10.1002/0471725161</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risks theoryent://SD_ILS/0/SD_ILS:693112025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Beard, Robert Eric. Pentikainen, T. ort. yaz. Pesonen, E., ort. yaz.<br/>Yer Numarası HG 8781 B34 1984<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Analysis of binary dataent://SD_ILS/0/SD_ILS:696602025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Cox, David Roxbee, 1924- Snell, E. J., ort. yaz.<br/>Yer Numarası QA 279 C68 1970<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Nelson, Wayne, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Finding groups in data an introduction to cluster analysisent://SD_ILS/0/SD_ILS:2952602025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Kaufman, Leonard. Rousseeuw, Peter J. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470316801">http://dx.doi.org/10.1002/9780470316801</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lisp-Stat an object-oriented environment for statistical computing and dynamic graphicsent://SD_ILS/0/SD_ILS:2952612025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Tierney, Luke. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316818">http://dx.doi.org/10.1002/9780470316818</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods in engineering and quality assuranceent://SD_ILS/0/SD_ILS:2952622025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar John, Peter William Meredith.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/21329921.html">http://catalog.hathitrust.org/api/volumes/oclc/21329921.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316825">http://dx.doi.org/10.1002/9780470316825</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust estimation and testingent://SD_ILS/0/SD_ILS:3003532025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Staudte, Robert G. Sheather, Simon J. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118165485">An electronic book accessible through the World Wide Web; click for information</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818924">Click here to view book</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust estimation and testingent://SD_ILS/0/SD_ILS:769922025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Staudte, Robert G. Sheather, Simon J., ort. yaz.<br/>Yer Numarası QA 276.8 S74 1990<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Handbook of applicable mathematicsent://SD_ILS/0/SD_ILS:310682025-12-07T21:09:12Z2025-12-07T21:09:12ZYazar Ledermann, W., ed. by<br/>Yer Numarası QA 36 H36 1980- V.6A7<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>